X-ray Systems
See Also: X-ray
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Product
Universal Test System
LEON System
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A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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X-ray fluorescence spectrometers
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SPECTRO Analytical Instruments GmbH
SPECTRO is a world leader in the manufacture of energy dispersive X-ray fluorescence spectrometers. In recent years, SPECTRO has set standards by further developing X-ray fluorescence technology to create many new fields of operation for ED-XRF spectrometers.
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Industrial CT X-Ray Inspection System
X25
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The X25 is quite possibly the most conveniently sized industrial CT system on the market. The system offers all of the same features as the larger systems while still maintaining the ability to fit through a standard interior door. The X25 is well suited for small to medium sized objects.
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Energy Dispersive X-ray Fluorescence Spectrometer
EDX-LE
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EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
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Product
X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-60
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HORIBA introduces the new standard of transportable sulfur-in-oil analyzers, the SLFA-60. This instrument introduces new software and hardware features to meet the growing changes in the petroleum industry. The instrument has expanded storage of calibration curves and data can be exported using USB output. The measurement range has increased to 0-9.9999 wt% to cover high sulfur crudes and shale oil markets.
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Product
X-ray Fluorescence Sulfur-in-Oil Analyzers
SLFA-2100/2800
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The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Product
X-Ray Beam Monitors
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When standard products just aren’t good enough—or the measurement technology does not yet exist—Sydor Technologies develops technology to enable these complex imaging measurements. Just as we’ve developed next-generation streak cameras and x-ray detectors to meet novel, emerging requirements in national laboratories, we’re doing the same with x-ray beam monitors.
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Product
Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
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X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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Product
X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
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Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
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InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Mezzanine System
5081
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The 5081 provides four channels of 12 bit digital to analog voltage output, with multiple single ended output ranges. Each channel is software selectable for 0 to +5V, 0 to +10V, +/-2.5V, +/-5V, +/-10V or -2.5 to 7.5V ranges. The outputs reset to 0.0 volts on power up.
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Product
Benchtop X-ray diffraction (XRD) instrument
MiniFlex
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New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
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Industrial X-Ray
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Teledyne DALSA offers powerful, innovative CCD and CMOS X-Ray detectors combining industry-leading performance with cutting-edge features for industrial and scientific applications such as NDT (non destructive testing) in evaluation, troubleshooting, research, and quality control.
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Integrated Systems
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Power, flexible and based on commercial open standards, Integrated Systems from Abaco are pre-integrated and pre-qualified, so they're ready for immediate deployment - minimizing cost, risks and program lead time.
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Product
Metrology Systems
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VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
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Product
M-Class System
ACQUITY UPLC
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The ACQUITY UPLC M-Class System delivers the performance you expect from nano- to microscale separations with the usability of an analytical-scale UPLC system. Each part of the system was designed and tested to deliver the right flow for the right column. The ACQUITY UPLC M-Class System provides excellent performance with overflow rates from 200 nL/min to 100 µL/min and a range of column inner diameter (I.D.) from 75 µm to 1.0 mm.
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Product
Terahertz Systems
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Optoelectronic Terahertz-Generation. TOPTICA provides complete systems and components for both time-domain and frequency-domain terahertz generation. For time-domain applications, the TeraFlash sets new standards in terms of dynamic range, bandwidth and measurement speed. Combining TOPTICA's FemtoFiber smart laser technology with state-of-the-art InGaAs antennas, the system achieves a peak dynamic range of more than 90 dB and a bandwidth greater than 5 THz.
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Product
Energy Dispersive X-Ray Spectroscopy (EDS)
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Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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Product
Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Product
Fixed Systems
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Low cost versatile solutionCompact, weatherproof, NEMA 4X enclosure115/220 VAC or 24 VDC operationLong life sensors (2+ years typical)Accepts RKI LEL/O2/H2S/CO direct connect sensorsAccepts any 4-20 mA transmitterAudible alarm with reset buttonTwo programmable alarm levelsBuilt-in trouble alarm with relayRelay rating 10 amps, form CProvides 4-20 mA output
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Product
Sampling System
ASS-370
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The sampling unit is responsible for suction air from ambient and to distribute this air without any changing to the gas-monitors. The HORIBA sampling unit is designed according ÖNORM-M5852 Type A. So an air flow monitor will give alarm information when the flow is to low.
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TDR System
TS9001
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The system accurately analyzes the wiring quality of various leading-edge semiconductor packages such as Flip Chip BGA, wafer level packages, and 2.5D/3D ICs using terahertz technology. It is a TDR analysis system that has the world’s top-class signal quality.
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Product
Inspection System
X-eye 7000B
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Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Product
Radar Test System
UTP 5065
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Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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X-ray Diffraction (XRD) Instruments
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X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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Deposition Systems
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When a thin film requires the most stringent structural or compositional properties consistently across every layer, Veeco’s Ion Beam Deposition (IBD) technology is often the answer. Using a focused beam of ions to sputter material from a target, this physical vapor deposition technique builds dense, uniform films with standout adhesion and stability.
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Intelligent Systems
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Technologically advanced machines that perceive and respond to the world around them.
