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Product
Automatic Flight Inspection Systems
AT-940
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The AT-940 is a mobile and deployable flight inspection system providing high performance in the smallest possible package.
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Product
Automatic Flight Inspection System
AT-920DG
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Airfield Technology is pleased to announce the availability ofa new product, the AT-920DG Automatic Flight InspectionSystem.The new AT-920DG system combines the unique groundbasedinspection capability of our original AT-920 with theproven DGPS positioning system and WinFIS flight inspectionsoftware from our larger, dual equipment AT-930DG system.
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Product
Automatic Flight Inspection System
AT-930DG
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Fully Automatic OperationAll-Weather CapabilityDifferential GPS Position ReferenceHigh Accuracy and Maximum ReliabilityWindows User Interface SoftwareEasy to Operate and Easy to LearnMinimum Maintenance RequirementsModular System ArchitectureLong-Term Supportability
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Product
Technology of Global Market Leader
AeroFIS
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Aerodata is the only manufacturer of Flight Inspection Systems with an in-house aircraft integration capability and can therefore assume full responsibility for the integrated performance of the aircraft and flight inspection equipment. As a European manufacturer with international recognition, we can provide unique capabilities for the supply of advanced flight calibration equipment with special consideration of compliance with both European (EASA) and US (FAA) regulations, equipment compatibility with neighboring countries, and highest levels of product support.
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Product
Automatic Flight Inspection System
AT-950
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The AT-950 is the easiest to use and the fastet performing FIS available.
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Product
Tool, Inspection Depth Gauge, Micro Coax, ITA
910121180
Inspection Tool
Tool, Inspection Depth Gauge, Micro Coax, ITA.
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Product
Tool, Inspection Depth Gauge, Micro Coax, Receiver
910121179
Inspection Tool
Tool, Inspection Depth Gauge, Micro Coax, Receiver
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Product
4x 3U OpenVPX MOSA Flight Control Computer
SIU34-FCCVARM-01
Flight Control Computer
SIU34-FCCVARM-01 is a Modular Open Systems Approach (MOSA) DO-178C & DO-254 Certifiable Flight Control Computer (FCC) with low power high performance OpenVPX Xilinx UltraScale+ SBC with Quad Core ARM Cortex -A53, 8 GB DDR4 SDRAM, 32 GB SATA Flash, 2 x 10/100/1000Base-T Ethernet, USB 3.0, FIPS-140-3 Level 3 Cyber Security, and Single Event Upset support.
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Product
Flight Inspecton
HeliFIS
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Our HeliFIS is a supplement to the implementation of the flight surveying services with helicopters:Adapted to the AeroFIS product familyBased on AeroFIS hardware modulesWith proven reliability and worldwide usabilityBased on AeroFIS softwareIdentical operation and the same databaseCustomized solutions are possiblePortable systemsFully integrated systemsA variety of options selectable
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Product
Time-of-Flight Sensing
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Low-power time-of-flight sensing technology from ams enables host systems to measure distances accurately and at very high speed. Accurate distance measurements are used in various applications including presence detection, user face recognition and advanced cameras.
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Product
Airborne Network Flight Recorder
TTC nREC-4000S
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Curtiss-Wright Defense Solutions
The TTC nREC-4000S-2 is an intelligent IP flight recorder. The unit records data from network-based data acquisition and multiplexing devices and, with built-in intelligence, supports extensive recorder statistics and provides continuous health monitoring.
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Product
Scanning & Inspection
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API’s offers a range of portable measuring and laser scanning solutions together with robot or tripod mounted 3D structured light scanner.
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Product
Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Product
Flight Test Instrumentation Software
TTCWare
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Curtiss-Wright Defense Solutions
TTCWare is a data acquisition system configuration and programming application. Using TTCWare, you can customize the behavior of your hardware and create parameters to sample data. Parameters can be inserted into the PCM format at user specified locations in order to achieve desired sampling rates. After creating a PCM format, you can program your hardware with your customized configuration.
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Product
Inspection Tools
Multi Disk Test System (4-Port)
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16 types of inspection modes can be registered and edited. More accurate acceptance inspections can be performed using various types of inspections.High speed data communications using USB interface for communicating with host computer.Acceleration testing for temperature loaded HDD can also be performed. (Optional)Easy attaching and removing HDD using optional plug-in unit.
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Product
Inspection System
X-eye 7000B
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Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Product
Pipeline Inspection
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Radiodetection and Pearpoint provide a wide array of Pushrod and Crawler pipeline inspection systems.
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Product
Flight Safety Systems
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L3 Cincinnati Electronics is a world-leader in range safety protection. Applications include missiles, unmanned aerial vehicles, heliostats and decoys. L3 CE is the provider of the next-generation flight termination receiver.
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Product
Inspection System
Pixie
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3-D Metrology for automation. Pixie is a standard system for automated optical quality inspection. Pixie can be configured with 2 to 5 servo driven axis movement and the high-speed measurement capabilities make it suitable for inline and stand-alone solutions.
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Product
Flight Testing
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ATA Engineering has developed flexible low cost methods to satisfy our customers' flight testing needs. We are able to provide innovative solutions to acquire and process all types of flight testing data without requiring expensive software and hardware solutions.
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Product
Macro Inspection
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High-throughput automated macro inspectionAny wafer size, in less than one second with ~75 micron resolutionSmall footprint table-top system
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Product
Space Flight Components
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A tec, Inc. specializes in the design, manufacture, and integration of complex test systems and quality critical components. Our production engineering expertise separates us from other manufacturing companies when both reliability and cost are important. Atec has the best in 5 to 9 Axis CNC machining, coordinate measuring machines (CMMs), 3D additive metal and plastic printers, 9-Axis capable waterjet, cryogenic liquid flow test benches and environmental test chambers. We can deliver to the tightest tolerances and most exacting requirements. We can advise our customers on electron beam welding, friction joining, electronic test, environmental test, acoustics, vibration and many other technologies that can reduce manufacturing and operating costs. We are currently manufacturing liquid rocket engine fuel and oxidizer valves for multiple launch vehicles and have participated in 158 consecutive launch successes. Atec manufactured and tested advanced lithium-ion battery adapter plates that manage power for the International Space Station. Atec is designing, manufacturing, and testing power flow modules that work to prevent system failure on the human crew capsule (CCTS) that will transport astronauts to/from the ISS. Atec was awarded NASA Agency-Level Small Business Subcontractor of the Year , SBA Region VI Subcontractor of the Year for our support to NASA and Boeing and we were named a DCMA Top 500 Supplier.
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Product
Tool, Inspection Depth Gauge, Mini Coax, Receiver
910121156
Inspection Tool
Used to verify the depth setting of the center conductor of receiver mini coax contacts.
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Product
Optical BGA Inspection
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Imaging hidden solder joints of BGA, IBGA, FlipChip, CSP, CGA and SMD components
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Product
Abrasive & Blast Inspection
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Blasting parameters: A number of important parameters need to be monitored during the blasting or water jetting process, these include: air pressure (at the nozzle), nozzle diameter, blast media contamination & pH values in order to avoid recontamination of the substrate during blasting.
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Product
Flight Attendant Bags
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The Flight Attendant Bags provide a convenient solution for storing items frequently used on the aircraft.
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Product
Dimensional Inspection
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Initial Inspection Sample Reports (ISIR's)• Production Part Approval Process (PPAP)• Capability Studies• Production Surveillance• Reverse Engineering• Third Party Arbitration• Will Provide Same Day Quotation With Part and/or Print• Immediate Service Available
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Product
Wafer & Die Inspection
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SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Product
Inspection & Alignment Services
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As a leading provider of precision measurement services for power generation and turbo-machinery, API has the professional experience necessary to minimize the overall downtime of the outage or rebuild schedule. The ability to fully utilize API’s precision measurement capabilities, combined with experienced Service Engineers in the turbine alignment process, differentiates API for complex alignments.
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Product
Defect Inspection and Review
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KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
