Measuring Microscopes
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Contour Measuring Machines
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arious kinds of measurement is achieved by upper / lower surface continuous measurement and measurment adjustable functionEquipped with new arm fixed by a magnet-type attach/detach mechanism
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Products for High-Frequency Measurement
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This product range includes passive high-frequency test probes and accessories as well as touch-protected BNC plug connectors, insulated BNC panel-mount sockets, leads with RG58 or RG59 cable, adapters and converters. Our test probes are suitable for use in CAT III- and CAT IV environments (Measurement Categories), such as the analysis of house and building installations with mains analysis/mains monitoring devices. Our high-frequency accessories are designed with clearance and creepage distances in accordance with IEC/EN 61010-031.
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CT-PT-CVT Measuring
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Testing object: S current transformer, normal current transformer, voltage transformer● Testing item: ratio error, phase error, impedance, admittance of the transformer, etc● Rated current:5A,1A ( Customized )● Rated voltage: 100V, 100/√3V, 100/3V, 110V, 110/√3V, 110/3V, 120V, 120/√3V, 120/3V, 220V (or other)● Measurement range: ratio error measurement range : 0.0001%-19.99% phase error measurement range : 0.01 ' -900 '● Error minimum resolution:ratio error:0.0001%; phase error:0.01 ' ● Communication function : provide RS232 serial communication port● Measurement accuracy: ±1%● Consumed power: less than 20VA● Dimension :460×380×160 mm● Weight: 12kg
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PCE-2000UV Ultraviolet LED/Module Radiation Measurement System
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Hangzhou Everfine Photo-E-Info Co., LTD
PCE-2000UV Ultraviolet LED/Module Radiation Measurement System can realize the measurement of the relative spectral power distribution of ultraviolet LED, peak wavelength, half-peak wavelength, spectral radiation flux of UV-A/B/C, and total radiation flux in specific wavelength.
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Spectral Measurement Instrument
HR-768i
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A full-range instrument at a lower price point for when you don’t need all the performance of the HR-1024i.
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Motorized Force & Torque Measurement Test Stands
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Mark-10 offers a wide and unique range of motorized force measurement and torque measurement test stands. Motorized stands offer a significant advantage over manual test stands by providing constant test speed. Some models can be programmed for advanced test sequences to accommodate demanding applications. All motorized test stands carry the CE mark. A test stand is an integral part of a testing system, typically also comprising a force gauge or torque gauge, grips, software, and accessories.
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Source / Measure Units
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A Source/Measure Unit, or SMU, is a source and measurement resource for test applications requiring high accuracy, high resolution and measurement flexibility. SMUs are sometimes also referred to as source monitor units. An SMU can precisely force voltage or current and simultaneously measure voltage and/or current.
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3D Micro Coordinate Measurement Machine and Surface Roughness Measurement Device
InfiniteFocusSL
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With the InfiniteFocusSL you are able to measure form and roughness of your components with only one system. In addition, color images with high contrast and depth of focus are achieved. The robust frame and the intelligent illumination technology provide fast and high-resolution measurement in the laboratory and a production near environment. The measurement system is particularly attractive due to its cost effectiveness, measurement speed and usability. The long working distance in combination with the above average measurement field allows a wide range of applications. Measurements are achieved within seconds, and features, such as a coaxial laser for quick and easy focusing, enhance its usability.
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NanoModeScan M² Measuring System
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This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
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Phase Noise Measurement Application
N9068A
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One-button measurements for analyzing phase noise in frequency domain (log plot) and time domain (spot frequency)Compatible with phase noise measurement personality in Keysight PSA and ESA spectrum analyzers Runs inside the PXA, MXA, EXA signal analyzers and MXE EMI receiver
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Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Beam Pattern Measurement System
BP100
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The BP100 is purpose-made for luminous intensity measurement of lamps, using a diffusely transmitting screen to provide a flat image that can be measured by an imaging photometer. This is a low cost, versatile solution in comparison to the traditional method of measuring lamp properties as a function of angle of emission, using Goniometers that are often costly and dedicated for one specific measurement.
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Level Measurement
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Omega provides contact and non-contact instruments for liquids, and non-contact instruments for solids. Choose from continious measurement or point level measurement with one of our level switches.
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High Purity Gas Measurements
DF High Purity
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When your processes need high purity gas measurements for oxygen and moisture, DF analyzers deliver industry-leading performance that reaches down to the very lowest ultra-trace levels. Utilizing the exceptional sensing capabilities of Servomex’s coulometric and TDL sensing technologies for the measurement of oxygen and moisture respectively, DF analyzers are optimized for a sensitive and stable analysis at ppm, ppb and ppt levels.
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Source Measure Unit (SMU)
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Source and Measurement Units (SMUs) are devices that generate voltages or currents and can measure them simultaneously using the integrated measurement units (VMU, CMU).
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Spectral Light And Color Meter w/ Flicker measurement
BTS256-EF
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Spectroradiometer for the illuminance (photopic, scotopic, melanopic), spectrum, light color, color rendering index, and flicker. Cosine field of view illuminance measurement for accurate evaluation of extended illumination. Flicker measurement. Spectral measurement technology, required for LED light, color, color rendering, color effects. Photodiode for synchronization to pulse width modulated light and flicker measurement.
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Advanced Measurement Package For M8000 Series Of BERT Test Solutions
M8070ADVB
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The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070ADVB Advanced Measurement package offers advanced features like automated jitter tolerance test and parameter sweeps, eye diagram measurement or the integration of external equipment such as electrical and optical clock recovery or error analysis using a real-time scope.
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Wi-Fi/Bluetooth/IoT Wireless Measurement Solution
MP5200
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*One-to-four parallel high-speed non-signaling test*Support Wi-Fi 802.11ax latest standard*Support Bluetooth V1.x/V2.x/V3.x EDR/BLE V4.x/V5.1 measurement*Support IoT protocol NB-IoT, Zigbee, single-channel GNSS...etc
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Radiometer Spectral sensitivities precisely adapted to the measurement task
UVS-B-T
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Compared to the spectral response of the UVS-E, the UVS-B-T has a sharper cut-off at the transition from UV-B to UV-A. This feature reduces the UV-A contribution to the radiometer output and permits the highest possible correlation to atmospheric UV-B irradiance.
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Electronic Production Measuring & Testing Instruments
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Wuhan Fanke Transformer Manufacture Co., LTD
Electronic Production Measuring & Testing Instruments
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X-Series Measurement Applications for Signal/Spectrum Analyzers
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The X-Series applications are proven, ready-to-use measurements for signal analysis. Simplifying complex tasks and delivering repeatable results, the applications let you see and understand the performance of your cellular, wireless and aerospace/defense devices and designs.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
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Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
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Precision IV Analyzer / 8 Slot Precision Measurement Mainframe
E5270B
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Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Electrical Conductivity Measuring Instrument
SIGMASCOPE® SMP350
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Handheld instrument for electrical conductivity measurement of non-ferromagnetic metals. The electrical conductivity can be used for determining material properties, like hardness, strength, heat damage and material fatigue of metals. Rapid and simple on-the-spot conductivity measurement of non-ferromagnetic metals acc. to DIN EN 2004-1 and ASTM E 1004.
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Flow Measurement
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HighReach Measuring & Controlling System Co.,Ltd
Involves using flow meters that measure the flow rate of steam, liquid, or gas flowing through a pipe.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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LED Measurement – UV, VIS, NIR
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UV, VIS, and IR LEDs are replacing traditional light sources and are enabling new applications. Ophir offers a number of choices in LED power measurement - use the LED sensor finder to find the right sensor. For cases where a complete image of the beam distribution is necessary, use a beam profiling camera.
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Fiber Optic Inspection Microscope
80760
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The Miller 200x Microscope helps inspect fiber optic connectors quickly and easily. Its ergonomic design and built-in features make it ideal for field and lab use. The microscope features a pressure-activated on/off switch, focusing wheel, eyepiece, auxiliary white LED light source rated for 100,000 hours, adapter tip for inserting ferrule and battery compartment.
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Photonic Test & Measurement
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Keysight offers a wide-range of innovative test and measurement solutions to accelerate the progress of next-generation intelligent optical networks. Keysight's mission in the optical market is to shorten time-to-market and reduce cost-of-test for customers in R&D and manufacturing, as well as enable new technologies which include innovative optical components, network elements & systems, and all-optical fiber networks.
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Inline Measuring System
EBA
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The measuring system consists of a measuring and processing unit together with a double yoke system with all the required coils (exciting coil, secondary coil, tangential field coil). The double yoke system is installed in the production line. The material to be measured is fed through this unit.
