Distributed Systems
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PCI System Timer
SKU-051-01
The PCI System Timer uses a hardware clock to synchronize IP signals. This hardware-based solution provides accurate clock timing for Asterisk® open-source PBX software.The timer supports variable clock timing intervals. You can configure the clock interval during startup. Currently, the PCI System Timer supports clock interval ranging from 1ms to 64ms.
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Power Monitoring Kit For SAR System Validation
PMK
Test labs have a daily requirement to ensure SAR measurements are highly accurate. SAR systems must be vigorously checked to ensure the measuring accuracy meets the system manufacturer uncertainty budget. The PMK features technologies usually found in more expensive equipment at an affordable price. The ability to measure the S11 parameter for dipoles and antennas while continuously monitoring their linear behaviour differentiates the PMK from other systems. The ART-Fi PMK is an all-in-one solution that requires only three connections to perform automatic, highly precise validations and verifications. The lack of moving parts also leads to improved durability and fewer bugs, faults, and workarounds.
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Magnetic Measurement System
Model 110
The Model 110 Magnetic Measurement System is a very high field version of our industry-standard MESA, designed specifically to measure high-coercivity samples. It uses powerful amplifiers and specially designed water-cooled solenoid assemblies to achieve the magnetic fields required by state-of-the-art material.
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Optics Test Systems
MTF Measuring Device For Endoscopes
Optik Elektronik Gerätetechnik GmbH
Manual MTF measuring device for endoscopes. The measurement setup is based on modular individual components that can be arranged on a breadboard according to the type of endoscope (angle between light entrance and eyepiece).
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Compact Timing Systems
NanoSync IV & NanoSync IV Low Profile
The NanoSync IV is a small form factor GPS Position, Navigation, Time (PNT) and Frequency reference system that provides multiple reference outputs and includes support for NTP & PTPv2 IEEE 1588-2008. The NanoSync IV has a Rubidium oscillator and is available with a civilian C/A GPS receiver or SAASM (Rockwell-Collins MPE-S GB-GRAM or Trimble Force 22E MRU GPS receiver) for military users. The NanoSync IV is packaged in a small, rugged enclosure ideally suited for embedded electronic warfare applications.The NanoSync IV-SA-Rb has been demonstrated to be compliant to the Joint Airborne SIGINT Architecture (JASA) Version 3.0, Annex 1, for Time, Frequency, Navigation and Geodesy (TFNG), making it suitable for Electronic Warfare (EW) COMINT and ELINT applications in fixed site, airborne and shipboard environments.
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Automated I-V/AOI/EL and Sorting System
OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Surface Defect Inspection System
Wafer for inspection of surface condition of specular flat substrate, glass substrate, others φ 100 ~ φ 300 compatible
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EUV Lithography Systems
Using extreme ultraviolet (EUV) light, our NXE and EXE systems deliver high-resolution lithography and make mass production of the world’s most advanced microchips possible
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SMART SystemS
The SMART systems architecture is developed around open, standard technologies such as Linux, InfiniBand™, MPI, VSIPL and Corba. Through the support of well-know development tools and libraries, customers can reduce development time and shorten time-to-deployment. This approach also provides customers the flexibility to operate within a heterogeneous computing environment.
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Ion Beam Milling Systems
When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
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Neutron Flux Monitoring Systems
To monitor reactor core neutron flux and provide indication during all modes of reactor operation, and to provide trip signals to the Reactor Protection System (RPS) and the Reactor Manual Control System (RMCS).
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Photovoltaic System Bypass Diode Tester
FT4310
Hioki is pleased to announce the launch of the Bypass Diode Tester FT4310 for Photovoltaic Systems. The FT4310, which is designed to test bypass diodes in strings of crystalline photovoltaic cells, can be used to detect open and short-circuit faults in bypass diodes by string either in daylight or at night. The instrument is the first portable device capable of detecting bypass diode open faults in operating panels (without requiring the panels to be shielded from sunlight).
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3-Phase Relay Testing System
TRES
With high power outputs packaged in an extremely compact and rugged system, the TRES has a tremendous power-to-weight ratio. The design incorporates the latest in modern digital microprocessor technology to achieve unbeatable output characteristics in terms of power, accuracy, low distortion, and dynamic capability. This hi-tech solution enables the testing of many different functions required in relay testing without the need of additional accessories.
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Modular Test System
A modular test system, RTS (real time scanner) provides instant test results with minimal interface cables to check wiring during installation.It tests wire harnesses in real time using our micro switching technology, reducing the need for high cost interface cables by around 90%. an innovative best-in-class solution for FAL testing, RTS also offers many benefits for wire harness and sub-assembly manufacturers.
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Datapaq Solar Tracker System
The SolarPaq® Thermal Profiling Systems from Fluke Process Instruments are designed specifically for solar photovoltaic (PV) manufacturing including applications like contact firing, contact drying, anti-reflection coating for the solar cell, lamination and other thin film processes. These systems, consisting of user-friendly Insight™ software, Datapaq® Q18 data loggers, stainless steel thermal barriers, thermocouples with PTFE or mineral insulation and accessories, provide users with the tools needed to gather accurate, repeatable results for process optimization, maximize cell efficiency and throughput, and more.
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Multi-Test Resistivity Measurement System
Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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Refurbished And Demo X-ray Inspection Systems
Our 2024 collection of refurbished and demo X-ray inspection systems offers high-quality performance at an affordable price. These precision X-ray inspection systems provide exceptional value without compromising on quality.
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Remote Weapon Systems Sight
ThermoSight® V4000E
The ThermoSight® V4000E is a cooled midwave infrared (MWIR) sight for long-range remote weapon systems designed to maximize performance and stand off range. It has a wide field of view of 10 degrees to scan the scene for threats and targets a narrow 2 degrees field of view for target assessment and accurate timing. The ThermoSight® V4000E has superior automatic detail enhancement (ADE), a proven low-life cycle cost, and a fast and reliable calibration mode (NUC) for easy operation.
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Airlock Control System
The system is built on the basis of a panel computer with a touch screen, performing the functions of a user interface and recording the measured parameters. The stand is equipped with gate drives and a set of sensors (pressure, flow rate, force). Real-time gate control is implemented on the basis of the R-series board; for input and conversion of analog signals from the sensors, an expansion cage of the cRIO-9151 R-series boards is used.
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ATE System Power Supplies
N8700 Series
The Keysight N8700 Series ATE system power supply delivers high current with low noise in a compact two unit package. Airflow moves front to back, so no additional space is required above or below the power supply in your automated test equipment (ATE) rack. This series of programmable power supplies sources up to 3300 or 5200 W. Get output voltages from 8 to 600 V and 5.5 to 400 A.
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Integrated Potentiostat System
ER466
The ER466 Integrated Potentiostat System is our most popular potentiostat model, being ideal for cyclic, linear sweep, and most analytical pulse voltammetric experiments, either in the research or teaching laboratory. It also functions as a galvanostat, ZRA (zero resistance ammeter), and high impedance voltmeter (electrometer).
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Transducer Test System
TTS-030
For the generation of unique bond links the use of high-quality components is an essential precondition. Despite all care in the production of ultrasonic transducers again and again unexpected effects occur, which only manifest themselves in the use of those transducers and which also have the reason in the transducer itself.
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Intelligent Battery Charger-Analyzer for Battery Systems
SuperMini
The SuperMini is an instrument designed to charge, trickle charge and analyze ( discharge ) Nickel-Cadmium, Sealed Lead-Acid and other types of rechargeable batteries. With its multiple modes of operation: Constant Current Charge ( dual and single rate ), Constant Current & Float Charge, Constant Current & Peak Stop Charge, Automatic Discharge ( analysis ), Resistance Discharge ( analysis ) and Full Discharge ( deep cycle ). The SuperMini can satisfy the requirements of most ( Up to 40 A-hr ) rechargeable battery systems. The instrument features safety interlocks to protect the operator, the charger and the battery in the event of reversed polarity connection, short circuit, open circuit ( no load ) and Over-voltage conditions. Two large LED digital meters permit the simultaneous monitoring of voltage and current, while eight indicator lights display the status of the operation.
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In-Circuit Test System
TestStation LX
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Multifunction Data Collection and Analysis System
2002
The Model 2002 DME System is a state of the art, multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Goniophotometer Test System For Led Lamp
LCG-1680B
Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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Students Performance Measurement System
MS 3039
Parent Corner is a very useful tool for education service providers. It helps parents, teachers and students in analytical way. This software is based on client server configuration & it is used to record/monitor/inform student’s performance and interest through statistics. Tool measures his performance in subject wise, test wise, year wise and represents his performance in graphical method which guides teachers and parents to take preventive and corrective measures.
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Terminal Blocks with System
The Phoenix Contact terminal blocks enable a high degree of flexibility in terminal strip design. Choose between various connection technologies and combine the terminal blocks by installing bridges in the double function shaft. The terminal block system features standardized bridging, marking, and test accessories.
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Wafer Inspection System
AutoWafer Pro™
AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
