Showing results: 76 - 90 of 92 items found.
-
B1514A -
Keysight Technologies
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
-
B1505A -
Keysight Technologies
The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
-
Accel-RF Corporation
The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
-
KLA-Tencor Corp
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
-
UV-A Sensor -
Genicom Co., Ltd
Gallium Nitride Based MaterialSchottky-type PhotodiodePhotovoltaic Mode OperationGood Visible BlindnessHigh Responsivity & Low Dark Current
-
GUVV-T20GD-U -
Genicom Co., Ltd
Indium Gallium Nitride Based MaterialSchottky-type PhotodiodePhotovoltaic Mode OperationHigh Responsivity & Low Dark Current
-
GUVA-S12SD -
Genicom Co., Ltd
Gallium Nitride Based MaterialSchottky-type PhotodiodePhotovoltaic Mode OperationGood Visible BlindnessHigh Responsivity & Low Dark Current
-
GUVV-S10SD -
Genicom Co., Ltd
Indium Gallium Nitride Based MaterialSchottky-type PhotodiodePhotovoltaic Mode OperationHigh Responsivity & Low Dark Current
-
GUVA-C22SD -
Genicom Co., Ltd
Gallium Nitride Based MaterialSchottky-type PhotodiodePhotovoltaic Mode OperationGood Visible BlindnessHigh Responsivity & Low Dark Current
-
GUVA-T11GD-L -
Genicom Co., Ltd
Gallium Nitride Based MaterialSchottky-type PhotodiodePhotovoltaic Mode OperationGood Visible BlindnessHigh Responsivity & Low Dark Current
-
GUVV-T10GD -
Genicom Co., Ltd
Indium Gallium Nitride Based MaterialSchottky-type PhotodiodePhotovoltaic Mode OperationHigh Responsivity & Low Dark Current
-
GUVA-T11GD -
Genicom Co., Ltd
Gallium Nitride Based MaterialSchottky-type PhotodiodePhotovoltaic Mode OperationGood Visible BlindnessHigh Responsivity & Low Dark Current
-
GVGR-T10GD -
Genicom Co., Ltd
TO-46 with quartz glassIndium Gallium Nitride Based MaterialPN-type PhotodiodePhotovoltaic Mode OperationHigh Responsivity & Low Dark Current
-
GVGR-S11SD -
Genicom Co., Ltd
SMD3528 with Si-encapsulantIndium Gallium Nitride Based MaterialPN-type PhotodiodePhotovoltaic Mode OperationHigh Responsivity & Low Dark Current
-
GVBL-T12GD -
Genicom Co., Ltd
TO-46 with quartz glassIndium Gallium Nitride Based MaterialPN-type PhotodiodePhotovoltaic Mode OperationHigh Responsivity & Low Dark Current