Manufacturing Defect Analyzers
Test for loaded PCB manufacturing defects, analyzing short circuits, open circuits, and some component values.
See Also: MDA
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Product
Manufacturing Test Modules
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Manufacturing Test Module (MTM) Series instrumentation from Acroname is the platform you need to free your production testers from the burdens of validation test equipment. Mix and match modules to create a complete tester within a fixture frame, eliminating benchtop and rack equipment - all without sacrificing the robustness and reusability you demand from your equipment.
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Product
USB 2.0 Protocol Analyzer
Mercury T2
Protocol Analyzer
The Mercury T2 is the industry's smallest, most affordable hardware-based USB 2.0 protocol analyzer that combines the defacto standard CATC Trace display with powerful analysis features. The pocket-sized Mercury T2 is bus powered and is controlled using any Windows PC. With comprehensive triggering, the Mercury T2 provides much of the same lab quality protocol analysis capabilities offered in Teledyne LeCroy's top-of-the-line USB analyzers.
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Pipeline Defect Mapper
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The non-intrusive measuring device takes measurements along the pipeline and plots the results directly onto the screen of the receiver. There is no need to carry extra logging and display devices. All the data is displayed and logged into the receiver for downloading to a spreadsheet or dedicated analysis program.
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Product
Vector Network Analyzer (VNA) Simulator – Advanced
S94051B
Vector Network Analyzer
S94051B puts Keysight’s industry-leading network analyzer software portfolio into your computer. Dive deeper into data captured on an instrument with support for time domain, spectrum analysis, gain compression, and all the other software applications you use on your instrument. You can also develop and troubleshoot test programs on your computer before deploying them to the instrument. S94051B is a superset of S94050B and contains the S-parameter functionality.
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Product
FieldFox C Handheld Microwave Spectrum Analyzer, 6.5 GHz
N9934C
Spectrum Analyzer
Capture elusive signals with up to 120 MHz gap-free, real-time bandwidth. Make accurate spectrum analyzer measurements (± 0.3 dB) without warmup. Perform over-the-air measurements for 5G NR and LTE. Use GPS/GNSS for geolocation and timestamping.
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Product
FieldFox Handheld Microwave Vector Network Analyzer
N9926A
Vector Network Analyzer
14 GHz max frequency Carry the world's most integrated handheld T/R VNA analyzer Expand your measurement flexibility with optional 2-port VNA, time-domain, vector voltmeter, cable and antenna analyzer and more Save time by simultaneously measuring all four S-parameters with a single connection Perform accurate testing with QuickCal, full 2-port unknown thru Cal, TRL Easily measure average and pulse power with a USB power sensor
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Product
Lab And Manufacturing Testing
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VIAVI provides trusted, innovative testers that designers rely on to ensure that their network equipment is designed and built at peak performance – up to 400G and beyond.
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Product
Streamline USB Vector Network Analyzer, 44 GHz
P5007A
Vector Network Analyzer
Compact, faceless, USB vector network analyzer (VNA). Flexible two port VNA which dramatically reduces your size of test. Up to 44 GHz.
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Product
MXA Signal Analyzer, Multi-touch, 10 Hz to 50 GHz
N9020B
Signal Analyzer
Quickly adapt to evolving test requirements of wireless devices Shorten test times with hardware-accelerated power measurements, rapid display updates and marker peak searches and fast sweeps Simplify testing with one-button measurements from X-Series applications Capture elusive or transient signals with full-band real-time spectrum analysis
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Product
FieldFox C Handheld Microwave Spectrum Analyzer, 10 GHz
N9935C
Spectrum Analyzer
Capture elusive signals with up to 120 MHz gap-free, real-time bandwidth.Make accurate spectrum analyzer measurements (± 0.3 dB) without warmup.Perform over-the-air measurements for 5G NR and LTE.Use GPS/GNSS for geolocation and timestamping.Carry one lightweight unit at 3.4 kg (7.4 lb).What's included:Base model: spectrum analyzer (SA)AC/DC adapterLocalized power cordRechargeable Li-ion batterySoft carrying case with backpack and shoulder straps
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Defect Inspection and Review
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KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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Packaging Manufacturing
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KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.
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Product
Streamline Vector Network Analyzer, 9 KHz To 4.5 GHz, 4 Or 6-port
P5020B
Vector Network Analyzer
Compact, faceless, vector network analyzer (VNA). Flexible four or six-port VNA dramatically reduces your size of test. Up to 4.5 GHz.
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Product
signal analyzer
DSA DOCSIS
Signal Analyzer
Only the highest signal quality ensures maximum throughput. The R&S®DSA DOCSIS signal analyzer has been designed to support users by ensuring the highest signal quality. DOCSIS is the standard for transmitting IP data within hybrid fiber coaxial (HFC) cable TV networks.
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Product
Keysight Streamline USB Vector Network Analyzer, 4.5 GHz
P9375A
Vector Network Analyzer
Compact, faceless, USB vector network analyzer (VNA). Affordable full two-port VNA which dramatically reduces your size of test. Up to 26.5 GHz.
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Product
Manufacturing Plug-in
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Manufacturing Test Plug-in, supports incorporating VNA software into automated manufacturing process
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Product
PXIe Vector Network Analyzer Synthesizer: 187.5 MHz To 6 GHz
M9309A
Vector Network Analyzer
The M9309A PXIe vector network analyzer (VNA) synthesizer is a component for the M9485A PXIe multiport vector network analyzer. Control the M9309A through the M9485A software front panel. The M9485A provides a true multiport VNA with up to 12-ports in one chassis and up to 24-ports in two chassis.
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Product
Harness Design and Manufacture
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When designing an underwater cable harness, there are some factors which need to be considered, and we have produced the following list as a guide for customer information:Component considerations:- Electrical requirements- Mechanical considerations- Quality requirements- Reliability- Design redundancy (contact count)- Connector selection (type and form)- Locking requirements- Backpotting requirements- Waterblocking in moldings- Cable specification- Cable jacket material and compatibility with elastomers- Abrasion resistance- Stiffness profile at termination- Connector format (straight or right angle)- Molding format (straight or at an angle)- Clearance allowance for molding and cable routing- Elastomer compatibility (eg oil filled units)- Metalwork selection re: corrosion and cathodic delamination- Surface finish for metalwork as appropriateOperational considerations:- Operating depth profile (not just max. depth)- Tensile loads- Torsional loads- Bending loads- Bend control requirements (to limit bending at termination)- Deployment and recovery loads- Dynamic loading-Flow turbulence effects.
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Product
Compound Semi | MEMS | HDD Manufacturing
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KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
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Product
Fiber Manufacturing
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From preform fabrication to final quality control, our fiber test instruments are designed to provide a complete end-to-end solution for all of your testing needs. Our technology is so widely used that virtually all fibers produced globally encounter multiple PK instruments before leaving the factory.
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Product
Manufacturing Analytics 360°
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Optimize quality and efficiency in manufacturing with a 360° viewof your production line by our advanced analytics
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Product
PNA-L Microwave Network Analyzer
N5234B
Network Analyzer
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to43.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
PXI Vector Network Analyzer
Vector Network Analyzer
PXI Vector Network Analyzers feature two ports, so you can choose between T/R test sets or full S-parameter capabilities. The PXI Vector Network Analyzer supports automatic precision calibration, full vector analysis, and reference plane extensions, so it is an ideal vector network analysis solution for your validation and production operations without the high cost and large footprint associated with a traditional benchtop VNA. These models seamlessly integrate into test systems for highly accurate, fast RF measurements.
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Product
Auto Macro Wafer Defect Inspection
EagleView
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EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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Spectrum Analyzer
FPC
Spectrum Analyzer
Outstanding quality and innovation does not have to come with a high price tag. The R&S®FPC spectrum analyzer provides unexpected performance at a budget-friendly price. It is engineered in Germany and designed to the same quality standards as highend instruments.
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Product
ENA Vector Network Analyzer
E5063A
Vector Network Analyzer
2-port, 50 ohm, S-parameter test set Select the VNA frequency option that best suits your test needs and budget, and upgrade options at any time Boost efficiency and productivity with the consistent measurement framework of the industry-standard vector network analyzer Enhance your PCB manufacturing test capability with Option 011Easier operation with support for 6 languages via softkey & the embedded help manual in English/Simplified Chinese Every spec verified, adjustments included Lock in support & peak performance from the start
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Spectrum Analyzers
T3SA Series
Spectrum Analyzer
Teledyne Test Tools new T3SA3000 family of Spectrum Analyzers offers a frequency range of 9 KHz to either 2.1/3.2 GHz alongside many impressive features. With their light weight, small form factor, and user friendly interface, these Spectrum Analyzers take powerful and reliable automatic measurements that are presented on a large, bright, easy to read touch screen display. Typical uses for the T3SA3000 series are research and development, education, production, maintenance, and pre-compliance testing.
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Product
Streamline Vector Network Analyzer, 100 KHz To 26.5 GHz, 2-port
P5005B
Vector Network Analyzer
Compact, faceless, vector network analyzer (VNA). Flexible two-port VNA dramatically reduces your size of test. Up to 26.5 GHz.
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Product
Wafer Defect observing instrument
HS-WDI
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Application■Semiconductor wafer■Solar wafer■Solar Cell■Thin-film Cell
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Product
NUV-PL SiC Defect Inspection System
VS6845E
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Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
