Showing results: 361 - 375 of 473 items found.
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Aero Engineering Support Group
ATE Development Aero Engineering Support specializes in designs and manufacturing of a wide variety of Automatic Test Equipment (ATE) of support for military avionics, commercial avionics, industrial sector, etc. AESG is committed to providing industry leading equipment that are designed to be scalable and expandable ATE capable of providing reliable functional test solutions for any electronic assembly or Circuit Card Assembly. New from Aero Engineering Support is the A2500 system, providing:
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6U VME 4500 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 4500 crate series is a compact new generation of 19" integrated packaging system with frontal cooling air intake for standard VME/VME64 bus systems with 6Ux160mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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6U VME64x 4500 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 4500 crate series is a compact new generation of 19" integrated packaging system with frontal cooling air intake for standard VME64x bus systems with 6Ux160mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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LS-50-cP -
Lumistar Inc.
The Lumistar LS-50-cP 3U Compact PCI Multi-function PCM Decommutator offers the greatest flexibility in the industry by incorporating up to 10 functions typically encountered in flight test applications in a single 3U Compact-PCI card slot. Five functions are achieved on the main board (PCM Simulator which can also operate as a BERT, PCM Decommutator, IRIG Time CodeReader, IRIG Time Code Generator, and the same 5 functions can be achieved on the LS-55-DB Multi-Function Decom Daughterboard. CVSD Voice Decoding and h.261 Video Decoding are achieved through software.
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Excalibur Systems, Inc.
The EXC-4000 carrier board series was developed to meet the needs of avionic testers for multi-protocol integrated, digital bus testing. Modules may be selected out of a growing list which currently includes MIL-STD-1553/1760, MMSI, H009, ARINC-429, ARINC-708/453, Serial (232/422/485), Discrete and CAN bus. Additionally, an IRIG B decoder implements a global time stamp relative to the IRIG B pulses. The need for higher density, different protocols, and multi-channel on one integrated test card has made the EXC-4000 series very successful.
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NX Hipot -
Dynalab Test Systems, Inc.
* 50 to 1500VDC Hipot Testing* 50 to 1000VAC (optional) * 5Mohm to 1Gohm Insulation Resistance * Simple 4-button user interface * Tests for continuity and shorts * Tests a variety of components * Precision resistance measurements * Continuous high speed scanning for real time complete status information of harness assembly progress * Keyed security access and control * Built for rough industrial environments * 2 serial ports for connection to printers and scanners * Standalone operation * Uses a high capacity memory card * Available from 64 to 1024 test points * Networkable
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V93000 SoC / Smart Scale -
Advantest Corp.
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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GX5295 -
Marvin Test Solutions, Inc.
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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GX5295 -
Terotest Systems Ltd.
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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6U VME430 6023 -
W-IE-NE-R, Plein & Baus GmbH
The WIENER VME 6023 crate series is the newest generation of 19" integrated packaging system for standard VME/VME64 bus systems with 6Ux160mm cards. Designed primarily for applications in nuclear and high energy physics data acquisition, beam line control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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50-297-044 -
Pickering Interfaces Ltd.
The 50-297 PCI Precision Resistor card provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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50-298-021 -
Pickering Interfaces Ltd.
The 50-298-021 is a high density programmable resistor card with 9 channels which can be set between 2.5Ω and 925Ω with 0.25Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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50-298-054 -
Pickering Interfaces Ltd.
The 50-298-054 is a high density programmable resistor card with 6 channels which can be set between 4Ω and 22.3MΩ with 2Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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67394 -
Chroma ATE Inc.
The 67394 Multi-Channel Power Module is a new generation of compact, stable and high reliability AC to DC power supply that can test the small size panels. It has multiple power sources with voltage/timing adjustable functions, protection functions and measurement circuits. Its modular design can work with FPD tester and PG card to provide standard power source for testing the panels.
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IDPS750 -
Salland Engineering
Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
