Laser Test
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Product
Hi-Pot Testing
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The CableEye HVX System combines our M3U tester with a high voltage module to provide Hi-Pot testing of insulation resistance and dielectric breakdown up to 1500Vdc and 1000Vac.
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Performance Testing
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Performance testing is the best way to give your product a competitive edge. We offer performance testing for virtually any type of products, testing to national, international, or industry standards, as well as retailer, or your own, specifications.
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Electrical Testing
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Innovative Testing Solutions, Inc.
Our specialty is Direct Current automotive components. We perform product validation and design verification testing on both electrical components and systems. Also, we perform warranty investigation testing and failure analysis. We have voltage capabilities to 300 volts and current capabilities to 1000 amperes. Both two-wire and four-wire resistance measurements are supported from NanoOhms to GigaOhms.
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Test Handlers
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Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.
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Oil Testing
BA Series
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The ultra light BA series Breakdown Analyzers by b2hv are superlative in their specification and ideally suited for both laboratory and on-site transformer oil testing.
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Product
Widely Tunable Ultrafast Laser System For Multiphoton Imaging
InSight X3
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Spectra-Physics’ new InSight® X3™ is the third generation of Spectra-Physics’ industry leading InSight platform, specifically designed for advanced multiphoton microscopy applications. Based on patented technology1, InSight X3 features a broad 680 nm to 1300 nm continuous, gap free tuning from a single source, nearly double the tuning range of legacy Ti:Sapphire ultrafast lasers. InSight X3 delivers high average and peak power levels across the tuning range, including critical near infrared wavelengths above 900 nm for deepest penetration in-vivo. With Spectra-Physics’ integrated patented DeepSee™, the industry standard dispersion pre-compensator, the short pulses are optimally delivered through a microscope to the sample for maximum fluorescence and penetration depth. InSight X3 also has exceptional beam pointing stability, beam quality and output power stability, as well as fast wavelength tuning, making it ideal for microscopy.
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Product
Test Probes
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Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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Product
Ultra Narrow Linewidth, CW TI: Sapphire Laser
SolsTiS
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Award-winning SolsTiS is a next generation continuous-wave Ti:Sapphire laser designed to meet the needs of pioneering scientists looking for high performance, ease of use, system flexibility and reliability. This fully automated, compact system features a completely sealed, alignment-free cavity with hands-free operation, an unprecedented tuning range, unrivalled power, and the ultimate narrow linewidth, low noise output. SolsTiS has options of high power output up to 5W, linewidths <50 kHz and amplitude noise of less than 0.05%. SolsTiS is made to order giving you the ability to specify your linewidth, output power and wavelength range. Fully integrated accessories such as beam pick-off and fiber coupling are available.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
High Power Laser Diode Drivers
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Lumina Power state-of the art laser diode drivers are designed for the emerging high power laser diode industry.
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Product
Twist Testing
STT
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The STT Shaft Twist Tester is a system designed for quickly testing of twist structures and/or twist-freed condition on shafts in seconds.
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Product
Avionics Test
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VIAVI Solutions offers a wide range of avionics test solutions supporting engineering, factory, flightline, and return to service test requirements. Working closely with avionic OEM’s and users, we strive to develop a comprehensive and user friendly solution utilizing modern technology to meet the long term needs of the aviation industry.
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Product
Scienlab Battery Test System — Cell Level
SL1002A
Test System
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Product
Chemical Testing
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Accolade Engineering Solutions
To ensure product environmental compliance or to gain better understanding of your materials or processes, chemical testing is often required. AES has state of the art the equipment for chemical analysis. For elemental analysis XRF, SEM/EDS or ICP can be used. For molecular analysis GCMS, HPLC and FTIR may be used. FTIR may also be used for surface analysis of contamination and our microFTIR system is suitable for the smallest samples.
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Product
Test Port Adapter Set, 1.85 Mm To 1.85 Mm
85130H
Test Port Adapter
The Keysight 85130H test port adapter protects the test set port from being directly connected to the device under test. This adapter has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 1.85 mm to 1.85 mm male adapter and a 1.85 mm to 1.85 mm female adapter. The frequency range for these adapters is dc to 67 GHz with a return loss of 23 dB or better.
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Product
Component Test
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Our innovative multi-function Electrical Component Testers have advanced functions such as voltage power control feed to activate components like radiator fan, headlights, horn, actuators, etc. and the sensor simulator can provide simulation of voltage signals, frequencies, square waves & duty signals with varying intensity to test the feasibility of good sensor signals in comparison to bad ones when troubleshooting vehicle electrical faults.
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Microwave Testing
500B
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The Model 500B Picoprobe sets new® standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 500B Picoprobe achieves an insertion loss of less than 4.0 db and a return loss of greater than 15 db over its frequency range (see accompanying data).
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Product
Safety Laser Scanner Type 3
SD3-A1
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Panasonic Industrial Devices Sales Company of America
The Panasonic SD3 Safety Laser Scanner is a cost-effective alternative for guarding danger zones. It can be used flexibly in confined spaces and for areas where the danger zone changes.The SD3 can monitor an area within an angle of up to 190° and divides it into 2 zones: a warning zone within a radius of 15m, and a protection zone within a radius of 4m. The contours of these zones can be configured precisely for any application. Up to eight zone patterns can be set and activated at any given time even during operation.The reference boundary function memorizes the position of stationary objects and establishes a virtual boundary. It also monitors beam alignment after installation and issues an alarm if a beam becomes misaligned.
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Product
Security Testing
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We protect your business from cyber attacksSecure online transactionsPrevent unauthorized accessMinimize the risk of data lossEnhance resistance to DoS attacks
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Product
Test Programming
TestAssistant II
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From a front-end graphical user interface to a back-end relational database, TestAssistant II organizes and maintains everything necessary for testing. Tester interfaces, wires, connectors, adapter cables, and other complex sub-assemblies are graphically represented.
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Product
Adhesion Test Analyzer
PA-917010
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The Adhesion Test Analyzer (ATA) takes all of the guess work and subjectivity out of rating the classification of your adhesion results as defined in the ASTM D3359 standard, and is accomplished with one simple instrument.
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Product
Walking Test
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Wolfgang Warmbier GmbH & Co. KG
A practical, sub-maximal exercise evaluation used to measure a person's functional aerobic capacity, endurance, and cardiorespiratory health.
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Reliability & Enviromental Testing
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NCEE Labs has been providing industry-standard reliability and environmental testing for 20 years. Our experienced testing staff can assist you in determining the type or level of reliability/environmental testing you require for your products!
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Test Head Manipulators
Cobal 250
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The Cobal 250 offers the best-in-class range of motion for universal manipulators with seven degrees of motion. Separate linear movements make it easier for the operator to dock, undock, and redock the test head in seconds. In combination with inTEST EMS docking, the Cobal 250 is compatible with testers for both Wafer Sort and Final Test, minimizing the time and cost when moving a tester between Sort and Final Test.
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Product
HIRF Testing
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High Intensity Radiated Fields (HIRF) testing simulates high RF peak pulsed and average fields typical of radar environments and is integral to the certification of flight essential avionics systems. L3 Cincinnati Electronics (L3 CE) can perform HIRF testing from 400 MHz to 18 GHz (with traditional average field testing from 10 kHz to 40 GHz).
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Product
Verification And Diagnostic Tools
Y1131A
Test Fixture
Provides module-specific tests to troubleshoot relay failures and predict maintenance requirements.
