Surge Test
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High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Test & Development
Taking a new board-level product or system from concept to deliverable requires feature-rich development and testing tools. Elma has a varied selection of system development platforms to help you, from our E-Frame and smaller D-Frame to the L-Frame. Select the right backplane for the architecture you are developing on - CompactPCI, CompactPCI Serial, OpenVPX or SOSA - and either air-cooled or conduction-cooled guides to support the development boards.
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Mobile App Testing
TestFort QA Lab can provide you with mobile application testing services that include testing application software on different mobile devices for its usability, consistency and functionality. Mobile application testing is an integral part of app development process and can valuably decrease your operational costs.
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test measurement unit
ITC59100 Rg/Qg
The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2. In addition the ITC59100 TMU performs an internal gate resistance (Rg) test method that conforms to JEDEC Standard JESD24-11.
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7-Pole Test Switch Protectors
6442 & 6442-C
With safety always being a concern while working with electrical boxes, you can depend on TESCO’s Test Switch Protectors (Catalog No. 6442 & 6442-C) to alleviate any uncertainty. This was developed to provide temporary protection of the test switch and to address the rising concern that the terminals of the test switch are exposed while you’re working in the box. The switch protector can prevent incidental contact with live terminals or contact with tools. TESCO’s Test Switch Protectors are constructed of clear, flexible PVC with a voltage rating of 2500V. The switch protector will fit any brand of test switch, regardless of manufacturer, from 4 to 7-pole. TESCO can also develop custom designs of this product to meet unusual test switch configurations.
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Digital Test Instrumentation
EDigital-Series™
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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High Frequency (RF) Testing
C.C.P. Contact Probes Co., LTD.
CCP designs high frequency testing probes, coaxial probe sockets and pressurized conductive rubber sockets.
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High-Speed Impact Testing Machines
HITS-X Series
With the increasing demand for safety and reliability, evaluation of the dynamic strength (impact properties) of materials and parts is becoming more and more important. This machine can obtain data, such as the maximum test force, energy, and displacement, up to a maximum velocity of 72 km/h (20 m/s). A tensile load type (HITS-TX) and a punching type (HITS-PX) are available.
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Supercapacitor Test
The CT3001A/C battery test systems are upgraded from CT2001A/C with higher precision and data logging rate. The tester can be used to run precision tests for coin cells, pouch cells, prismatic cells, and especially supercapacitors (ultra-capacitors). Each tester has 8 independent channel which can be programmed to run constant current charge/discharge, constant voltage charge, constant power discharge, constant resistant discharge, and direct current internal resistance (DCIR) tests.
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Test Points
TestStation LX2
TestStation LX2 is Teradyne's largest pin count in-circuit test system. Configurable up to 15,360 pins, TestStation LX2 utilizes the new UltraPin II 128HD pin card for testing large, complex, and heavily-integrated printed circuit board assemblies.
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IEC 61850 Testing
HAOMAI Electric Test Equipment Co., Ltd.
IEC 61850 is an international standard defining communication protocols for intelligent electronic devices at electrical substations. It is a part of the International Electrotechnical Commission's (IEC) Technical Committee 57 reference architecture for electric power systems.
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Package Test
WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Test & Measurement
NIF (Dutch Instrument Factory, later Nieaf-Smitt) started in 1900 as one of the first organizations in the world with the design and production of instruments for electrical values. The portfolio of test tools, digital multimeters, current clamps, device testers, installation testers and power analyzers is characterized by quality and reliability.
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Testing & Quality
The solar simulator, electroluminescence and hi-Pot testers are the main machines used to test photovoltaic modules. These machines can be positioned at the end of the production line and along the production chain to keep the quality and efficiency of the photovoltaic modules under control after the most sensitive production phases. Each machine uses the best technologies in order to guarantee the best and most accurate measurements.
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Resistivity Test System
RMS-1000
Accurate and powerful performance. - Possible to get much accurate resistivity value by taking 8 raw data. - Good to check ohmic contact by flowing forward and reverse current.2. We provide various sample mounting board and probe head and tips.3. We have an optional item which can measure in variable temperature. - Room Temperature ~ 300dC.
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FPGA Test System
DO-254/CTS
DO-254/CTS™ is a fully customized hardware and software platform that augments target board testing to increase verification coverage by test and satisfy the verification objectives of DO-254/ED-80. The target design runs at-speed in the target device mounted on the custom daughter board. The simulation testbench is used as test vectors to enable requirements-based testing with 100% FPGA pin-level controllability and visibility necessary to implement normal range and abnormal range tests. The FPGA testing results are captured at-speed and displayed using a simulator waveform viewer for advanced analysis and documentation.
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Reliability And Durability Testing
Underwriters Laboratories Inc.
Our reliability and durability testing services provide an accurate assessment of how your product may perform under expected and unusual use. We can help you meet regulatory requirements, gain actionable knowledge about the anticipated life cycle of your products and identify design flaws that have adverse effects on a product’s reliability and durability.
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Production Line Test System
1740
The fully programmable Model 1740 facilitates high speed, production line testing in both automated and manual applications. Standard tests include AC Hipot, DC Hipot, Resistance, patented Tang-Weld Resistance and Surge. Robust software offers automatic setup of all test parameters, complete result storage, Go/No-Go testing requiring no operator judgment, and online statistics for all tests.
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Vibrator Test System
Sandwich Box Kit
"Gold standard” for vibrator tests provides more information than radio, wireline similarities or internal analysis. Other forms of vibrator QC use the vibrator controller accelerometers to measure vibrator motion. The Sandwich Box system includes external accelerometers which are used to independently record vibrator motion, thus providing a check of the whole vibrator system including the accelerometers.
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Test Hook Probe
CX-17
Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Test Hook Probe is strickly designed according to IEC60065.
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Material Testing Software
MS100
Sinowon Innovation Metrology Manufacture Ltd.
MS100 is professional software for material testing in windows system, it is able to conduct tensile, compression, bending, shearing, bonding strength, peeling, tearing and other tests for rubber, plastic, leather, metal, nylon line, fabric, paper, aviation, packaging, construction, petrifaction, electrician, vehicle and other materials.
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Reach-In Temperature Test Chambers
Tenney Environmental designs and manufactures reach-in temperature test chambers in a range of sizes and configurations. Tenney's line of climatic reach-in test chambers can accommodate a variety of products and testing applications. They are available with temperature only and temperature and humidity capabilities. Tenney also offers several optional features that can be selected to enhance their temperature or temperature and humidity chambers.
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Burn-In Test Sockets
The selection of the test socket is critical to the performance of a device during qualification testing where electrical bias and signals are applied. Key factors such as mechanical compatibility, operating temperature, ability to withstand high moisture levels, signal speed and lead inductance/capacitance all need to be taken into account when selecting the best socket for the test application.
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Cloud Semiconductor Testing Service
CloudTesting™
All-in-one platform for semiconductor test and measurement Extensive test and measurement library Microcontroller, Memory, Analog and more. CloudTesting™ Service is the test and measurement system that you can build your own environment by selecting and combining Testing IPs. Fees for Testing IPs are paid monthly.
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Display Test & Characterization Solutions
The Gamma Scientific line of display measurement solutions leverages the company’s renowned competencies in developing high-sensitivity spectroradiometer-based equipment. Our range of NIST traceable solutions include handheld and portable instruments, laboratory equipment, and fully automated production inspection systems. With over 50 years of experience in the industry, you won’t find another company with the level of combined knowledge and expertise as the team at Gamma Scientific.
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Automatic Upset Testing Machine
YQA Series
Jinan Testing Equipment IE Corporation
This kind of machine is designed according to the International standards EN 10263-1:2001 “Metallic materials upset test methods”, especially for the quality inspection of high-speed rods and wires. Through simulating the quick press conditions of the metallic materials during the upset and pressing, the machine truthfully reflects the instances of the quickly compressed rods and wires. This kind of machine is widely used in the steel industry, standard samples manufacturing industry, and tools manufacturing industry, for the inspection of the metallic materials upset tests. Under the room temperature or the hot conditions, exert test force on the direction of specimen axial line, quickly compress the specimen, and then inspect the metal ability of bearing upset deformation in the specified upset ratio. It also can show the metal surface disfigurements.
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Ethernet Test Fixtures & Software
We have developed a series of custom testing tools as part of our dedication to performing the most comprehensive Ethernet testing in the industry. These tools allow for testing at lower layers than most commercially available tools and are available for use in your own testing labs. In addition, we have an extensive amount of T&M partner test tools which members of our Ethernet testing services also have access to.
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Fatigue Test Machine
JINAN PRCISION TESTING EQUIPMENT CO., LTD
Built to evaluate the strength of raw materials, components or finished products.
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Chip Test Adapter
SOJ EDO/FPM
Our new addition to the RAMCHECK line provides support for common 20 to 42-pin EDO/FPM DRAM SOJ chips of sizes 256Kx16/18, 1Mx16/18, 8Mx8, 16Mx4, 2Mx8, 4Mx4, 16Mx1, 1Mx4, and 4Mx1.
