Test Switches
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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PXI Solid-State Switch Module, 3xSPST, 25 A, 100 V, Hardware Interlock
40-184A-002-HI
The 40-184A-002-HI has 3-off high current SPST switches with hardware interlock in one PXI slot and is part of our range of high power solid state switching solutions.
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CPS-8910 , Switch Device for PCI Express
784307-01
PCI Express, Cabled Switch Device—The CPS‑8910 is designed for large multiple-input, multiple output (MIMO) expansion configurations and system control on the PXI platform or software defined radio devices. The CPS‑8910 provides two PCI Express upstream ports and eight downstream ports for seamless system expansion. You can connect the downstream ports to external devices, such as a Software Defined Radio Reconfigurable Device, to create large multichannel MIMO systems. You also can connect multiple CPS‑8910 switch boxes to a single PXI Express chassis to create massive MIMO systems with a Software Defined Radio Reconfigurable Device. The large data throughput capacity makes the CPS‑8910 an ideal data aggregator for massive MIMO systems. You can use the CPS‑8910 with copper or fiber-optic cables.
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Digital I/O Switch Card - 96 Open Collector Channels in 12 Groups of 8 Bits Each
1260-14/14C
The Astronics 1260-14 Digital I/O Switch Card provides 96 open collector channels in 12 groups of eight bits each. With the open collector version each independent group can utilize a separate internal or external pull-up supply up to 32VDC.Each channel can be configured as an input or an output and individually controlled in the asynchronous mode, or be synchronous with other channels.
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Alternate 1.10 (31.18) - 7.20 (204.00) Switch Probe
TSP100-J100-2
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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PXI Solid State Dual SP4T Switch Module, 50 MHz To 20 GHz
M9161D
The Keysight M9161D PXI Dual SP4T solid state switch module provides an ultra-long cycle life, fast switching speed and high isolation, all within a single slot enclosure.
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Test System for High Volume Production Testing of Integrated Circuits
ETS-364
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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20-Channel SPST Power Switch Card
1260-120
Each channel of the 1260-120 can switch up to 13A, 250VAC or 10A, 125VDC; its switching capability makes it the ideal solution for applications requiring high-current switching of AC power, DC power supplies, and AC or DC current sources.
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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6TL29 Semi-Automated Test Platform
AQ377
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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PXI Dual 8 Channel Switch Simulator
40-485-121
Designed to simulate the operation of automotive switches where dirty contacts or leaking current can be expected from switch contamination. It allows automotive I/O devices to be tested for correct operation under adverse conditions.
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High 1.80 (51.00) - 12.60 (357.00) Switch Probe
TSP138-FK300-3
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 138Test Center (mm): 3.50Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,760Overall Length (mm): 44.70Switch Point (mil): 67Switch Point (mm): 1.70
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PXI Dual SPDT RF Switch, 8GHz 50Ω SMA, Terminated
40-880A-001
The 40-880A-001 is a dual SPDT 50Ω RF switch with 8GHz bandwidth. The 40-880A range of SPDT switches have automatic termination of unused signals and are available as a dual switch in a 1 slot PXI module, a quad switch in a two slot PXI module or hex and octal switches in three slot PXI modules.
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Headlamp Test Platform
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
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Test Platforms
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Switch Modules - 32 Single Pole Relays Arranged as a 16x2 Matrix
JX32/AB-1
This module has 32 single pole relays arranged as a 16x2 matrix as shown in the figure to the left. The matrix may be operated and wired individually for up to 16 16x2's per chassis, or jumpered to the backplane to form up to a 256x2 matrix. It is available with Type S or M reed relays for high speed, long life application.
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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PXI Hex SPDT RF Switch, 8GHz 50Ω SMA, Terminated
40-880A-003
The 40-880A-003 is a hex SPDT 50Ω RF switch with 8GHz bandwidth. The 40-880A range of SPDT switches have automatic termination of unused signals and are available as a dual switch in a 1 slot PXI module, a quad switch in a two slot PXI module or hex and octal switches in three slot PXI modules
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General Purpose Switching System
LX Series
The LX Series matrices are reliable, low cost, and versatile switching systems. A modular design concept is used. Interchangeable control modules, switch modules, and display modules can be assembled into matrices, multiplexers, or individual switch point configurations. All chassis have full front panel LED displays. Status feedback from all switches is provided.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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20 Channel Actuator/GP Switch Module for 34970A/34972A
34903A
The Keysight 34903A is a general-purpose switch module for the 34970A/34972A Data Acquisition/Switch Unit. It has 20 independent single-pole, double-throw (SPDT) relays and is used to cycle power to products under test, control indicator and status lights, and to actuate external power relays and solenoids. Combine it with matrix and multiplexer modules to build custom switch systems. Its 300 V, 1 A contacts can handle up to 50 W, enough for many power line switching applications.
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Modular VXI Switch Card Carrier
1260-101
The 1260-101 Switch Carrier accommodates two plug-in switch cards in a single slot VXI module.
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PXI Flexible Microwave Module, Dual SP4T 40 GHz, Single SPDT 40 GHz, 50 Ω, SMA
40-890-001
The 40-890 (PXI) and 42-890 (PXIe) range of PXI microwave modules allows users to specify the mix of relay types, frequencies and quantities based on the application requirements within the capabilities of the module driver card. Choose from the extensive relay selection already available in the Pickering microwave range to create a flexible solution.
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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PXI/PXIe Microwave Transfer Switch, Dual, 18GHz, 50Ω, SMA
40-782B-522
The 40-782B-522 (PXI) and 42-782B-522 (PXIe) dual transfer switches are part of our range of PXI microwave switching modules. They have a characteristic impedance of 50Ω and a maximum operating frequency of 18GHz. Connections are made via front panel mounted high quality SMA coaxial connectors.
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PXI Solid-State Switch Module, 3xSPST, 25 A, 100 V
40-184A-002
The 40-184A-002 has 3-off high current SPST switches in one PXI slot and is part of our range of high power solid state switching solutions. Each SPST switch uses a fully isolated solid-state relay which has been designed to offer fast operation under hot switching conditions and high inrush current with no operational life degradation.
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PXI Dual 2 Channel (M Mode) SC 50 Cons
40-855-222-M50
The fiber optic switches connect the common to a channelby redirecting the optical signal into a selected output fiber.This is achieved using Micro-Mechanical Mirrors driven bya highly precise mechanism and activated via an electricalcontrol signal.
