Virtual Instruments
Modular measurement hardware whose functional is user defined.
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Product
PXI Instrumentation Modules For Automated Test Systems
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PXI-based test systems often require a variety of general-purpose instrumentation such as digital I/O, waveform generators, voltage & current sources and DUT power supplies.
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Product
Scientech Multi Instruments
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Scientech Technologies Pvt. Ltd.
Variety of Instruments are being used in education, industry and research in the field of analog, digital, instrumentation, control system, biomedical and RF domain, requirement of these instruments varies and depends on their application areas.Some application like electronic, electrical, automation, etc. require standard waveforms, arbitrary waveforms, variable digital pattern and protocol generation. Analog signal combination and multiple digital signals are also required for some applications like power electronics, embedded, DSP and VLSI.
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Product
Shared Memory Network PXI Express Instrument
PXIe-SMN
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Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodes - Network interrupts supported - 3U PXI Express Module - Software Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
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Product
X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
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Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
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Product
Weighing Instruments
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ZhangZhou Weihua Electronic co.,ltd
are devices to measure weight or calculate mass. Spring balances or spring scales measure force (weight) by balancing the weight due to gravity against the force on a spring, whereas a balance or pair of scales using a balance beam compares masses by balancing the weight due to the mass of an object against the weight of a known mass or masses. Either type can be calibrated to read in units of force (weight) such as newtons, or in units of mass such as kilograms, but the balance or pair of scales using a traditional balance beam to compare masses will read correctly for mass even if moved to a place with a different (non-zero) gravitational field strength (but would then not read correctly if calibrated in units of force), while the spring balance would read correctly in force in a different gravitational field strength (but would not read correctly if calibrated in units of mass).
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Product
PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
Digital Pattern
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Product
Digital Instruments and Measuring Transducers
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Digital instrumentation devices are installed to display an electrical or process variable, for rapid monitoring and management, normally in industrial settings. This information can be used to detect any alarm that may be triggered by a control value, informing in real time of any malfunction in an industrial, machinery or control system process. The data is shown numerically, and is proportional to the measured parameter and can be integrated into SCADA systems, as long as they have integrated communications.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Benchtop X-ray diffraction (XRD) instrument
MiniFlex
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New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
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Product
PXI Test Instrumentation
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The Yelo Pixi general purpose tester is a PXI based functional test system with in-circuit and continuity capability. Built into a free standing 19” rack is a PXI chassis, mass interconnect fixture interface, PC, flat screen and space for additional user selectable instrumentation.
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Product
Standards Source Instrumentation
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PXI Arbitrary Waveform and Programmable Function Generators as well as DC source cards and a precision standards module.
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Product
Current Measuring Instruments
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The testo 755 current/voltage testers are fast and easy to use, especially when you are testing many circuits. The convenient open-jaw current tester automatically turns on when voltage exceeds 6V. It then auto-selects the correct parameters and range for your test. These rugged testers are suitable for virtually all your daily electrical measuring tasks.
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Product
Elemental Analysis Instruments
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Chongqing TOP Oil Purifier Co., LTD
Your product description goes here.
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Product
Roundness & Form Measuring Instruments
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Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
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Product
Hipot Instruments
HypotMAX® Series
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Our HypotMAX series is a complete Line of automated Hipot instruments designed to meet the demanding requirements of high voltage applications. We've included our patented SmartGFI feature of maximum operator safety protection as well as a variety of advanced features to increase productivity. Setup and run tests up to 20 kV with confidence from our intuitive user interface or automate with PC.
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Product
Dual Channel Gigabit Ethernet Test & Simulation Instrument for PXI Express
PXIe-DCE
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Avionics Interface Technologies
Supports 10/100/1000 Mbit/s Full Duplex EthernetUtilizes SFPs to support both Copper and Optical interfacesUser controlled Ethernet frame transmissions with high precision timing and scheduling
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Product
Electrical Conductivity Measuring Instrument
SIGMASCOPE® SMP350
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Handheld instrument for electrical conductivity measurement of non-ferromagnetic metals. The electrical conductivity can be used for determining material properties, like hardness, strength, heat damage and material fatigue of metals. Rapid and simple on-the-spot conductivity measurement of non-ferromagnetic metals acc. to DIN EN 2004-1 and ASTM E 1004.
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Product
High Content Screening Instruments
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Get the sensitivity and throughput you need to image more samples and analyze more parameters with high content screening. Our high content screening instruments help you answer the most complex biological questions. With powerful yet simple imaging and analysis capabilities for a wide range of applications -- from basic research to assay development and screening -- these powerful high content screening microscope systems produce the highest possible image quality to take your research further, in less time than ever before, especially when combined with PerkinElmer's robotic systems and advanced data analytics.
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Product
GPIB-ENET/1000, Ethernet GPIB Instrument Control Device - Taiwan 110VAC
781630-11
GPIB Controller
The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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Product
GPIB to Ethernet to Instrument Interface
Model 4865B
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* Adds a GPIB Interface to Instruments with a VXI-11 or Raw Socket Ethernet Interface.* Transparent data transfer handles ASCII and binary data.* Controllable with any IEEE-488.2 GPIB Controller* VXI-11 protocol supports control, abort and reverse channels.* Raw Socket protocol includes substitute command strings for GPIB Device Trigger, Device Clear and Interface Clear.* Auto-Find feature simplifies instrument linkage* Reuses existing test software with new Ethernet instruments.* Easy configuration with the 4865B's internal webserver.* Drop in replacement for the original Model 4865 with 2x to 5x speed increase.* 1 U high rack mount kit mounts one or two 4865Bs.* Includes universal 115/230 VAC Power Adapter.
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Product
Display Unit For The Bluetooth Connecting Instrument
MDU-100X
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MULTI MEASURING INSTRUMENTS Co., Ltd.
・Can be connected to HCL-36UX/HCL-7000X/ALCL-80X (As of Aug 2, 2022)・Data hold function available・The measured value can be displayed remotely and separately from the display of the measuring instrument・Easy to read large display
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Product
Computer-Based Instruments
GT210PCI
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with the GT210PCI you can determine any frequency to 0.01 part per million (eight digits) in just 1 mS, and resolve each time measurement to 8pS. Couple that with 2300 measurements per second, one of the fastest rates available and you can acquire more data in a single second than a typical GPIB counter can in one minute! Faster measurements and higher resolution, along with built-in statistics functions give you a more thorough analysis of your signal. Standard deviation, peak to peak jitter, or a graph of the measurements are available at the push of a button.
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Product
Avionics Interfaces & Test Instruments
ARINC 664
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Avionics Interface Technologies
AIT’s ARINC 664 test instruments can be used in test and simulation applications that are required to transmit and receive data over the ARINC 664 avionics databus. AIT’s instruments use small form-factor pluggable transceivers (SFP) and support copper or fiber optic physical network interfaces.Using an FPGA based architecture, with multiple embedded processors, the ARINC 664 instruments provide onboard support for upper layer protocol processing (A653, UDP, IP) and utilize DMA to provide optimal data throughput. All ARINC 664 protocol operations, including VL traffic shaping, redundancy management, and IP fragmentation and reassembly, are handled onboard.
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Product
PXIe-6545, 200 MHz, 32-Channel PXI Digital Waveform Instrument
780993-02
Digital Waveform
200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6545 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6545 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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Product
Measuring Instruments
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PENKO offers a variety of customized solutions for the processing industries including a range of advanced measuring instruments. These devices which include, amplifiers, indicators, controllers and PLC, accurately and precisely measure weight, quantity and value for your production needs. Our measuring instruments are specifically designed to fit your project’s requirements precisely and reliably with options of both fixed as well as custom-made software solutions available.
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Product
System Instruments
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bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Product
Testing Instruments
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NDT testing instruments, other testing instruments, paper testing instruments, plastic testing instruments, rubber testing instruments, soil testing instruments
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Product
VXI Analog Instruments
Ai-762
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Ai-762—the newest member of the Ai-760 Series in the Core Systems Instruments (CSi) family—is a standards-based integrated test and measurement tool that consolidates traditional instruments into a single-slot VXI package.
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Product
RF Instrumentation
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Our electronic products are custom-designed for fast and accurate data acquisition so you can make the most out of your range time. Optimized with the rest of our product line, you get a best-in-class measurement system backed by our longstanding reputation of high quality and unsurpassed performance. Our electronic products are also compatible with prior generation NSI-MI Technologies' instrumentation and also with many third party instruments.





























