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Showing results: 391 - 405 of 450 items found.

  • Multi-Angle Light Scattering Detector

    PN3621 - Postnova Analytics GmbH

    Since the 1990s Postnova has been a leading innovator and developer of special advanced online Light Scattering solutions for coupling with chromatographic separation systems. The first model was the PD2000 - Static Light Scattering detector for coupling with Asymmetric Flow FFF. Later on the models PN3020 SLS and PN3070 MALS have been launched. Based on these over two decades of practical experience, Postnova has collected a unique competence in the area of Laser Light Scattering and has developed the unique PN3621 MALS - Multi-Angle Light Scattering detector series. The model PN3621 MALS is a completely new type of high performance MALS detector system with a unique range of specifications.

  • Barcode Verification Systems

    REA ScanCheck 3 - REA Elektronik GmbH

    The REA ScanCheck 3 is an universal, battery-operated, high-performance barcode verification device which operates in accordance with current standards. The verifications document compliance with quality goals in production and monitoring of barcodes on data storage devices and products of all kinds. The measurement principle is based on a laser scanner optimized for verifications. This makes contact-free measurement, largely independent of handling influences, possible. For mobile use on site, the device operates self-sufficiently, independent of the power network with standard, rechargeable batteries. The operating system and application software support multiple languages.

  • Fiber Visualizer

    Norland Products, Inc.

    The Norland Fiber Visualizer is a unique instrument which simplifies installation and testing of fiber optic networks. This compact unit uses a 0.5 mW helium neon laser, with an ultra-precision optical adapter, to focus high intensity visible light into the core of a fiber optic connector. As the light travels down the fiber, a visible red glow is emitted anywhere discontinuity occurs. The Visualizer imitates on the visible level, what normally occurs in the invisible infrared spectrum,thereby allowing the end user to actually see any problems in the system.

  • PDS Imagescan Software

    Teledyne Marine PDS

    ​Teledyne PDS software is one of the most versatile software packages available in the dredge / construction market. Its scalability allows the user great flexibility in which way the software is used.PDS is used for example on wirecrane and excavator operations to monitor the activities, it can be expanded with other tools to support special applications. One example is the add-on of a laser scanning system to enhance the bucket position on a wirecrane or adding a TDY BlueView BV5000 unit on a crane to measure in real-time the area you dredge or place objects into. This is the so-called PDS MotionScan option.

  • confocal Raman spectrometer

    ZOLIX

    confocal Raman System provided by RTS-Mini is a non-destructive technique with minimum sample preparation required. The sample are extensive materials such as polymer, ceramic and nanomaterials as 2D materials: graphene or monolayer of MoS2 etc. Some biological samples like blood, tissue and cell are suitable for Raman measurement by certain laser excitation wavelength; Raman is an ideal technique for research and industry offering high quality data, reliability, versatility over other analytical techniques. Benefits not only include the range of samples that are suitable for analysis, but also the information content that is provided

  • 1310/1550 nm Dual Laser Source Back Reflectiom/Power Meter

    GM8019 + GM83001E - UC Instruments, Corp.

    The UC INSTRUMENTS GM8019 + GM83001E 1310/1550 nm dual laser source back reflection meter and power meter is a compact, direct display instrument for the convinent measurement of backreflection, insertion loss and power connector, fiber optic components, and system. With a single output port, the meter is very easy to use and ideal for fiber cable jumper manufacturers.

  • Confocal FLIM System

    DCS-120 - Becker & Hickl GmbH

    *FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Two Fully Confocal Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage

  • Multiphoton FLIM System

    DCS-120 MP - Becker & Hickl GmbH

    *Multiphoton FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*Excitation by Ti:Sa Laser*Two Non-Descanned Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage*Laser Control via SPCM Software

  • Automated Optical Inspection

    AOI - ficonTEC Service GmbH

    No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.

  • Pressure Transmitter

    PS2 - Chuan Sheng Electronics Co., Ltd.

    - Digital temperature compensation and nonlinear correction- High sensitivity, high precision, high stability- Full temperature compensation, good electrical performance and long-term stability- The plug and shell are integrally spin-stable, stable and waterproof, to avoid loosening the thread of ordinary plug- A variety of signal outputs, convert the pressure of the measured medium into 4~20mA,0~10VDC analog signals, RS485 digital signals- With RS485 communication interface, the monitoring system can easily read the measured value- The shell adopts laser welding, high reliability, long life, long-term stability and reliability

  • Optical Modules

    VI Systems GmbH

    VI Systems GmbH introduces the fiber coupled 850nm vertical cavity surface emitting laser (VCSEL) transmitter module VM64-850M for data rates of up to 80 Gbit/s. The transmitter module features a V-connector for the electrical input signal and for the optical output a 50/125 multi mode fiber which is terminated with a standard FC/PC connector. The left picture below shows the module. The picture on the right shows an optical eye diagram at 32 Gbaud (64 Gbit/s) in a back-to-back test configuration as tested by partners at the Heinrich Hertz Institute in Berlin.

  • Particle Size Analyzers

    Anton Paar GmbH

    Particle systems can be complex, but measuring them doesn’t have to be! Anton Paar offers two different technologies to characterize particles from the nanometer to the millimeter range. The Litesizer series employs light-scattering technology to determine not only particle size, but also zeta potential, transmittance, molecular mass, and the refractive index of nano- and microparticles in liquid dispersions. The PSA series uses laser diffraction technology to measure the size of particles in both liquid dispersions and dry powders in the micro and millimeter range. Side by side they open up a wide range of possibilities for comprehensive particle characterization.

  • Industrial Vibration Sensor

    IVS-500 - Polytec GmbH

    The new IVS-500 Industrial Vibration Sensor is the key to fast acoustic quality inspection, structure-borne noise analysis and reliable pass-fail decisions. This Laser sensor measures reliably, in demanding industrial environments, without contact and therefore without wear and on virtually all surfaces. Costs and yields are therefore optimized by reducing false rejects in the production and assembly process. The simple setup and ruggedized sensor design of the IVS-500 enable a smooth integration into production test systems. Complemented with the software tool QuickCheck, Polytec offers a comprehensive solution for reliable pass/fail analysis.

  • FLIM Upgrades for Nikon

    A1 / C1 / C2 - Becker & Hickl GmbH

    *bh FLIM Embedded in Nikon NIS-Elements Software*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Excitation by bh ps Diode Lasers*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Excellent Timing Stability*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Detection Wavelength Range from 360 nm to 700 nm

  • Ultrafast Transient Absorption Spectrometer

    Harpia-TA - Light Conversion Ltd.

    The transient absorption spectrometer HARPIA offers a sleek and compact design together with intuitive user experience and easy day-to-day maintenance meeting the needs of today's scientific world. Adhering to the standards raised by the OPRHEUS line of devices, the entire spectroscopic system is contained in a single monolithic aluminum casing that inherently ensures excellent optical stability and minimal optical path for the interacting beams. HARPIA can be easily integrated with both PHAROS / ORPHEUS and Ti:Sa / TOPAS laser systems. HARPIA features market leading characteristics such as 10-5 resolvable signals along with other unique properties such as the ability to work at high repetition rates (up to 1 MHz) when used with PHAROS / ORPHEUS system. High repetition rate allows measuring transient absorption dynamics while exciting the samples with extremely low pulse energies up to several nanojoules.

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