Spectroscopy
The use of the absorption, emission, or scattering of electromagnetic radiation by atoms or molecules (or atomic or molecular ions) to qualitatively or quantitatively study the atoms or molecules, or to study physical processes. Virginia Tech
See Also: Dissolved Gas, Terahertz
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Analysis System
Neptune (EDS-WDS)
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By integrating Energy Dispersive Spectroscopy (EDS) and Wavelength Dispersive Spectrometry (WDS) analytical techniques on a single platform, Neptune provides the power and flexibility of EDS with the resolution, precision, and detection limits of WDS. Together the two techniques extend X-ray microanalysis capabilities and provide solutions to the most challenging analysis problems. Each technique can be used independently or the data can be integrated to provide results which were previously unachievable.
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Infrared, Near Infrared & Raman Spectroscopy
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Our selection of near, mid and far infrared and Raman spectrometers is unrivalled across the industry. Our portfolio includes compact, portable routine as well as powerful research spectrometers. Our solutions cover the entire spectral range from near infrared, mid infrared, far infrared to THz applications.
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Analytical Services
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IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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Broadband Dielectric Spectroscopy
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Material Sensing & Instrumentation
Broadband Dielectric Spectroscopy is a powerful tool for investigating a variety of dielectric processes for both electrical and non-electrical applications. Also called Impedance Spectroscopy, the measurement separates molecular process on the basis of response time, providing a unique relaxation frequency along with a signature variation with frequency.
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Product
Molecular Spectroscopy Software
Spectra Manager™ Suite
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A unique and powerful, cross-platform suite of software tools for controlling a truly comprehensive range of molecular spectroscopy instrumentation. Design experimental methods, acquire data and get results quickly.
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Product
Tunable Detectors
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Due to their spectral properties and robustness, pyroelectric detectors have proven themselves for many years in numerous applications in gas analysis, flame detection and spectroscopy. They enable the tuning of the optical filter over a defined spectral range by simply adjusting the control voltage. Instead of mounting filters to inspect specific areas of interest as is conventionally common, the detector with tunable Fabry-Pérot filters (FPF) can be used to monitor a broad spectral region continuously.
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Product
Blazed Holographic Plane Gratings
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.A blazed holographic plane grating is the choice for high resolution spectroscopy and applications where high efficiency, low stray light levels are of high importance.
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Product
Spectrometer
Model 207
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The Model 207 offers the user the most throughput and fastest aperture in a long focal length monochromator. This is ideal for photoluminescence and Raman spectroscopy applications. It is also available in a vacuum compatible version. Used in air and with a selection of gratings, the spectral range of the 207 extends from 185 nanometersm to 20 microns or more. Under vacuum range is extended down to 105 nm (depends on the grating.) Multiple ports are available for mounting accessories or CCD detectors, etc. McPherson SNAP IN gratings allow the alignment-free use of many different gratings. Easily view a wider spectral range or obtain higher resolution! You can retrofit years later and not have to worry about alignment with the McPherson SNAP IN approach. Our dual grating turret also accepts these easy to exchange gratings.
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Product
LIBS Analyzer
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LIBS is a type of optical emission spectroscopy used to measure elemental concentrations in a material.
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Product
Streak Camera
OptoScope SC-10 systems
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SC-10 systems are based on the SC-10 main unit and cover a very large range of applications thanks to their flexibility. With a time resolution of 2 ps, a very high temporal resolution streak system is available. The main unit itself uses a fused silica input window, maintaining sensitivity well into the UV range. Deflection units for triggered and synchroscan operation are available. The configuration with a second deflection unit for extension with an orthogonal time axis is also possible. SC-10 systems are well suited for applications in the field of time-resolved spectroscopy and offer a wide range of options for optical coupling.
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Product
Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Product
CellTest Multichannel Potentiostat
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Simultaneous Electrochemical Impedance Spectroscopy (EIS) tests can be run on multiple cells by connecting Solartron 1455A/1451A series frequency response analyzer (FRA) modules to the 1470E. These FRAs can operate in single sine correlation or multi-sine / Fast Fourier Transform (FFT) analysis mode, providing the ultimate in speed, precision and accuracy. The 1455A FRA provides high performance impedance measurements over the frequency range 10 μHz to 1 MHz, while the 1451A FRA operates from 10 μHz to 100 kHz.
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Product
X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
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Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Product
Online DGA
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HAOMAI Electric Test Equipment Co., Ltd.
Innovatively combined semiconductor laser technology and photo-acoustic spectroscopy for Online DGA.
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Product
To Comply To ER/ES Regulations
Spectrophotometer Workstation Series
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Shimadzu's spectroscopy workstation series complies with ER/ES regulations (such as FDA 21 CFR Part11), enabling safe, reliable management of data.-As a part of the LabSolutions family of control software, advanced security and user administration features are provided.-Complies with ER/ES regulations including FDA 21 CFR Part 11 and PIC/S GMP.-Centralized management of spectroscopy data (UV, FTIR, RF and EDX), as well as LC and GC data, on a networked server allows simple control over security and backups.-Terminal Services can be used to control the Spectrophotometer application from a remote location, even when the application is not installed on the client PC.
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Product
Multichannel Analyser
K102
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The K102 is a miniature USB-based multichannel analyser for gamma spectroscopy applications. It is perfect for colleges, universities and research work, and includes gamma spectroscopy software.
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Energy Dispersive X-ray Fluorescence Spectroscopy
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Energy Dispersive X-ray Fluorescence Spectroscopy
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Product
Raman Spectroscopy
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We provide complete Raman spectroscopy solutions for analytical measurements, research Raman, UV Raman, QC/QA and industrial Raman applications. These include Raman microscopes, hybrid Raman systems (such as Raman-AFM), modular Raman systems, transmission Raman analysers, dedicated in situ process Raman spectrometers, and miniaturised Raman instruments for high volume OEM manufacture.
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Product
Stationary Metal Analyzers
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SPECTRO Analytical Instruments GmbH
To meet the divergent needs of industry, SPECTRO offers two families of optical emission spectroscopy metal analyzers with arc and spark excitation (arc spark OES). Optical emission spectroscopy using arc and spark excitation (Arc Spark OES) is the preferred method for trace metal analysis to determine the chemical composition of metallic samples. This process is widely used in the metal making industries, including primary producers, foundries, die casters and manufacturing.
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Product
Microscope Spectrophotometer
508 PV
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The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
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FTIR Spectrometers
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FTIR spectroscopy is used to quickly and definitively identify compounds such as compounded plastics, blends, fillers, paints, rubbers, coatings, resins, and adhesives. It can be applied across all phases of the product lifecycle including design, manufacture, and failure analysis.
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Product
THz Pulsed Imaging and Spectroscopy
TeraPulse 4000
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TeraView’s proprietary semiconductor technology gives the TeraPulse 4000 a market leading signal-to-noise specification with over 90 dB at peak. As standard, the TeraPulse offers a bandwidth of 60 GHz up to typically 4.5 THz; with an option to extend this beyond 6 THz.
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Product
Spatial Heterodyne Surface Chemical Agent Detector
SHSCAD
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Wide area, high areal coverage rate surface contaminant detection via LWIR reflectance spectroscopy employing eye safe broadband quantum cascade lasers (QCLs) and a high-speed spatial heterodyne spectrometer (SHS) in a handheld sensor package (~ 10,000 cm3, 10 lb).
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NIR Systems
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NIR spectroscopy is a proven analytical method guaranteeing reliable and efficient process monitoring and control in a wide range of process applications.
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Product
Small, Uncooled InGaAs line-scan camera with rectangular pixels
Lynx R Series
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The Lynx R series, based on an in-house developed linear InGaAs detector, is a high-performance short-wave infrared (SWIR) camera providing high speed and quality line-scan imaging.The Lynx R cameras are able to image line rates up to 40 kHz, for demanding spectroscopy applications.The camera comes with an industry standard CameraLink or GigE Vision interface.Benefits & Features• High speed line-scan imaging up to 40 kHz (10 kHz for the 2048)• High resolution 1024/2048 Rectangular pixels option (12.5μm x 250μm)• CameraLink or GigE Vision interfacing
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Product
IndiRAM CTR With Quantum Characterizer
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The IndiRAM CTR Raman/PL system with Quantum Emitter Microscope is a multi-purpose system capable of performing Quantum Emitter Characterization, Raman, Photoluminescence as well as Optical Emission Spectroscopy. The system consists of a Pulse Laser along with a single photon counting module (SPCM), a Pulse Synchronization unit, Motorized Scanning stage and a research grade microscope (Upright or Inverted) for TCSPC measurements. Along with these, it also contains a High throughput Spectrometer with a TE Cooled CCD and an optics box assembly to perform Raman/PL and OES Spectroscopy and Microscopy. obtained after the multiple set of experiments gives the lifetime function.
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Product
Optical Delay Generator
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The FR-203 provides periodic linear optical delay (~200ps) for ultrashort laser pulses. It is useful for applications such as time resolved spectroscopy and time domain terahertz spectroscopy. A well defined optical delay is generated with interferometric precision.
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Product
Impedance Spectroscopy
NuVant EZware-EIS Software Package
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The NuVant EZware-EIS software package activates Electrochemical Impedance Spectroscopy on the EZstat-Pro, Powerstat-05 and -20 potentiostat/galvanostats. EZware-EIS exports the impedance data to a file format to accommodate free third party EIS analysis software. EZware-EIS is a user-friendly interface that allows selection of the proper scanning parameters, collect the impedance spectra, display data in Nyquist and/or Bode plots and export data in the proper data format for use in EIS analysis software.
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Product
X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
