Spectroscopy
The use of the absorption, emission, or scattering of electromagnetic radiation by atoms or molecules (or atomic or molecular ions) to qualitatively or quantitatively study the atoms or molecules, or to study physical processes. Virginia Tech
See Also: Dissolved Gas, Terahertz
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Electron Spectrometers
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SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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Advanced Stand-Alone AFM
SmartSPM
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The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
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Custom/OEM
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From simple modifications of existing designs to completely custom projects, Mad City Labs’ engineering team has the capability to quickly provide unique piezo nanopositioning systems for specialized requirements. In-house research scientists with extensive experience in UHV instrumentation, optical spectroscopy, and nanotechnology can provide the real-world advice and assistance to move a project from concept to reality. Generally, this work is done without NRE charges and without any requirements for multiple unit orders. Whether you needa special physical configuration, expanded or reduced range of motion, compatibility with environmental conditions, or special materials, a short discussion with our technical sales staff and engineers will quickly reveal the feasibility of a custom solution.
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Optical Tweezers
PicoTweezers
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Single or dual beam optical tweezers system based on an inverted microscope • 3D real-time video-based force measurements with sub-pN resolution • Huge free space above optical trap for all kinds of sample chambers and carriers • Manipulate and navigate trapped objects with nanometer precision • Easily extendable to fluorescence, STED, Raman spectroscopy, TIRF, or CLS.
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Level AFM
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Is a flexible Atomic Force Microscope for scientists. It offers a wide range of modes, sophisticated spectroscopy options and the programming of user defined experiments. Besides standard options found in Anfatec's other AFMs, the level AFM allows to add Anfatec's full range of AFM options, such as KPFM, closed loop operation, automated sample motion, acoustic enclosure, humidity and temperature control ... Each instrument is adapted to the user's specific needs.
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Spectrometer Modules
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ZEISS Spectroscopy offers high-quality, robust, customer-driven spectrometer modules. Various optical design and detector options allow for OEM solutions tailored to your exact needs.
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Produce Quality Meter
F-750
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The F-750 Handheld Brix & Dry Matter Meter uses near-infrared (NIR) spectroscopy to estimate quality metrics such as dry matter, Total Soluble Solids (TSS or brix), titratable acidity, and color. Working like a high-powered flashlight, the F-750 sends particles of light into a commodity, then measures the NIR light interactance with molecular components inside of the commodity to quantify user-selected traits. The F-750 has a wide range of applications, from determining optimal harvest timing by assessing fruit maturity, to providing an objective analysis of produce quality of fruit in packing houses and upon import. The F-750 is a handheld, fully integrated system, allowing users to operate it out in the orchard or inside the QA lab. Its simple, intuitive user interface makes it easy for anyone to use, while its model building software makes it customizable and versatile.
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Scanning Auger Nanoprobe
PHI 710
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The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
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Chemical Weapons Identification Systems
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Portable Isotopic Neutron Spectroscopy (PINS) Systems have been deployed world-wide; increasingly, being deployed as part of national counter-terrorist efforts. PINS provides a non-contact and non-destructive means of identifying the CHEMICAL contents of "suspect" packages.
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DPSS Lasers
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Quantum Composers laser division features three series series of diode pumped, solid state, Nd:YAG lasers. The Jewel, MicroJewel and the MIR Mid-Infrared DPSS Lasers range in energy output from 1mJ to 15mJ . These compact and rugged lasers are commonly used for LIDAR, PIV, LIF, OPO, TFT-LCD repair, ablation and spectroscopy applications.
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Ultra-High Vacuum Ф4 Scanning Kelvin Probe
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The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin Probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless-steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tuneable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
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CellTest Multichannel Potentiostat
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Simultaneous Electrochemical Impedance Spectroscopy (EIS) tests can be run on multiple cells by connecting Solartron 1455A/1451A series frequency response analyzer (FRA) modules to the 1470E. These FRAs can operate in single sine correlation or multi-sine / Fast Fourier Transform (FFT) analysis mode, providing the ultimate in speed, precision and accuracy. The 1455A FRA provides high performance impedance measurements over the frequency range 10 μHz to 1 MHz, while the 1451A FRA operates from 10 μHz to 100 kHz.
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Secondary Ion Mass Spectrometry (SIMS Analysis)
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Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Scanning XPS Microprobe
PHI VersaProbe III
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The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
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Deep-Level Transient Spectroscopy System
FT 1030
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The Deep-Level Transient Spectroscopy has grown up to a most powerful tool for semiconductor characterization with unbeaten sensitivity in trap concentration detection and high efficiancy in impurity parameter determination.
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Transimpedance Amplifiers
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Artifex Engineering GmbH & Co. KG
Applications include photodetection with PMTs and photodiodes, spectroscopy, Scanning Tunneling Microscopy, ionization detectors, pyro and piezoelectric detectors.
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Versatile Hyperspectral Cathodoluminescence
H-CLUE
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The H-CLUE direct coupled solution offers the ultimate performance for Cathodoluminescence Imaging and Spectroscopy analysis.Embedding field-proven optical components of HORIBA Scientific, H-CLUE overcomes its competition in terms of sensitivity over wide spectral ranges from FUV to extended NIR.
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Benchtop Analyzer
LabSpec 4 Bench
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Analytical Spectral Devices, Inc.
Configured specifically for fixed-location analysis with AC power, the LabSpec 4 Bench benchtop analyzer provides all the performance of ASD's LabSpec laboratory spectrometer line in a space-saving and cost-efficient design. The benchtop analyzer features sophisticated near infrared (NIR) spectroscopy at a 10 nm resolution for accurate measurement of a wide variety of materials in real time. Like the portable models, an enhanced spectrometer configuration more than doubles the signal-to-noise performance in the SWIR regions.
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Spectroscopy Card
microDXP
Instrument Card
The microDXP is a complete, low power compact digital spectroscopy card design for a wide range of handheld, benchtop and other embedded applications, lowering cost and speeding time-to-market.
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Amplifiers
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The amplifier is one of the most important components in a pulse processing system for applications in counting, timing, or pulse amplitude (energy) spectroscopy, providing the pulse-shaping controls needed to optimize the performance of the analog electronics.
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Microwave Plasma Atomic Emission Spectroscopy / MP-AES Systems
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Agilent’s industry-leading microwave plasma-atomic emission spectrometer (MP-AES) systems are powerful, cost-efficient and easy-to-use for a wide range of applications from routine analysis to complex precious metals analysis. By running on air, Agilent MP-AES systems both cost less and are safer than alternative methods that rely on flammable gases. The innovative Agilent 4210 MP-AES system offers higher sensitivity and faster throughput capabilities than flame atomic absorption.
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Photoluminescence Spectrometer
FLS1000
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The FLS1000 sets the standard in both steady state and time-resolved photoluminescence spectroscopy for both fundamental research and routine laboratory applications. The system is a modular fluorescence and phosphorescence spectrometer for measuring spectra from the ultraviolet to the mid-infrared spectral range (up to 5,500 nm), and lifetimes spanning from picoseconds to seconds. All of this can be achieved through various upgrade routes, either at the time of order or in the future. Whether you are studying photophysics, photochemistry, biophysics, biochemistry, material or life sciences, the FLS1000 will enable you to reliably and accurately measure luminescence spectra and kinetics using state-of-the-art sources, detectors, acquisition techniques, quality optics and precision mechanics. The large sample chamber will house practically any type of sample accessory.
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Grating Spectrometers
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We offer a range of OEM instruments from miniature fiber spectrometers to research-grade grating spectrometer systems with TE or LN2-cooled CCD and InGaAs detectors.HORIBA Scientific provides miniature CCD and PDA USB spectrometers as well as 70 to 1250 mm focal length imaging spectrometers with single and multichannel detectors.If you are not a future OEM and are looking for larger, research-grade spectroscopy systems (focal lengths of 1/4 meter spectrometers and longer), please visit our Custom Spectroscopy Division
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Optical Delay Generator
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The FR-203 provides periodic linear optical delay (~200ps) for ultrashort laser pulses. It is useful for applications such as time resolved spectroscopy and time domain terahertz spectroscopy. A well defined optical delay is generated with interferometric precision.
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Stationary Metal Analyzers
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SPECTRO Analytical Instruments GmbH
To meet the divergent needs of industry, SPECTRO offers two families of optical emission spectroscopy metal analyzers with arc and spark excitation (arc spark OES). Optical emission spectroscopy using arc and spark excitation (Arc Spark OES) is the preferred method for trace metal analysis to determine the chemical composition of metallic samples. This process is widely used in the metal making industries, including primary producers, foundries, die casters and manufacturing.
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Diode Laser Spectroscopy
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Diode Laser Spectroscopy by Mesa Photonics: Herriott Cell and OEM laser diode controller boards.
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Blazed Holographic Plane Gratings
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.A blazed holographic plane grating is the choice for high resolution spectroscopy and applications where high efficiency, low stray light levels are of high importance.
