Spectroscopy
The use of the absorption, emission, or scattering of electromagnetic radiation by atoms or molecules (or atomic or molecular ions) to qualitatively or quantitatively study the atoms or molecules, or to study physical processes. Virginia Tech
See Also: Dissolved Gas, Terahertz
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Silicon Charged Particle Radiation Detectors
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ORTEC introduced the first silicon surface barrier detectors for charged particle spectroscopy in the early 1960’s. Since then, ORTEC has expanded the product line with more than ten different options to choose from.
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Photoemission And Surface Photovoltage Spectroscopy
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KP Technology have developed a range of modules that feature surface photovoltage and photoemission spectroscopy capabilities.
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Spectroscopy
NIRS Analyzer PRO
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The NIRS Analyzer PRO is a system for the nondestructive, direct analysis of granules, powders, liquids, slurries, or opalescent substances.
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Precisive® 5 Application Specific Gas Analyzers
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The Precisive® Gas Analyzer is a real-time gas analyzer based on MKS' unique Tunable Filter Spectroscopy (TFS™) platform. The Precisive suite of products are calibrated for the measurement of a wide range of gases across multiple process industries. The real-time, continuous measurement capability provides immediate analysis ensuring control of critical process parameters.
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Transimpedance Amplifiers
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Artifex Engineering GmbH & Co. KG
Applications include photodetection with PMTs and photodiodes, spectroscopy, Scanning Tunneling Microscopy, ionization detectors, pyro and piezoelectric detectors.
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Saturable Spectroscopy Laser Lock Module
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A compact, mechanically-robust laser frequency reference.
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Advanced Spectroscopy System
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Nuclear Physics is the field of physics that studies atomic nuclei and their constituents and interactions. We offer Geiger-Mueller tube systems for investigating the statistics of radioactive decay, as well as scintillator based systems for gamma spectroscopy.
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Modular Spectroscopy Equipment
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Sciencetech offers a large line of spectroscopy equipment, for an overview of Sciencetech''s modular spectroscopy equipment see the chart at the bottom of page
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Custom/OEM
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From simple modifications of existing designs to completely custom projects, Mad City Labs’ engineering team has the capability to quickly provide unique piezo nanopositioning systems for specialized requirements. In-house research scientists with extensive experience in UHV instrumentation, optical spectroscopy, and nanotechnology can provide the real-world advice and assistance to move a project from concept to reality. Generally, this work is done without NRE charges and without any requirements for multiple unit orders. Whether you needa special physical configuration, expanded or reduced range of motion, compatibility with environmental conditions, or special materials, a short discussion with our technical sales staff and engineers will quickly reveal the feasibility of a custom solution.
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Scanning XPS Microprobe
PHI VersaProbe III
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The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
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Spectroscopy Applications
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Anadis Instruments Benelux b.v.
Spectroscopy has become a powerful tool leading to a broad range of applications, as can be seen in the map below. From the lesser known FT-IR analysis of lipid structures in skin (of interest when applying medicines to the skin as well as in studying the effects of skin aging) to the widely used measurement of additives and the octane number (RON, MON) in fuels. Using spectroscopic techniques has many advantages. The technique is non-destructive; almost any sample can be studied in virtually any state. The techniques are applicable off-line, in-line, at-line or on-line. Identification als well as quantification is possible. Check the map with applications, it will be regularly updated and expanded.
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Energy Dispersive X-ray Spectroscopy
EDS
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Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
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MultiBeam System
FIB
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An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Enable Non-Invasive Analysis
Sparklike Handheld™
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Sparklike Handheld™ is practical and quick method to test IG gas concentration. Technology is based on plasma emission spectroscopy. A high voltage spark is launched in the IG unit's cavity causing a light emission which is observed and analyzed further.
