PCI Express Test
See Also: PCI Express, PCI Express Analyzers, PCIe
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Product
PCI Express PLL Test Application
N1081PLCA
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Keysight N1081PLCA PCI Express PLL Test Application designed to measure transmitter PLL bandwidth and peaking based on the PCI Express 5.0 TX PLL Specifications. Use N1081PLCA PCIe PLL test software to test, debug and characterize your PCIe designs.
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Product
PCI Express® Electrical Performance Validation and Compliance Software
D9040PCIC
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D9040PCIC PCI Express Transmitter Test Compliance Software for PCI Express 4.0 (PCIe 3.x, 2.x and 1.x also supported).
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Product
PCIe 3.0 and 4.0 Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 3.0 and PCIe 4.0 specification. This solution combines a Summit Z416 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 3.0 and PCI Express 4.0 Link and Transaction Layer Compliance Testing.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
PCI Express® 2.0 Protocol Test
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The E2960B family is one of the best tools in the industry for PCI Express® 2.0 testing and debug. That’s not just from us, in fact the E2960B series wins the 2007 Best in Test Award – Honorable Mention.
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Product
PCI Express Gen 1 Test Backplane
SKU-015-01
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The PCI Express Test Backplane was designed to support production testing/debugging of PCIe-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into one x4 and three x1 PCI Express slots via 7 ft CAT6 cable.
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Product
PCI Express Full Tx Test Suite
SW02PCIE
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The PCI Express Full Tx Test Suite is part of the subscription based Oscilloscope Compliance Test Software Suites. In addition to Tx Validation licenses for PCIExpress, this suite also provides the support of the Advanced PCIe Protocol Decode/Trigger Software. This suite supports coverage across the PCI Express technology starting from Gen4. Together with the subscription model, this enables the support and coverage continuity as the PCI Express technology progresses through generations.
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Product
PCI Express, PCI, Multi-Interface Test Backplanes
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Amfeltec PCI Express, PCI, Multi-Interface Test Backplanes
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
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PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
PCIe Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
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Product
ARINC429 PCI Express Mini Card
AMEE429-x
PCI Express Mini Card
The AMEE429-x is AIM’s new PCI Express Mini Card module targeted for embedded ARINC429 applications in an ultra-compact form factor.
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Product
Embedded MIL-STD-1553 PCI Express Mini Card
AMEE1553-x
PCI Express Mini Card
The AMEE1553-x is AIM’s new PCI Express Mini Card module targeted for embedded MIL-STD-1553B applications in an ultra-compact form factor.
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Product
MXI-Express Cable with Communication Levels up to Gen 3 x8
778959-10
MXI Express
MXI-Express Cable, Gen 1 x1, Fiber Optic, 10m
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Product
Value DSP-Based 4-Axis Motion Control Universal PCI Card
PCI-1245V
PCI Card
Encoder input is 10 MHz for 4xAB mode, 2.5 MHz for CW/CCW modePulse output up to 5 MppsSupports linear and circular interpolationHardware emergency inputSupports E-GearSupports programmable acceleration/deceleration rateMemory buffer (10K points) for trajectory planning which is designed in DSP(Auto-blending is not supported)Position compares triggering up to 100 KHz, and memory buffer is up to 100 K points in DSPPosition latchProgrammable interrupt and watchdog timerRDY/LTC-dedicated input channels & SVON/CMP/CAM-DO/ERC-dedicatedoutput channels are switchable for general input and output purposes
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Product
MXI-Express Cable With Communication Levels Up To Gen 3 X8
788302-100
MXI Express
MXI-Express Cable, Gen 3 x4, Fiber Optic, 100m
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Product
MXI-Express Cable with Communication Levels up to Gen 3 x8
779725-07
MXI Express
MXI-Express Cable, Gen 1 x4, Copper, 7m
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Product
250 KS/s, 16-Bit, 8-Ch Simultaneous Sampling, Multifunction PCI Card
PCI-1706U
PCI Card
8 differential analog inputs8 A/D converters simultaneously sampling16-bit A/D converter, with up to 250kHz sampling rate for each channelProgrammable gainMultiple A/D triggering modesOnboard FIFO memory up to 8K SampleProgrammable pacer/counterBoardID™ switchUniversal PCI Bus (supports 3.3V or 5V PCI bus signals)
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
250 KS/s, 16-Bit, 64-Ch Analog Input Universal PCI Card
PCI-1747U
PCI Card
64-ch single-ended or 32-ch differential or a combination of analog input16-bit A/D converter, with up to 250 kHz sampling rateAuto calibrationOnboard FIFO memory (1,024 samples)Universal PCI Bus (support 3.3 V or 5 V PCI bus signal)BoardID™ switch
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Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
8-Pin Ethernet Male to 8-Pin Ethernet Male, CAT-5E Ethernet Cable
151733-01
MXI Express
CAT-5E Ethernet, Thin Profile, 1M
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
Scalable Tester System for Functional Testing
UTP6010
Functional Test
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
Compact PCI-Express/PXI-Express Module
ACE1553-3U-x-DS
PXI Express Module
The ACE1553-3U-x-DS is a member of AIM’s new family of compact PCI-Express/PXI-Express modules for analyzing, simulating, monitoring and testing MIL-STD-1553A/B databuses providing 1 or 2 dual redundant bus streams.
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Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
Custom Test System Solutions
Test System
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
