Net Probes
Monitor and analyze networks.
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Product
6-48V Digital Circuit Tester With Pierce Probe, Long Probe And Small Probe
1675D
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Peaceful Thriving Enterprise Co Ltd
Check on 6, 12, 24 and 48V systems.
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Product
LFLT-25 High Performance Lead Free Long Travel Probe
LFLT-25
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 400Full Travel (mm): 10.16Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mmRecommended Travel (mil): 315Recommended Travel (mm): 8.00Overall Length (mil): 1,460Overall Length (mm): 37.08
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Product
Probe Antennas
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Probe antennas are offered as both standard and custom models with a rectangular waveguide interface. Probe antennas can only support linear polarization. These antennas are often used to measure the gain of other antennas by comparing the signal levels of the probe antenna and antenna under testing. The standard models operate across the full waveguide band and offer 6.5 dB nominal gain and 115 and 60 degrees half power beamwidth at center frequency. The below standard offering covers the frequency range of 8.2 to 170 GHz.
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Product
Probes
Pro-Series®
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Pro-Series High Temp Cooking Probe 6" Long probe with a right angle bend for easy pulling from meats or turkeys. Cable withstands 700°F to better withstand broiling and grilling temperatures. Probe tip and sensor read temperatures to 572°F for deep-frying. Good general-purpose probe, the length reaches the center of large roasts and turkeys.
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Product
P5160 Pylon Probe
P5160
General Purpose Probe
Current Rating (Amps): 8Average DC Resistance lower than (mOhm): 10Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,310Overall Length (mm): 33.27
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1J-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Probe Cards
Minitile™ with Advanced Cantilever™ technology and WedgeTile™
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Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.
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Product
DC Coupled Current Probe
34134A
High Current Probe
Measure a wide range of applications with this battery-powered, clamp-on probe; use with DMMs or voltmeters
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1L-7-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Turbidity Probe
AS56-N
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AS56-N is a probe for direct installation into pipelines and vessels measuring NIR light absorption (Turbidity or Solids Concentration) in various liquid flow streams. Two optical path length choices allow the measurement range to meet the process control requirements.
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Product
Probe Holders
Model P7
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Made from 300 series stainless steel, the P7 probe holders accept all model 407 replaceable probe tips, and are secured with a set screw. When used with the P7 Tool Holder Adapter Arm; “Z” position adjustments are easy, and can accommodate a variety fixtures and probe card holders. Designed for both high temperature (-65 to 300°C) and high electrical isolation measurements.
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Product
Passive Probe
ENVI
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PMK Mess- und Kommunikationstechnik GmbH
The world's first modern probe for this high temperature range is suitable for a variety of applications with an input voltage range of 400V / 1250V peak, 10:1 divider and 350MHz bandwidth.The individual and signal-true contacting for different applications is guaranteed by the exchangeable spring tip and a variety of contacting accessories.
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Product
Probe Systems
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We offer a complete line of premium performance analytical probe stations for precise device test and measurement directly on wafer.
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Product
High 1.73 (49.00) - 8.00 (227.00) Bead Probe
BTP-1HF-8
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
EPA-2 General Purpose Probe
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25I8-6
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
SSP Switch Probes
Switch Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Spring Force Remark: Force at switch point: 2.36 (66)Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 150Full Travel (mm): 3.81Recommended Travel (mil): 100Recommended Travel (mm): 2.54Mechanical Life (no of cyles): 100,000Overall Length (mil): 1,210Overall Length (mm): 30.73Switch Point (mil): 25Switch Point (mm): 0.64
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Product
Current Probes
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Teledyne LeCroy current probes do not require the breaking of a circuit or the insertion of a shunt to make accurate and reliable current measurements. Based on a combination of Hall effect and transformer technology, Teledyne LeCroy current probes are ideal for making accurate AC, DC, and impulse current measurements.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1J-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Current Probes
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Current probes allow you to measure DC or AC current. Yokogawa's selection of current probes allow measurements ranges up to 500 ARMS and bandwidths up to 100MHz.
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Product
Differential Probe
DP-16VF
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*MAX. Input Voltage: ±8KV DC or 16KV p-p or AC 5.6KV rms*Bandwidth: DC-150MHz*Input Impedance 20MΩ // 5PF*X400, X4000 Attenuator*To Ground MAX. Voltage: 3.5KV CAT III*Output Impedance 50Ω
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Product
High-Voltage Differential Probe, 25 MHz
N2791A
High Current Probe
Use the N2791A 25-MHz low-cost high-voltage differential probe to make safe and accurate floating measurements with an oscilloscope. The N2791A differential probe allows conventional earth-grounded Keysight oscilloscopes to be used for floating signal measurements of up to 700 V of differential voltage and common mode voltage.
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Product
Test Probe
UE
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Qosmotec Software Solutions GmbH
Qosmotec UE Test Probe offers more flexibility to testers of mobile networks. It is a compact plug & play multi-UE test probe that allows for tests in UMTS, HSPA+ and LTE standards from any location. It can hold a custom set of up to 8 UEs.
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Product
Probing Machines
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Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.
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Product
SPM Probes
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AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal siliconOur well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpnessWe have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market
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Product
Test Probes
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Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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Product
Analyzer Probe
Net-200
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The NET-200 B analyzer probe is an integral part of the NET-xTVMS, the real-time monitoring of IPTV services quality. Intended for locations at the core, edge, subheadend, etc., the NET-200B is designed to function autonomously for an extended period of time should communication with the NET-ESVR Enterprise Server be interrupted. The NET-200B is running under stable and safe Linux OS on server class computers, powered by AC or DC sources, with optional power redundancy.
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Product
Cantilever Probe Cards
Venture
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Nidec SV Probe’s VentureTM line of cantilever probe cards represents the finest epoxy technology on the market and are perfect for logic testing. The Venture line includes an extensive array of cantilever cards, single to multi-die for a variety of test systems. Other capabilities include: • 3K Points • Pad Pitches as Tight as 35µm • Up to 32 DUTsContact your Nidec SV Probe sales representative to determine which VentureTM product is right for your testing application.
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