Automated X-ray Inspection
See Also: AXI
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Magnetic Particle Inspection
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Is an inspection method used to identify defects on the surface of ferromagnetic materials by running a magnetic current through it.
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Substrate Inspection Apparatus
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The test system of the printed circuit board (mounting board) called the flying probe tester developed ahead of the world received high evaluation at the electronics manufacturing factory around the world, securing the top share of the industry and "Takaya of the board tester" We have established a firm position that.
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Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Automated Server & Application Testing / Certification Solution
VersaTest Family
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VersaTest is a powerful family of software testing solutions that work at the message level to perform machine interface-level testing of systems and server-based applications. Though used by testing professionals across industries, its widest use in is the testing of mission-critical payments applications and networks in the retail and banking industries, such as those found in the processing of POS (point of sale) and ATM transactions. Its flexibility has also enabled it to be successfully used in other areas from the testing of healthcare information systems and telecommunication networks all the way to to air traffic control systems - anywhere that computers exchange messages, regardless of the form, VersaTest has been successfully used.
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Wafer Inspection System
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JRT Photovoltaics GmbH & Co. KG
In close cooperation with well-known providers of inspection systems, we provide modular systems for quality control and classification of raw wafers.
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Measuring And Inspection Systems For Extrusion, Injection Molding & Calendering Of Plastics And Films
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Measuring and inspection systems from Micro-Epsilon are used in the plastics processing industry in order to ensure efficient production.
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NUV-PL SiC Defect Inspection System
VS6845E
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Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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Automated Monitoring of Airborne Molecular Contamination
AMC-Monitor T-1000
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The all-in-one analyzer for FOUP, fab and clean-room environment AMC monitoring in the semiconductor industry. The AMC-Monitor is a modular and flexible platform for airborne molecular contaminations (AMC) monitoring in semiconductor applications such as: FOUP analysis with a focus on VOC and condensables incl. full integration with Pfeiffer Vacuum APA 302 pod analyzer. Clean-room monitoring in fabrication plants.
