X-ray Diffractometers
Measure the intensity of diffracted rays.
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Product
A Compact X-ray Inspection System, The MedaScope™ Desktop
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A compact X-ray machine weighing only 55 pounds, the MedaScope Desktop is easy to carry and can be set up rapidly. Glenbrook’s MedaScope Desktop is a portable, compact manual system for real-time, magnified x-ray screening of packaged devices including medical devices, electronics, and cables.
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Product
Automated X-ray Inspection (AXI)
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Automated X-ray inspection (AXI) is a testing approach based on the same principles as automated optical inspection (AOI). Instead of cameras, X-rays are used to automatically inspect features.
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Product
NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
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Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
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Product
Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Product
Continuous Particulate Monitor with X-ray Fluorescence
PX-375
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There has been a growing concern regarding particulate matter (PM) pollution and its effects on health. For effective preventative measures, the determination of source PM concentration is extremely important. Therefore, indication of PM and elemental concentrations is critical. The PX-375 analyzer employs automatic sampling, continuous on-line PM quantitative and qualitative analysis for rapid air pollution measurements.
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Product
X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
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Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm. X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure. Mapping area size up to 350 x 350 mm2 <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution. Dual types of detectors for transmission and fluorescent X-rays. Detectable element range down to C with a light element detector and He purge module.
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Product
In-Line X-ray Inspection System
X-eye 6200
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Automatically in-line inspect Solder joint defects of PCBA, and other defects on Hidden Components.Able to judge Good/NG fast with inspection speed of 1sec/FOV and the program can set ROIs conveniently.Performing X-ray inspection in various production site, integrated with other manufacturing equipements.
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Product
Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
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X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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Product
X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
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Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Product
Real-time X-ray Inspection System
JewelBox 70T™
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The JewelBox-70T delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system’s 10-micron MicroTech™ x-ray source provides magnification from 7X to 2000X, with resolution of 100 line pairs/mm.
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Product
High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
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Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
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Product
Solid-State Battery X-Ray & CT Test Cell
STM1
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Solid-state battery test cell designed for monochromatic X-ray and CT imaging, featuring an X-ray-transparent structure for non-destructive electrochemical and structural characterization.
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X-ray Diffraction and Elemental Analysis
N8 HORIZON
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The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.
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Product
X-Ray Cameras
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A range of scientific camera solutions optimized for high energy / X-Ray detection.
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Product
Energy Dispersive X-ray Fluorescence Spectrometer
EDX-7000/8000/8100
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One EDX over all others The EDX-7000/8000/8100 offers a high level af accuracy and speed in analyzing elements contained in various samples.
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Product
X-ray Optics
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Do you want to shape your X-rays to a tiny point? Then our X-ray optics can help you. Benefit from 30 years of know-how in the development and manufacture of customized optical components for demanding applications. Our high-precision optics offer unsurpassed performance and enable the best results in a wide range of applications.
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X-Ray Beam Monitors
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When standard products just aren’t good enough—or the measurement technology does not yet exist—Sydor Technologies develops technology to enable these complex imaging measurements. Just as we’ve developed next-generation streak cameras and x-ray detectors to meet novel, emerging requirements in national laboratories, we’re doing the same with x-ray beam monitors.
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Product
X-Ray Detector
XRT Detector Onyx
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ONYX 1412-X is a performance-leading X-ray detector comprising a proprietary 2768 × 2376 active pixel sensor array of 50 × 50 µm pixels. This detector consists of a high-speed, low-noise, radiation-tolerant, 14 × 12 cm, 6.6M pixel CMOS image sensor, with a directly deposited high-resolution CsI scintillator on Fibre Optic Plate. The highly configurable sensor is accessed through a software interface, connected via a 10 GbE SFP+ hardware interface.
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X-Ray Power Supplies
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Enable better sample data and accurate X-ray production with Advanced Energy’s X-ray high voltage power supplies. Our X-ray power supplies support proper specification and integration of the source and detector, which enables high power, quality, and reliability.
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Product
Energy Dispersive X-ray Fluorescence Spectrometer
Pharmaceutical Elemental Impurities Analysis System
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Control of Elemental Impurities in Pharmaceuticals In the pharmaceutical industry, the analysis of elemental impurities is necessary to ensure the safety of pharmaceuticals. In December 2014, the "Guideline for Elemental Impurities" (Q3D) was issued by the International Council for Harmonisation of Technical Requirements for Pharmaceuticals for Human Use (ICH), consisting of representatives from Europe, the U.S. and Japan. In Japan, the "Guideline for Elemental Impurities in Drug Products" (PFSB/ELD Notification 0930 #4 from the Ministry of Health, Labour and Welfare) was issued, and will be applied to new drug products submitted for approval after April 1 2017. For 24 elements categorized in Class 1 to Class 3, residual quantities in pharmaceutical drug products must be controlled within permissible limits. Although ICP-AES and ICP-MS are used for precise analysis of elemental impurities, X-ray fluorescence spectrometers can be used as an alternative analysis method. This is because they can quantitatively and qualitatively analyze a variety of elements nondestructively, and without chemical pretreatment, unlike ICP-AES and ICP-MS systems. The X-ray fluorescence spectrometry has been adopted as a general method of analysis in the U.S Pharmacopeia and the European Pharmacopoeia. (USP<735>, Ph.Eur.2.2.37)
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Product
Electrodeless Z-Pinch™Soft X-Ray (SXR) Source
EQ-10SXR
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Is a compact, easy-to-use, reliable and cost-effective SXR light source system, based on Energetiq’s unique Electrodeless Z-pinch™ technology using Nitrogen gas.
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Real-time X-ray Inspection Systems
Ultra-Compact™
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Glenbrook Technologies redefines X-ray Inspection with our smallest JewelBox Micro focus x-ray system yet. With dimensions of just 22”W x 26”L, it’s small enough to fit on a standard desk, in an office or small lab. But it’s big in capabilities with >500x magnification , 5 axis manipulator and advanced image processing. To view our product video, please click below the product image to the right.
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Product
Energy Dispersive X-ray Fluorescence (ED-XRF) Spectrometer
XEPOS
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SPECTRO Analytical Instruments GmbH
The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
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X-ray Inspection System
RTX-113™
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Glenbrook’s RTX-113 is designed for heavy production environments where X-ray is used to inspect PCBs and assembled PCBs containing advanced components such as BGA, micro BGA, QFN and other devices.
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X-ray Inspection System
TruView Prime
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The TruView Prime is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. The TruView Prime is professionaly built - something hard to find in entry level systems in the TruView Prime's price range.
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Total Reflection X-Ray Fluorescence (TXRF) Products
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Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
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Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
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Handheld X-Ray Backscatter Imaging System
Nighthawk™
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Nighthawk Handheld X-Ray Backscatter Imaging System sees what is invisible to the human eye, detecting concealed contraband, weapons, narcotics and explosives in luggage, barrels, vehicles, upholstery, and many other applications.
