Acoustic Microscopes
use high frequency ultrasound to image material.
See Also: Microscopes, Acoustic Microscopy, Infrared Microscopes, Atomic Force Microscopes, Ultrasound
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Digital Microscope Camera
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Providing you the best range of digi eye 510 microscope camera, digital microscope camera, digi eye 510c microscope camera, digi eye 210 digital microscope camera, digi eye 510c digital tablet and digi 4k microscope camera with effective & timely delivery.
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Digital Microscope Accessories
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Variety of extra accessories , such as macro lenses, remote control consoles, illuminations, image/video capture, software, stands and stages are available for Inspectis digital microscopes.
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Product
Atomic Force Microscope
XE7
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Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your research on time and within budget.
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Acoustic Emission Instruments
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The Acoustic Emission NDT technique is based on the detection and conversion of high frequency elastic waves into electrical signals.
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Acoustic Emission Testing Equipment
1283 USB AE Node
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The 1283 USB AE Node is a full-featured, low-cost Acoustic Emission testing equipment that plugs conveniently into and is powered by the USB port of a user’s PC or laptop to maximize portability and versatility.
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Acoustic Camera
SONASCREEN®
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The handheld acoustic camera SONASCREEN generates acoustic images from both the audible and ultrasound frequency range. The device locates sound sources in real time and displays the results immediately on the screen. Furthermore, the camera provides audible feedback through industrial headphones. We make ultrasound audible and visible.
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Stereo Microscopes
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Here are a few examples from our 40 years of microscopy experience in the development of special stereo microscope solutions and accessories for and with Leica , Zeiss , Nikon and Olympus .
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Complex of Visualization and Image Recording for a Video Microscope
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To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
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Product
Acoustic Emission Calibrator
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AE calibrator is similar to a simple signal generator, it can generate a variety of controlled waveform signal, different types, different amplitude and different frequency. It can help users calibrate acoustic emission detection equipment before acoustic emission detection.
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Product
Electron Microscope Sample Preparation
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Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Imaging Mass Microscope
iMScope QT
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Inheriting the concept of a mass spectrometer equipped with an optical microscope from the iMScope series, the iMScope QT is also Shimadzu's flagship model for MS imaging with a Q-TOF MS(LCMS-9030).
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Product
Acoustical Generator (STIPA Reference)
TalkBox
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The TalkBox is an acoustic signal generator for speech intelligibility measurements in evacuation and announcement systems, as well as for level alignment of teleconference or other audio systems. It allows you to perform a complete end-to-end evaluation of the speech intelligibility STI from the talker’s microphone to the listener’s ears.
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Product
Raman Spectrometer - Confocal Raman Microscope
XploRA™ PLUS
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Incorporating unique and powerful functions in a reliable, high performance system, ideally suited to the research and analytical lab, the XploRA PLUS is our best multi-sample, multi-user Raman microscope ever.It is fully confocal, not compromising image quality, spatial or depth resolution. The SWIFT Fast Raman images are the fastest fully confocal Raman images available, typically 10x faster than conventional Raman imaging.
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Acoustic Image System
Libra
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Lose the basic burlap and foam. Libra panels blend effective sound absorption with striking visual aesthetics to balance reverberations—and keep the focus on the conversation. Select from four sizes up to 14 feet wide, or customize dimensions; hang wall panels or suspend panels from ceilings and trusses.
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Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Product
Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Product
Atomic Force Microscope
AFM Heron
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New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
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Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
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The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Thermal Microscope Stage
TS-4MP
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With our TS-4MP Thermal Stage, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C
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Scanning Kelvin Probe Microscope
VS-SKP
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The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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General Purpose Acoustic Emissions Detector
BW-AED-500
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The input can range from 40Hz to 160KHz from sensors with similar ranges. The output can be delivered to a speaker, oscilloscope and an LED for threshold detections ranging from 0-Infinite. The power supply features regulated +5VDC, -5VDC, +12VDC, +15VDC, -15VDC and +/- unregulated 20VDC. Voltage input of 110VAC @ 60Hz or 220VAC @ 50Hz.
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Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Product
Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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Product
X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
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- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
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Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Acoustic Emission System
Pocket AE-2
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The Pocket AE-2 is a high performance, computerized, dual-channel Acoustic Emission (AE) system which is packed in a robust, portable handheld unit optimal for field use. The Pocket AE-2 offers all the performance, capabilities and features of larger, more expensive MISTRAS’ AE system (wide bandwidth, speed, AE features, sampling rates, waveform processing, audible AE) in a compact, battery-operated package.
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Low Acoustic Noise and Compact Range
m-series
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DC powered cooling fan is built-into the shaker. Natural air cooling is also used when the cooling fan is stopped for silent operation. (with a reduction in performance)
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PC Based Audio & Acoustic Analyzers
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Audio Analyzers, Acoustic Analyzers, and Electro-Acoustic Test Accessories
