Loop Impedance Test
See Also: Impedance Testers
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Product
Quality Tests
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Phoenix Contact has been developing innovative products for electrical connection and automation technology for over 90 years. To ensure the quality of these products, they are tested on the basis of various directives and standards throughout the entire process of creation. As a result, the products can be integrated in a variety of industries under a wide range of environmental conditions.
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Test & Inspection
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Our test and inspection products support maintenance, product quality testing, diagnostics, and quality control. The extensive range of products covers almost any application need you to have.
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Product
ARINC-429 Module
M4K429RTx
Test Module
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Wi-Fi Testing
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Ensure wireless networks and devices are ready for a new generation of demanding Wi-Fi and 5G use cases.
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Fully-Automated CTIA-Compliant OTA Test System
TS8991
Test System
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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ATE Test Probes
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For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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Nondestructive Testing
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BMP Testing and Calibration Services Inc.
Achievement is a construct, or rather a phenomenon, which everyone wishes to be a part of. Everyone seeks success to be the best, well-known, and well settled in life. This is why we want to excel in our lives by choosing a promising career for our future.
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Product
Test System
MFTS500
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Computer Gesteuerte Systeme GmbH
The MFTS500-System is specially designed for the testing of electronic control units (ECUs). It can be configured to be used as a development or as a production tester. Every effort has been made during development and design to ensure that the system is flexible and cost effective.
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Product
Current Loop Expansion Kit
OP-SB85C
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This expansion kit supports current loop communications.The kit incorporates a communications circuit with photo-coupler isolation and constant-current power supply of insulated type, thus realizing not only monitoring but also easy communications testing with passive or active current loop devices.
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Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Test Panel
TA-5
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A complete NAV/LOC/GS/MKR test panel designed around the VIR30/31/32 units. Requires channeling source. Combining the TA-6 panel provides a complete integrated system.
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E-Mobility Testing
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With the electrification of the powertrain developers face many new challenges. Electrification does not only increase the range of solutions, but also the number and type of design options. Therefore, a partner with both specific application know-how and a holistic perspective on the system is critical. We provide you with exactly this required expertise.
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Testing Framework
TestDrive
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TestDrive™ automates all types of testing for data integration applications for dramatically improved quality of applications as well as the data they produce.
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Test Prods
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Test prod with 4mm plug, test prod with 2mm pin, safety test prod, test prod 2mm, test prod 4mm, miniature test prod.
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EMI/EMC Testing
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This type of testing is required for devices, systems, and applications within the military and aerospace industries. Weapons, aircraft, ground and support equipment, electrical, and electronic systems must meet the established requirements.During electromagnetic interference the component's electrical circuit is affected due to either electromagnetic conduction or electromagnetic radiation from an external source.
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Leak Testing
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Leak testing is a non-destructive method to verify the presence of a leak in a component or device.It is implemented as a control methodology for monitoring production process and product quality control. Leak tests are used to find out possible leaks due to non-suitable material (porosity, blowholes, cracks), or in the machining process to find out machining errors or defective parts, and ultimately in assembly, to find out missing or defective gaskets, wrong positioning or assembly. The presence of a leakage could jeopardize the correct functioning of the component, device or its life span, and can also be potentially dangerous for the environment and the safety of its user.
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Functional Testing
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We are flexible to match your approach, whether you are using Agile or traditional development methodologies. We can work with your requirements and test cases, or perform exploratory testing. We can provide 100% of your software testing, or supplement your internal team. Independence and creativity are key elements to find issues to help your software developers create high quality software.
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Test & Test Development for Circuit Card Assembly
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Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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Diagnostic Testing
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Response Dynamics Vibration Engineering, Inc.
Response Dynamics has made diagnostic testing our core focus for over 30 years. We do this detective work well because we have particular expertise in structural dynamics and how it relates to vibration and acoustic noise issues on a myriad of levels. We enjoy this work because it stays interesting and draws on multiple disciplines in engineering and science.
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High Impedance Active Probes
12C
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A high speed, high input impedance active probe for measuring the internal node voltage of integrated circuits. The input is 1 megohm shunted by 0.1 pf and the rise/fall times are 0.8 ns. This instrument has full dc capability and can be used with any oscilloscope. The Model 12C was specially designed so that when used in conjunction with a high input impedance oscilloscope, signal attenuation is 10:1 and with a 50 Ohm input, signal attenuation is 20:1.
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Test Software
Yelo Test Environment V5.0
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The Yelo Test Environment (YTE) is an automated test environment developed by Yelo. Test sequences can be developed for multiple products and are tailored to customer needs and specifications. Flexibility in testing is a key benefit of the YTE and is provided to the user by allowing management of test sequence order. There is also the ability for the user to change the test limits or parameters for more or less stringent testing depending on requirements.
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Test Automation
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Test automation helps in reducing regression testing time and cutting down the time to market with significant cost savings on long term basis. However, a clear automation strategy and roadmap is key to ensuring the right return on investment on your automation initiatives. With disparate application architecture, multiple environments, third party integrations and multiple user devices, a standardized and consistent automation approach is needed to ensure high reusability, ease of maintenance and lower upfront cost.
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In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Vibration Testing
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Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Test Facility
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Emprise has extensive experience designing test facilities for the aerospace, automotive, industrial and power generation marketplaces. The cost of a test facility is usually directly proportional to the accuracy of the test simulation.
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Product
Test Kit
Metriso B530
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Wolfgang Warmbier GmbH & Co. KG
Test voltage / Test current: 1 mA < I < 1,3 mAHigh ohmic range: DC 10 volts,100 volts and 500 voltsTest range:low ohmic range: 1 to 10 kOhmhigh ohmic range: 1 kOhm to 199 GOhmOperation: Battery operatedProbes:2x Model 870 (weight: 2,27 kg / ø 63,5 mm) with conductive rubber (grey) and extension,1x hand-held probe Model 45
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Test System
DA-2 ATS
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The DA-2 ATS is an economical Commercial-Off-The Shelf (COTS) build-to-print tester. The test station is compliant with the published drawing package. The system does not include software.
