Test Pattern
Test signals for the calibration and alignment of TV broadcast and reception equipment.
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Product
Surface Insulation Resistance Testing
AutoSIR2™
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One AutoSIR chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), ensuring that dendrites are preserved for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.
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Product
Sync Generator
LT 4610
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The LT 4610 is 1RU full-rack size sync signal generator that can output triple-rate SDI (3G-SDI/HD-SDI/SD-SDI) signals. It employs two power supply units for redundant operation to protect against power supply failures. The genlock function for external sync signals enables SDI signals, six sets of analog black burst sync signals, and audio word-clock signals to be output synchronously. The genlock function is equipped with a STAY IN SYNC function that maintains the phase when errors occur in the input signal, making it possible to provide stable sync systems.In addition to test pattern output including color bars and SDI check fields, the LT 4610 can embed ID characters, QVGA logo marks, safety area markers, and embedded audio in a SDI signal output.
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Product
Test Patterns
DisplayMate Multimedia Edition
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DisplayMate Technologies Corporation
DisplayMate Multimedia Edition is the most advanced and powerful version of DisplayMate ever, with lots of proprietary and highly innovative suites of test patterns for setting up, tuning-up, calibrating, testing, evaluating, diagnosing, and analyzing CRTs, analog and digital LCD, Plasma, DLP, LCoS, and SXRD monitors and projectors, microdisplays, video boards, color printers, TVs and HDTVs, NTSC/PAL Television encoders and decoders, and more.
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Product
Emulate Test in simulation
STIL-VT
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Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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Product
Test Program Management
TP-M
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TP-M utilizes TestInsight unique capability to read and analyze a whole test program from flow to every test pattern, timings, levels etc.
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Product
Diagnostic Test System™
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The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Product
Encoder Stress Pattern
ESP™
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SRI's ESP is a sophisticated video clip consisting of specialized and complex artificial test patterns that stress various aspects of processing to quickly reveal television encoder deficiencies. Its unique motion sequences allow users to visually evaluate and objectively compare the quality and performance of standard- and high-definition encoders.
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Product
DisplayMate Multimedia with Test Photos Edition
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DisplayMate Technologies Corporation
DisplayMate Multimedia with Test Photos Edition is an enhanced version of the standard Multimedia Edition that adds a carefully chosen set of very high quality high resolution photographs for calibrating, testing, evaluating, and tweaking monitors, projectors and HDTVs, automatically scaled to the native resolution of the display. It has everything in the standard Multimedia Edition including all of its 500+ test patterns up through 4100 x 4100 resolution.
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Product
Memory Diagnostic Utility
MemTest86
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MemTest86 is the original, free, stand alone memory testing software for x86 computers. MemTest86 boots from a USB flash drive or CD and tests the RAM in your computer for faults using a series of comprehensive algorithms and test patterns.
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Product
Pattern Generator
1B-SDI-PTG
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The 1B-SDI-PTG 3G-HD/SD SDI Pattern Generator - advanced SDI pattern generator with multi-format and multi-pattern support. Supports still and moving video test patterns, and provides a lot of useful features like audio SMPTE-291M. 1B-SDI-PTG Pattern Generator supports up to 8 channels of AES compliant audio with 48KHz sample rate. Multitasking of 1B-SDI-PTG comes from bypassing HDMI input which allows user to use more testing patterns for connected display or use 1B-SDI-PTG as SDI converter with 3G support.
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Product
RF Shielded Enclosure for Pre-Compliance EMC and CTIA Testing
QuietBox-AR "Mini-Range"
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The Raymond RF QuietBox-AR is a mobile solution for pre-compliance EMC and CTIA testing, 3D antenna pattern measurement, and total radiated power & total isotropic sensitivity testing. Fully equipped with client-specified broadband absorber, integrated antenna and rolling cart, the QuietBox-AR is a cost effective option for product verification prior to fully compliant testing.
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Product
AMIDA 2020XP Tester
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AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end
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Product
Imaging Photometers
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Westboro Photonics offers an intelligent selection of imaging photometers. With a wide range of resolutions, an assortment of lenses, flexible software, and cooled systems, our products are unmatched in the marketplace. We provide three series of photometers to satisfy almost any 2D luminance-based measurement need. Applications including Graphics Testing, Beam Pattern Distribution, Flat Panel Displays and Avionics Panel Balancing are handled with ease, thanks to our robust design, extensive calibrations, and flexible, intuitive analysis software.
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Product
Camera Link Simulator
CLS-221
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The CLS-221 Camera Link Simulator is an affordable, high-performance video test pattern generator that supports all video formats including those introduced in the new version 2.1 specification. Fully programmable video timing enables the CLS-221 to mimic the characteristics of almost any camera. New features include enhanced timing performance, bayer color support, and additional video patterns. Control is via an RS-232 port, USB, or frame grabber COM port. The CLS-221 also incorporates the AIA validation test pattern.
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Product
Flat Panel Display Test Solutions
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Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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Product
Camera Testing
FLIR
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CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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Product
DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
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NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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Product
Video Generator-Analyzer
VQTS-200
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VQTS-200 is a self-contained solution, combining:3G-SDI/HDMI/DVI player/recorder - based on AJA Kona LHi cardBuilt-in RAID storage - uncompressed YUV signals in and out, up to 1080p60Visual, instrumental and automated tests using VQL Test Patterns LibrarySophisticated image quality VQMA3 software analyzer - complete quality report in 2 secondsIdeal tool for development labs, software developers and high volume manufacturersEasy-to-use tool, instantly revealing your video camera, codec, scaler, converter or other video device performanceUser-selectable reporting modes:machine-readable file with Pass/Fail marksdetailed multi-page PDF document
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Product
ICT/FCT-Fixtures (Small IF)
GenRad CK-1-228X-S
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Test Solution
Eye-BERT MicroX
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The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Product
Global Standard Model For 4 Point Probe Sheet Resistance Automatic Measurement System
RT-3000/RG-1000F
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*Fully automatic system for large sizes of flat panel with glass loading robot*Tester self-test function, Measurement position correction function, wide measurement range*Min. 0.1 mm meas. resolution and user programmable test pattern*Host (CIM) communication and 2-D/3-D Mapping software
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Product
HDTV PATTERN GENERATOR
HG139
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The HG139 is an easy-to-use handheld video pattern generator that generates a wide variety of test patterns for comprehensive testing, calibration, and repair of HDTV, analog television monitors, and other video equipments. The HG139 delivers the quality and functionality you would expect from the expensive high end HDTV pattern generator at a very affordable price.
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Product
PCB Test Fixture Kits And Customized Fixtures
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Mirotech manufactures portable benchtop PCB test fixture kits and provides customized test fixture solutions for the electronics industry. Our innovative, streamlined designs are compact in size and feature a linear collapsing system, interchangeable and reusable plate design, top and bottom probing, and are affordably priced. All fixtures are built using high quality hardware and materials and manufactured using the DATRON M8Cube, known for its precision and accuracy. Each of our custom designs are unique to our customer’s particular project requirements. Fixture kits come pre-assembled, and include blank plates ready for you to drill your test pattern.
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Product
TV generator PAL-SECAM-NTSC
TRF498
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TV generator TRF-498 provide high quality test patterns and signals according to PAL, SECAM and NTSC. You can select from 64 standard patterns and 5 user configurable patterns in 4:3, 14:9 or 16:9 format (50 or 60 Hz, interlaced and non-interlaced mode).
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Product
ICT/FCT-Fixtures (Large IF)
GenRad CK-2-228X
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Silicon Test & Yield Analysis Solutions
Tessent®
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The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
Testability Analysis
TurboCheck
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TurboScan is an advanced full-scan and partial-scan test suite. It includes a Scan Synthesizer and an Automatic Test Pattern Generator (ATPG). TurboScan automatically repairs testability violations to make your design highly testable.
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Product
Multi-Output, Multi-GNSS Wavefront Simulator System
GSS9790
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The GSS9790 is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems, spatial testing of single-antenna devices, and as part of real-world-time-synchronized indoor GNSS implementations.
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Product
Line Scan Camera
Piranha4
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The Piranha4 cameras offer advanced features such as sub-pixel spatial correction, areas of interest (up to 4 at a time) to reduce data processing and simplify cabling, as well as dual-line area mode to double line rate, HDR mode, shading and lens correction. The Piranha4 is built for the real world with features to ease system integration. The advanced GenICam compliant user interface makes it easy to set up and control camera parameters such as exposure control, FFC, white balance, gain, test patterns, diagnostics and more.
