Test Pattern
Test signals for the calibration and alignment of TV broadcast and reception equipment.
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Multistandard Test Pattern Generator
TRF-950
TRF-950 is universal multistandard equipment suitable for analog TV systems and digital video. This generator supports all analog standards (PAL, SECAM, NTSC) and substandards. Digital output offer DV601/656 signal. Generator is installed in low profile case suitable for desktop use as well as for use in Rack 19" stand.
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Video Test Pattern Suite
Sarnoff®
In the digital era, traditional video test and measurement tools are becoming obsolete. SRI offers a suite of unique visual tools that enable users to stress, evaluate, and calibrate audio and visual equipment throughout the signal chain. Test pattern products include the award-winning Visualizer digital video test pattern, the ESP encoder stress pattern, and the TSG test sequence generator.
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Test Pattern Generators
Video Test Pattern Generator, Portable Monitor Tester, Test Video Audio Signals, HDMI, DVI, SDI, Component Video, HDCP
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Test Pattern Generator Delay & AV Sync Analyzer
VQDM-100
Versatile compact and robust multi-purpose tool for R&D and glass-to-glass QA/QC Instant visual-aural quality estimation plus automatic latency, AV sync and 3D LR sync measurement Multi-channel time-line analysis, including video frames continuity testing 4 Light Sensors with vacuum caps, 4 Audio inputs (standard line levels) 2 channels of AV timing analysis, simultaneous measurements of Video and Audio Latencies Real time multi-channel data acquisition via USB port Unique sophisticated set of static and dynamic test patterns up to 1080p@60fps - see more details in separate VQL page Source of VQDM, VQMA2, and VQMA3 Test Patterns for VideoQ Analyzers Multi-format digital and analog AV outputs: HDMI, YPrPb, S-video, SPDIF, LR analog audio Networkable unit, easy expansion with any external USB storage device: live clips, user content, etc.
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ISO Test Charts
ISO has been the governing body for Image Quality Testing all over the world. To that end, APPLIED IMAGE is proud to be a participant in assuring that the industry has products that meet or exceed the requirements of ISO. Since ISO covers many levels, we provide test patterns of various types that can be used for Image Capture and Evaluation of Optical and Imaging systems of all types.
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TRF Manager 9
Configuration by using a PC, this is one of the major TRF generator attribute. Instruments have factory settings suitable for common applications and contain the most popular test patterns. But many users want to customize the setup or set the instrument according to specificic application requirements. They also may want to adjust parameters, that cannot be accessed by any other way. That is what TRF Manager 9 (optional software pack) can do. And much more! Pattern generators of the TRF-498 and 598 series use a parallel interface for connection with PC. Basic setup can be realized by using Pattern Manager, free software downloadable from our site. For advanced settings there is available TRF Manager 3 software. For more detailed information see the TRF-498 and TRF-598 section, please.
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Memory Diagnostic Utility
MemTest86
MemTest86 is the original, free, stand alone memory testing software for x86 computers. MemTest86 boots from a USB flash drive or CD and tests the RAM in your computer for faults using a series of comprehensive algorithms and test patterns.
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Virtual Test Methodology
TVT
With TVT, you don''t have to wait for the physical device to start validating your ATE test patterns, or verifying the device interaction with the tester.
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HDTV PATTERN GENERATOR
HG139
The HG139 is an easy-to-use handheld video pattern generator that generates a wide variety of test patterns for comprehensive testing, calibration, and repair of HDTV, analog television monitors, and other video equipments. The HG139 delivers the quality and functionality you would expect from the expensive high end HDTV pattern generator at a very affordable price.
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LCM Panel Tester
27013
Chroma 27013 is a portable tester that supports high resolution and large scale LCM with the signals, power supply and test patterns required for LCD module test.
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Master Reference Generator
Mentor
Precision Time Protocol IEEE-1588 PTP grandmaster• Multiple video and audio formats in one box• Simultaneous 525/625 and HD Tri Level Sync outputs• Highly accurate GPS reference for synchronisation and timecode• Vector web-browser setup and monitoring tool• Redundant PSU option• Add upgrades and options without return to factory• Generates synchronised audio and video• Redundant units with changeover• 4K test pattern ready (future upgrade)
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AMIDA 2020XP Tester
AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end
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TV generator PAL-SECAM-NTSC
TRF498
TV generator TRF-498 provide high quality test patterns and signals according to PAL, SECAM and NTSC. You can select from 64 standard patterns and 5 user configurable patterns in 4:3, 14:9 or 16:9 format (50 or 60 Hz, interlaced and non-interlaced mode).
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Diagnostic Test System™
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Flat Panel Display Test Solutions
Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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CRPA Test System
The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
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Boundary Scan
TurboBSD
TurboBSD is SynTest high-performance Boundary Scan Designer. It is 100% compliant to the IEEE 1149.1 Boundary Scan Standard. TurboBSD performs Boundary Scan logic synthesis, creates BSDL (Boundary Scan Description Language) file, and generates Boundary Scan test patterns
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Surface Insulation Resistance Testing
AutoSIR2™
One AutoSIR chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), ensuring that dendrites are preserved for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.
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Testability Analysis
TurboCheck
TurboScan is an advanced full-scan and partial-scan test suite. It includes a Scan Synthesizer and an Automatic Test Pattern Generator (ATPG). TurboScan automatically repairs testability violations to make your design highly testable.
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Emulate Test in simulation
STIL-VT
Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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VGA and S-VGA test generator
TELETEST PC
A pocket sized, battery powered PC monitor test pattern generator. For fault finding and repairing PC systems with stand alone monitors.
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Remote Intelligent Pod
ScanTAP
The test patterns generated by the PCI-1149.1/Turbo controller are distributed to the target system either directly through ScanTAP 4 and ScanTAP-8 pods. The ScanTAP-4 and ScanTAP-8 pods can apply test vectors and/or ISP patterns to target boards with a variety of JTAG chain topologies. In the simplest case, the ScanTAP-4 and ScanTAP-8 will provide the interface between the PCI-1149.1/Turbo controller and a target system consisting of a single JTAG Test Access Port (TAP). This would be the case where the target system consists of one JTAG chain and its single associated TAP.
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Test Program Management
TP-M
TP-M utilizes TestInsight unique capability to read and analyze a whole test program from flow to every test pattern, timings, levels etc.
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Sophisticated Audio and Video Test Patterns
VQL
VQL Instantly reveals your video display, codec, scaler, converter or other video device performance VQL test patterns cover all 3 levels of video QA/QC: Instant visual-aural Quality Estimation Objective Measurements of video and audio performance Fully automated (unattended) Quality Control VQL features: Compatibility with all commonly used software or hardware codecs and media players VideoQ VQV / VQMA / VQTS / VQDM compatible tests Wide range of video frame sizes: from 192x108 to 4096x3072 Variety of bit rates up to uncompressed 4:4:4 4K @60 fps, 48 bit per pixel Variety of video and audio formats, color spaces and level schemes All test patterns remain suitable for accurate measurements even after low bitrate coding, heavy scaling and/or cropping, e.g. after down-conversion for mobile devices Standard, custom and semi-custom tests for development labs, content processing facilities, CDN systems, software developers and high volume manufacturers
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ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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DisplayMate Multimedia Edition for Mobile Displays
DisplayMate Technologies Corporation
DisplayMate Multimedia Edition for Mobile Displays is a special version of the Multimedia with Test Photos Edition that produces native resolution Bitmap Files of all DisplayMate test patterns and photos that can be copied or downloaded to mobile devices, displays, and projectors for testing, evaluating, optimizing, analyzing and comparing their performance. Examples include: MP3 and video players, smartphones, digital cameras, picture frames, game consoles, GPS units, camcorder displays, and pico/pocket projectors.
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ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Sync Generator
LT 4610
The LT 4610 is 1RU full-rack size sync signal generator that can output triple-rate SDI (3G-SDI/HD-SDI/SD-SDI) signals. It employs two power supply units for redundant operation to protect against power supply failures. The genlock function for external sync signals enables SDI signals, six sets of analog black burst sync signals, and audio word-clock signals to be output synchronously. The genlock function is equipped with a STAY IN SYNC function that maintains the phase when errors occur in the input signal, making it possible to provide stable sync systems.In addition to test pattern output including color bars and SDI check fields, the LT 4610 can embed ID characters, QVGA logo marks, safety area markers, and embedded audio in a SDI signal output.
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Pattern Generator
1B-SDI-PTG
The 1B-SDI-PTG 3G-HD/SD SDI Pattern Generator - advanced SDI pattern generator with multi-format and multi-pattern support. Supports still and moving video test patterns, and provides a lot of useful features like audio SMPTE-291M. 1B-SDI-PTG Pattern Generator supports up to 8 channels of AES compliant audio with 48KHz sample rate. Multitasking of 1B-SDI-PTG comes from bypassing HDMI input which allows user to use more testing patterns for connected display or use 1B-SDI-PTG as SDI converter with 3G support.
