DDS Function Generators
Direct Digital Synthesis Function Generator
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P2665 General Purpose Probes
Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
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Functional Test Fixtures
Test Head Engineering's Custom Functional Test Fixtures range from simple to extremely complex. Typically, our customers do their own wiring and programming, but we will complete the job right up to the customer's requirements, including offering turn-key control and test programming through our partners.
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Generators
OUR CHALLENGE“To drastically reduce the weight and size of Constant Potential X-Ray generator while maintaining first class performances”To successfully meet this challenge, our engineers have worked at designing an exceptional new X-Ray insert. This highly compact X-Ray tube combined with a revolutionary cooling system and a multiple output carrousel can definitely be considered to be the most versatile X-Ray generator ever developed. In addition, performances are not compromised in any way whatsoever.
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Ethernet/LXI generatorNETBOX 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 4 Channels
DN2.656-04
The generatorNETBOX DN2.65x arbitrary waveform generators (AWG) is a general purpose multi-channel AWG with outstanding dynamic performance. The series includes LXI units with either four, eight or 16 synchronous channels. The large onboard memory can be segmented to replay different waveform sequences.
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Standard 0.39 (11.00) - 1.39 (39.00) Non Replaceable General Purpose Probe
MEP-20B
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 25Test Center (mm): 0.635Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 750Overall Length (mm): 19.05Rec. Mounting Hole Size (mil): 20.5Rec. Mounting Hole Size (mm): 0.52Rec. Mounting Hole Remark: 20.5 to 21.5 mil / 0.52 to 0.55 mmRecommended Drill Size: #75 or 0.52 mm
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1.25GS/s 16Bit 1GS Mem 2CH 4 Markers AWG
P1282D
The Proteus P1282D, is a 1.25GS/s, dual channel arbitrary waveform generator packaged in a 4U, half 19” dedicated chassis, offering technologically advanced options and configurations that integrate the ability to transmit and perform digital signal processing all in a single instrument. The P1282D offers industry leading performance Including an innovative task oriented programming, real time data streaming, fast feedback loop for environment dependent waveform generation and user customizable FPGA for application specific solutions.
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Cup, Concave 90/120°, Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0A
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Protective Function Analog Multimeter
MT-2018
Complied with 2008 CE safety standardMirrored Aluminum dial plate20k/V DC & 9,k/V AC input sensitivityOverload and mis-used protectionAdjustable back tilt device with hook-up designRobust protective holster alongsideResistance, Current & Voltage measurementsTransistor hFE TestBattery TestTest leads, batteries, fuse and user's manual includedIdeal for using in the fields of lab, school, home applications and more
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Thermal/Multi-Function Data Logger
51101
Chroma Systems Solutions, Inc.
Models with 1, 8, and 64 channels on-line data recording. Multi-sets linked to a PC for hundreds of channels are doableSupports B, E, J, K, N, R, S, and T type thermal couples with ITS-90 defined temperature rangeIndividual channel cold junction compensation withTemperature resolution up to 0.01℃, error down to (0.01% of reading+0.3℃)Voltage full range ±480VDC, ±10VDC; resolution 1mV, 10uV; error down to (0.1% of reading+1mV), (0.015% of reading+100uV)1000VDC channel to channel isolation, full protection for testing points with charge and guarantee for accurate measurementsThermal couple open circuit detectionPC-based operation with powerful software for recording and analyzing data1 and 8 channel models are USB powered. No battery or external power supply is required
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Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3F
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Generators
We offer a wide range of power supplies, current and voltage supplies, frequency references, RF generators, transceivers.
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Dual Channel Arbitrary Function Generator
TGF4000
High resolution, low jitter pulses can be generated up to 100MHz as can wide bandwidth white noise. A extensive array of modulations is provided using internal and external sources. Gated, burst and sweep modes can use internal or external trigger sources. Remote control via USB and LXI compliant LAN (standard) can be supplemented by optional GPIB if required.
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Functional Testing and Test Engineering
Customer-supplied or developed in-house• Ruggedization of existing (lab-built) fixtures• Co-develop hardware/software• Deployment, implementation, and training• Engineering evaluation tools• Design verification• Medical device evaluation• Manufacturing test systems• Verification test systems• Go/No-go tests• Serialization, recordkeeping, and datalogging• Troubleshooting failed units with other test platforms
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PXIe-5650, 1.3 GHz RF Signal Generator
781215-01
The PXIe‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Ultra High 12.90 (366.00) - 48.00 (1361.00) General Purpose Probe
EPA-5E-2
Current Rating (Amps): 8Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,420Overall Length (mm): 36.07
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Functional Tester
ESF-2003
The functional tester developed on the basis of our experiences in electric parameters testing technique.Accumulated with 30 years of experiences in electronic testing, Shindenshi Corporation develops this ESF-2003.Shindenshi will provide suitable products to customer for their need.
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Standard 0.50 (14.00) - 3.40 (96.00) Non Replaceable General Purpose Probe
C-S-R
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 45Full Travel (mm): 1.14Recommended Travel (mil): 30Recommended Travel (mm): 0.76Overall Length (mil): 395Overall Length (mm): 10.03Rec. Mounting Hole Size (mil): 46.5Rec. Mounting Hole Size (mm): 1.18Recommended Drill Size: 56
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C-S General Purpose Probes
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 45Full Travel (mm): 1.14Recommended Travel (mil): 30Recommended Travel (mm): 0.76Overall Length (mil): 395Overall Length (mm): 10.03Rec. Mounting Hole Size (mil): 46.5Rec. Mounting Hole Size (mm): 1.18Recommended Drill Size: 56
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Comb Generator
WJ10-100A
Comb Generator model WJ10-100A with Broadband Antenna. Frequency Range 10MHz - 11 GHz with two frequencies step size option; 10/100 MHz
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Flash Programming for Functional Test Systems
Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Actuation Methods for Functional Test Systems
Functional test typically applies full operational power to a final product or a loaded printed circuit board in order to determine if the Product/ PCB performs functions as designed. This type of test often involves custom built test equipment and custom test fixturing. Circuit Check supports all forms of functional test strategies within its Signature Series functional test fixtures.
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Signal Generators
ZTX-Series
RPG's Signal Generator Extenders allow high performance frequency extension of microwave sources into the THz range. The available models cover a Frequency Range from 50 GHz up to 1.1 THz. These modules combine high test-port power with low phase noise to offer exceptional performance. Contact RPG to discuss Signal Generator Extenders configurations that will gain the best performance for your application.
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Earbud Function Button Tester
BK2121
The BaKo Type BK2121 was developed in response to Apple’s need to maintain quality control in earbuds which contain function controls and an internal microphone, designed to be used with newer IPods. It is a compact, easy to setup, easy to use machine with a short test time that you can use to functionally validate each earbud unit as it comes off the product line.
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Generator
Toellner Electronic Instrumente GmbH
In electricity generation, a generator is a device that converts motion-based power (potential and kinetic energy) or fuel-based power (chemical energy) into electric power for use in an external circuit.
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Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2X-1
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Pattern Generator
S-113
The Pattern Generator slot module of FOTS system is an efficient module for the characterization and test of external optical components and systems to be performed in high bit rate. This module is a kind of pattern generator and bit error rate tester that can be used to modulate optical components or systems and to test the bit error rate characteristics of optical systems or optical lines. This pattern generator slot includes two differential Tx/Rx channels, which can be operated simultaneously.
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Cup, Concave 90/120 degree, Alternate 0.78 (22.00) - 3.70 (105.00) General Purpose Probe
HPA-0A-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
