Current Transformer Test
measures insulation, excitation current, turns ratio, winding polarity saturation and/or winding resistance. Current Transformers
See Also: Transformer Test, Transformer Testers, Current Transformer Test Set
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Continuous Testing
Continuous testing is the practice of embedding quality through every phase of the software delivery lifecycle - from planning to production. The goal is to ensure that testing continuously reduces risk and improves application quality.
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Wafer Test
Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Impulse Current Generator
Weshine Electric Manufacturing Co., Ltd
Impulse current generator is mainly used to test the ability of electrical equipment to withstand strong impulse current, widely used in lightning arresters and electrical and electronic equipment in operation conditions of oscillation wave immunity test, can also be used for other research tests.
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Uniload Voltage Transformer
2J4-4
The Type 2J4-4 Knopp Uniload Voltage Transformer Test Set consists of three major parts:
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Test And Measurement
Standardized instruments used to evaluate individuals, populations, or processes.
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Through Hole type DC Current Sensor／for DC Leakage Current Measurements
DCZCT-45SH
MULTI MEASURING INSTRUMENTS Co., Ltd.
Through Hole type DC Current Sensor／for DC Leakage Current Measurements
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Stand-Alone Current Sensors
The Aanderaa Current Sensors are based on the backscatter acoustic Doppler principle.
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High Output Current Op Amplifiers ≥ 100mA
Analog Devices high speed , high output current (≥100 mA) op amps deliver high output current while driving low impedance loads with excellent linearity. Whether it's high output current, low input bias current, wide bandwidth, high slew rate, or low distortion, no one sets more performance standards for next-generation designs with the widest portfolio of leading edge products than Analog Devices.
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Potential Transformers
Osborne Potential Transformers (PT’s) are used to reduce higher system voltages to lower values that are appropriate for instrumentation and/or protection circuits. They have been designed to meet specified current ratios, and burden impedance at a specified transformation error. One area of unique Osborne expertise is in designing for phase shift when potential transformers are to be used for power measuring applications.
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Logger with Current Clamp0 to 200A AC
TV-4810
As well as recording data the unit has a display that shows what the unit is currently reading. The unit has an IP65 case and features high reading resolution and accuracy, a large memory, a fast offload speed and a low battery monitor.
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5G Testing
Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
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Test Set
TS® 22
The TS22 Test Set’s unique built-in one-way amplified speaker provides three audio levels for hands-free listening and use with automated voice response systems. Multiple memories enable storage of nine 18 digit telephone numbers in repertory dialer (speed dialing) for easy access to test boards, the central office and other frequently called numbers. The last number redial feature eliminates the need to re-key your last entry. The TS22 Test Set offers an unbeatable combination of reliability, durability and expanded utility.
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Clamp type AC Current Sensor／for Leakage Current Measurements(ZCT Series)
HFCT-34
MULTI MEASURING INSTRUMENTS Co., Ltd.
Clamp type AC Current Sensor／for Leakage Current Measurements(ZCT Series)
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Current Transducer
IN 1000-S
For the electronic measurement of current: DC, AC, pulsed..., with galvanic separation between the primary and the secondary circuit. 1000 A nominal, 3 ppm linearity over the temp. range, Very low offset drift 19.5 ppm, low noise 34 ppm peak-peak, -40 to +85°C, one compact package.
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Test Chambers
The left-hand axis scales the level of the 100 measurements and the right-hand axis displays the uncertainty to a statistical confidence level of 95%; proving the repeatability is better than +/-0.25dB between the measured values. Guaranteeing repeatability, accuracy and correlation across Lab’s, across Production lines and across the World
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Pack Testing
PEC offers a 600V-600A and a 1000V-500A system with either 1 or 2 channels. The systems are programmable using the standard PEC LifeTest application, offering a user-friendly environment for configuring and analyzing drive cycles and other energy storage simulations.
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Current Transformer Testers
Vanguard Instruments Company, Inc.
Performs CT excitation, current-ratio, polarity, and phase angle testsMeasures insulation resistance and winding resistance of the CT seconday windingsMeasures the CT's secondary burdenTest record header information including company, substation name, circuit ID, manufacturer, CT serial number, operator name, and test record-commentsBuilt-in 4.5-inch wide thermal printerPlot Multiple Saturation CurvesStores up to 128 CT test plans and 140 test records internallyUSB, Bluetooth, and USB Flash drive interface
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Telecoms Testing
KTL offers an extensive range of telecoms testing services, wired and wireless, for voluntary and regulatory markets worldwide. Conformance services are complemented by interoperability telecoms testing and by our commitment to provide market access through procurement specification testing.KTL provides telecoms testing to customer specific requirements and, as an independent third party test laboratory.
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3 Phase Flexible AC Current Probe
DRP 503/18
The new DRP 503/18 is a 3 Phase Flexible AC current Probe utilising the Rogowski principle, with 3 channel integrator housed in DIN Rail Mounted Enclosure. The flexible and lightweight measuring head allows quick and easy installation in hard to reach areas and with large conductors.
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Test Automation
Write tests in plain-speak and refactor fearlessly so your test suite adapts as your application evolves. Gauge’s pluggable architecture allows you to customize your environment so you can write tests in the language and IDE of your choice.
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Massively Parallel Parametric Test System
P9001A
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Cable Testing
MET Labs performs a wide range of cable tests required by a wide range of vendor and government specifications, including simultaneous temperature and vibration testing.
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Automatic Transformer Test System
TH2840AX
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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Eddy Current Flaw Detectors
EddyView
United Western Technologies Corp
Choose the Eddy Current performance to match your NDT inspection needs!
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Low Noise Current Preamplifier
SR570
Stanford Research Systems, Inc.
The SR570 is a low-noise current preamplifier capable of current gains as large as 1 pA/V. High gain and bandwidth, low noise, and many convenient features make the SR570 ideal for a variety of photonic, low temperature and other measurements.
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Test Capabilities
Eltek International Laboratories
ELTEK Labs has conducted more Electrical Insulation Systems (EIS) and Component Compatibility Testing (CCT) than all other laboratories worldwide combined. ELTEK Labs is proud to be a Third-Party Testing Laboratory for internationally recognized certifying bodies.
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Clamp type DC Current Sensor／for DC Leakage Current Measurements
DCZCT-18S
MULTI MEASURING INSTRUMENTS Co., Ltd.
*Compact size, General purpose*DC leakage current measurements
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Unit Testing
Hitex offers a unit testing service for C/C++ application source code using the well-known test tool TESSY. For this service, the customer provides their source code of the C/C++ functions to be tested, ideally along with the specifications of the functionality and comprehensive comments in the source code.
