Showing results: 1036 - 1050 of 1059 items found.
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B-1010, B1010-A, B-1012, B-1012-A -
ROSS ENGINEERING CORPORATION
HV Probes and Voltmeters for oscilloscopes, DVMs, recorders. HV DC, AC & Wideband DC-10MHz. Safety probes for any scope, digital display or recorder. Also available complete with large 4½ digit display 0.01% to 5% DC/AC accuracy digital voltmeter, with safety handles for OSHA recommended personnel clearances. With attached or separate digital display or multimeter 0.00001V to 400kV. HV Digital Multimeters. Wideband DC-10MHz. VMD2A 4½ digit portable meter has accuracies to 0.01% DC, 0.1% 50/60Hz, 3% DC-1MHz, 3dB to 10MHz. True RMS, Avg, True +PK, -PK, PK to PK, 0.2 microsecond, 1/2 sine single pulse capture & hold. 0.00001V - 1000V DC or PK AC and for use with HV Probes to 400kV and Voltage Dividers to 1,000,000V. Has 2V output to scope, recorder. To 1000kV with HV divider, DC-10MHz.
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Teledyne LeCroy
Transmission line probes are a special type of passive probe designed for use at very high frequencies. They replace the high impedance probe cable found in a traditional passive probe with a precision transmission line, with a characteristic impedance that matches the oscilloscope input (50 Ohm). This greatly reduces the input capacitance to a fraction of a picofarad, minimizing the loading of high frequency signals. A matching network at the tip increases the DC input resistance. While they have lower DC input resistance than a traditional passive probe (usually 500 Ohm) to 1kOhm), the input impedance of these probes remains nearly constant over their entire frequency range. A traditional /10 passive probe will have a 10 MOhm) input impedance at DC, however this impedance drops rapidly with frequency, passing below the input impedance of a transmission line probe at less than 100 MHz.
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SampleProtect -
Oxford Instruments plc
The SampleProtect measurement system is ready to go, and comes complete with Oxford Instruments’ Cryofree bottom loading cryostat – the OptistatDry BLV, Zurich Instruments’ MFLI Lock-in Amplifier, a specially designed ESD break-out box and high quality measurement grade cables. The patent-pending puck style mounting from Oxford Instruments provides safe installation of your samples. The MFLI 500 kHz Lock-in Amplifier (capable of 500 kHz demodulation as standard) with MF-MD multi-demodulator capability brings the benefits of high performance signal processing at low and medium frequencies. The differential voltage and current inputs of the MFLI are optimised for low noise operation and the high oversampling rate ensures an even better signal to noise ratio. Zurich Instruments’ unique LabOne® control software provides a toolset including an integrated oscilloscope, a spectrum analyser, a plotter and a parameter sweeper.
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LF1 set -
Langer EMV-Technik GmbH
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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MOS-01, -01A -
Compact Power Company
The MOS-01 manual oscillator module is used as a quality, general-purpose sinewave oscillator and digital readout monitoring system in the MAC-01, -02, or -03 AC Power Sources/Frequency Converters. The unit has guaranteed operating range of 20 HZ to 20 KHZ which is covered in three one-decade scales. The LCD digital metering system is switch-selectable to readout either frequency, voltage or current. A toggle switch selects the input for the attached AC Power Source/Frequency Converter to originate from the manual oscillator itself or from an external laboratory or programmable oscillator source. With oscillator mode switch in Internal position, the BNC connector delivers the signal to drive additional slave units or for oscilloscope sync or monitoring. BNC input/output is completely isolated with 1500 VAC breakdown and excellent common mode rejection. The oscillator modules must be factory installed and calibrated.
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MC142 -
Powertek LLC
Multifunction calibrator MC142 is a precision voltage, current and power calibration source serving as a measurement standard in calibration laboratories and production lines; where verification of electrical measurement equipment & sensors is required. It can be used for calibration and adjustment of meters measuring voltage, current, power, resistance, capacitance and frequency. Internal harmonic and non-harmonic signals make it possible to test electrical performance of meters using signals with various crest factors. Frequency modes enable selection of frequency, amplitude and duty cycle of the output signal. These are suitable for basic calibration of digital and analog oscilloscopes along with transient recorders. The calibrator is equipped to measure temperature with TC and RTD temperature sensors. Its built-in multimeter can be used independently or simultaneously with the calibrator output. Testing of transducers of various types, regulators and sensors can be performed, without the necessity to use any other measuring instrument.
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RF2 set -
Langer EMV-Technik GmbH
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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RF6 set -
Langer EMV-Technik GmbH
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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63800 series -
Chroma ATE Inc.
The Chroma 63800 Loads can simulate load conditions under high crest factor and varying power factors with real time compensation even when the voltage waveform is distorted. This special feature provides real world simulation capability and prevents overstressing thereby giving reliable and unbiased test results. The 63800's state of the art design uses DSP technology to simulate non-linear rectified loads with its unique RLC operation mode. This mode improves stability by detecting the impedance of the UUT and dynamically adjusting the load's control bandwidth to ensure system stability. Comprehensive measurements allow users to monitor the output performance of the UUT. Additionally, voltage & current signals can be routed to an oscilloscope through analog outputs. The instrument's GPIB/RS232 interface options provide remote control & monitor for system integration. Built-in digital outputs may also be used to control external relays for short circuit (crowbar) testing.
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TLP-3010C -
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV*High pulse output current up to ±30 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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TLP-4010C -
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±10 kV*High pulse output current up to ±40 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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Razor Express 12 CompuScope - PCIe -
GaGe
Available in 4-CH and 2-CH models featuring 17 software selectable A/D sampling rates from minimum 1 kS/s to maximum 200 MS/s per channel with input bandwidth of 125 MHz. ADC data can be captured in quad, dual, or single channel modes. Full-featured front-end with software selectable DC/AC coupling and 50Ω / 1MΩ inputs. Ease of integration with External or Reference Clock In & Clock Out. External Trigger In & Trigger Out with advanced triggering operations. PCIe Gen2 x8 data streaming rates at 1.6 GB/s. Programming-free operation with GaGeScope PC oscilloscope software. Software Development Kits available for C/C#, LabVIEW and MATLAB for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.
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Oscar Express 16 CompuScope - PCIe -
GaGe
Available in 4-CH and 2-CH models featuring 16 software selectable A/D sampling rates from minimum 1 kS/s to maximum 100 MS/s per channel with input bandwidth of 65 MHz. ADC data can be captured in quad, dual, or single channel modes. Full-featured front-end with software selectable DC/AC coupling and 50Ω / 1MΩ inputs. Ease of integration with External or Reference Clock In & Clock Out. External Trigger In & Trigger Out with advanced triggering operations. PCIe Gen2 x8 data streaming rates at 800 MB/s. Programming-free operation with GaGeScope PC oscilloscope software. Software Development Kits available for C/C#, LabVIEW and MATLAB for custom application development. Ideal for applications such as Automatic Test Equipment (ATE), Wideband RF Signal Analysis & Recording, RADAR, Electronic Warfare (EW), Ultrasonic Non-Destructive Testing (NDT), LIDAR, Communications, Spectroscopy, High-Performance Imaging, Time of Flight (TOF), Life Sciences, Particle Physics, and more.
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KHA3000 -
Kikusui Electronics Corp.
KHA3000, in addition to the complied standards and features of the KHA1000 (dedicated for single phase), is equipped for the harmonic and flicker compliance test exceeding 16A of the single-phase and three-phase equipment. With this unit alone, you can take highly accurate simultaneous three-phase measurements up to 40A/phase*. Furthermore, the KHA series is compliant with two measurement technique standards, the existing and the latest versions, so you can simply select to take measurements for the latest standard including interharmonics and for the conventional integral multiple harmonics without using any other device. In addition to the real-time display that can be used like an oscilloscope and FFT analyzer, the unit offers the real-time judgment of compliance with standards. Using this unit alone, you can judge test results and prepare result reports without the use of a PC. On top of that, you can easily set up a test system by combining KHA3000 with an AC power supply (PCR-LA Series) and a line impedance network (LIN40MA-PCR-L).
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XF1 set -
Langer EMV-Technik GmbH
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
