Particle Impact Noise Detection
vibration, shock, and acoustics testing conducted to find particulate contamination.
See Also: Particle Impact Noise Detectors, PIND
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Product
Particle Impact Noise Detection
BW-LPD-DAQ4000
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Computer based controller with predefined MIL-STD test sequences stored (New)Create unlimited custom tests with multiple vibration frequencies and acceleration and other parameters to meet unique requirements (New)
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Product
Particle Impact Noise Detection (PIND) Test
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This test detects the presence of free moving particulate contaminants within sealed cavity devices. This test is specifically directed toward relays and other devices where internal mechanism noise makes rejection exclusively by threshold level impractical. This test method also may be used prior to final sealing in the manufacturing sequence as a means of eliminating loose particles from the interior of the device.
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Product
Alpha Particle Counting System
UltraLo-1800
Particle Counting System
The UltraLo-1800 is a best-in-class alpha particle counting system. Our patented design reduces background rates by 50x compared to conventional systems.
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Product
High-Current, Ultra-Low Noise Filter, 21 V / 500 MA, 10 Ω
N1298A
Noise Filter
The N1298A Series is a collection of low noise filters for the Keysight B2960 Series 6.5-digit low noise source.
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Product
SNS Series Noise Source 10 MHz to 26.5 GHz (ENR 15 dB)
N4002A
Noise Source
The SNS series N4002A noise source was designed to measure DUT noise figures reliably and accurately up to 30 dB from 10 MHz to 26.5 GHz.
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Product
Noise Source, 10 MHz to 18 GHz, nominal ENR 6 dB
346A
Noise Source
The Keysight 346A noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 18 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. The very small change in reflection coefficient (<0.01) from ON to OFF is designed especially for accurate characterization of input-impedance-sensitive devices (like GaAsFETs and many UHF amplifiers).
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Product
Noise Source, 1 GHz up to 40 GHz
346CK40
Noise Source
The Keysight 346CK40 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 40 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source greatly reduces measurement uncertainty, which are commonly reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 14 dB at 1 GHz, decreasing to 5 dB at 40 GHz (typical).
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Product
USB Smart Noise Source, 500 MHz To 50 GHz, 5 DB ENR Nominal
U1832C
Noise Source
The USB-powered (USB TMC compliant) U1832C provides broadband noise figure measurements from 500 MHz – 50 GHz with modular signal analyzer, benchtop X-Series signal analyzers and Fieldfox
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Product
Phase Noise Analyzer and VCO Tester
FSWP
Phase Noise Analyzer
The R&S®FSWP phase noise analyzer and VCO tester features very high sensitivity thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise and amplitude noise in mere seconds on highly stable sources such as those in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.
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Product
Advanced Low-Frequency Noise Analyzer
E4727B
Low-Frequency Noise Analyzer
Get a deeper, closer look at low frequency noise with the A-LFNA integrated with WaferPro Express, featuring data analysis, wafer prober control and test suite automation.
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Product
SNS Series Noise Source 10 MHz to 18 GHz (ENR 15 dB)
N4001A
Noise Source
The SNS series N4001A noise source is ideal for general purpose use with a low reflection coefficent and a nominal ENR of 15 dB from 10 MHz to 18 GHz.
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Product
Noise Source, 1 GHz up to 50 GHz
346CK01
Noise Source
The Keysight 346CK01 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 50 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty, which are reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 20 dB at 1 GHz, decreasing to typically 7 dB at 50 GHz.
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Product
Noise Source Test Set, 10 MHz to 26.5 GHz
N2002A
Noise Source
The N2002A noise source test set is a low cost, stand-alone instrument that, as part of a calibration system, enables fast, repeatable calibrations with minimal levels of uncertainty.
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Product
Phase Noise Analyzer and VCO Tester
FSPN
Phase Noise Analyzer
The R&S®FSPN phase noise analyzer and VCO tester is designed to provide both very high sensitivity and measurement speed for production and design engineers working in these fields characterizing sources such as synthesizers, VCOs, OCXOs, and DROs. It is the ideal instrument for demanding development and production phase noise and VCO analysis.
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Product
Millimeter-Wave Noise Source, R-band, 26.5 to 40 GHz
R347B
Noise Source
The Keysight R347B noise source covers a 26.5 to 40 GHz frequency range. This waveguide noise source allows you to make accurate and convenient noise figure measurements on millimeter-wave devices. The R347B provides highly precise broadband noise at the input of the system or component under test. The noise figure meter then processes the ON/OFF ratio of noise power present in the system IF, and provides an accurate reading of noise figure and gain. The R347B noise source has remarkable ENR stability over time, which allows longer recalibration cycles and more accurate noise figure measurements.
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Product
Millimeter-Wave Noise Source, Q-band, 33 To 50 GHz
Q347B
Noise Source
The Q347B waveguide noise source (33 to 50 GHz frequency range), allows you to make accurate noise figure measurements on millimeter-wave devices...
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Product
6.5-Digit Low Noise Power Source, 32 W, 210 V, 3 A, 2-Channel
B2962B
Low Noise Power Source
The Keysight B2961B Series 6.5-digit low noise source power supplies provide a power supply and source solution that meets the difficult measurement challenges researchers, designers, and developers face working on advanced components, circuits, and materials.
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Product
Particle Impact Detection System 10
BW-LPD-DAQ4000HD
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This system is capable of vibration testing up to 10 pounds and detecting defects that produce noise, such as loose screws, particles, etc. Right from the start of PIND testing, B&W patented the first MIL-STD compliant system outperforming the competition by over 30% better detection rate as tested by the NBS (now National Institute of Science and Technology) in a well known 1978 study (NBSIR 78-1590 NASA).
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Product
Noise Source, 10 MHz to 18 GHz, nominal ENR 15 dB
346B
Noise Source
The Keysight 346B noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 18 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. The 346B's high ENR, low SWR, and variety of connectors make it a general-purpose noise source. Add special option H01 for high ENR (21 dB typical) to measure high noise figure devices, or option H42 for measuring Direct Broadcast Satellite (DBS) low noise block converters.
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Product
Low-Noise Filter, 210 V / 3 A
N1298C
Noise Filter
The N1298 Series power source accessories are a collection of low noise filters for the Keysight B2960 Series precision source / measure units (SMUs).
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Product
USB Smart Noise Source, 10 MHz to 26.5 GHz, Nominal ENR 15 dB
U1831C
Noise Source
The USB-powered U1831C provides broadband noise figure measurements from 10 MHz – 26.5 GHz with modular signal analyzer and benchtop X-Series signal analyzers.
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Particle Sizing
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Ideal for particle shape and size analysis of powders and bulk solids as well as emulsions and suspensions.
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Product
Particle Analyzers
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Teilch Particle Analyzers have proven significant advantages when compared to competitors’ solutions. Innovations in light source, flow control, analog and digital signal processing, components integration and software allow Teilch to provide a state of the art system for precision particle analysis.
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Product
Impact Hammer
5111, 5112, 5113
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The Impact Hammer simulates mechanical impact to the surface of the enclosures of electrical appliances and components.
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Product
Pendulum Impact Testers
MPX
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Delivering precision and safety in high-volume materials testing, the MPX pendulum impact system from Instron is optimized for Charpy and Izod testing of metals. Equipped with Bluehill Impact software, it supports capacities from 300 J to 900 J and features motorized hammer lift, automatic return, and interchangeable hammer weights. An enclosed, interlocked safety guard ensures operator protection in compliance with CE and ISO 13849 standards. The system supports key standards including ASTM E23, ISO 148, EN 10045, and others, while offering configurable reports and seamless data export capabilities.
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Noise Sources
WGNS
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The system allows the user to extend the frequency range of the NFA to allow for accurate noise figure measurements to be performed on a device operating in the 26.5 – 170GHz range on wafer as well as in benchtop applications. Farran offers the WGNS series of noise sources to be used in conjunction with the FBC down converters for use as frequency extenders for noise figure measurement test system.
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Impact Hammers
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A hammer equipped with a piezoelectric force sensor and serves to stimulate a structure that is to be examined.
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Product
Ultra-Low Noise Filter, 42 V / 105 MA, 50 Ω
N1298B
Noise Filter
The N1298 Series is a collection of low noise filters for the Keysight B2960 Series 6.5-digit low noise source.
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Product
Particle Size Analyzer
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An analytical instrument used to measure the size distribution, shape, and count of particles within a liquid or powder sample.
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Product
Particle Solutions
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Brookhaven Instruments Corporation
Particle Solutions software is used with the NanoBrook family of Particle Size and Zeta Potential Analyzers and has been updated with a new intuitive user interface and advanced features for those looking to get the most out of their measurements.
