Particle Impact Noise Detection
vibration, shock, and acoustics testing conducted to find particulate contamination.
See Also: Particle Impact Noise Detectors, PIND
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Product
Particle Impact Noise Detection (PIND) Test
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This test detects the presence of free moving particulate contaminants within sealed cavity devices. This test is specifically directed toward relays and other devices where internal mechanism noise makes rejection exclusively by threshold level impractical. This test method also may be used prior to final sealing in the manufacturing sequence as a means of eliminating loose particles from the interior of the device.
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Particle Impact Noise Detection
BW-LPD-DAQ4000
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Computer based controller with predefined MIL-STD test sequences stored (New)Create unlimited custom tests with multiple vibration frequencies and acceleration and other parameters to meet unique requirements (New)
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Product
Alpha Particle Counting System
UltraLo-1800
Particle Counting System
The UltraLo-1800 is a best-in-class alpha particle counting system. Our patented design reduces background rates by 50x compared to conventional systems.
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Noise Source, 1 GHz up to 50 GHz
346CK01
Noise Source
The Keysight 346CK01 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 50 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty, which are reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 20 dB at 1 GHz, decreasing to typically 7 dB at 50 GHz.
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Product
Noise Source, 10 MHz to 18 GHz, nominal ENR 15 dB
346B
Noise Source
The Keysight 346B noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 18 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. The 346B's high ENR, low SWR, and variety of connectors make it a general-purpose noise source. Add special option H01 for high ENR (21 dB typical) to measure high noise figure devices, or option H42 for measuring Direct Broadcast Satellite (DBS) low noise block converters.
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Product
Phase Noise Analyzer and VCO Tester
FSPN
Phase Noise Analyzer
The R&S®FSPN phase noise analyzer and VCO tester is designed to provide both very high sensitivity and measurement speed for production and design engineers working in these fields characterizing sources such as synthesizers, VCOs, OCXOs, and DROs. It is the ideal instrument for demanding development and production phase noise and VCO analysis.
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Product
Noise Source, 10 MHz to 18 GHz, nominal ENR 6 dB
346A
Noise Source
The Keysight 346A noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 18 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. The very small change in reflection coefficient (<0.01) from ON to OFF is designed especially for accurate characterization of input-impedance-sensitive devices (like GaAsFETs and many UHF amplifiers).
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Noise Source Test Set, 10 MHz to 26.5 GHz
N2002A
Noise Source
The N2002A noise source test set is a low cost, stand-alone instrument that, as part of a calibration system, enables fast, repeatable calibrations with minimal levels of uncertainty.
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Product
Noise Source, 1 GHz up to 40 GHz
346CK40
Noise Source
The Keysight 346CK40 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 40 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source greatly reduces measurement uncertainty, which are commonly reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 14 dB at 1 GHz, decreasing to 5 dB at 40 GHz (typical).
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Product
Ultra-Low Noise Filter, 42 V / 105 MA, 50 Ω
N1298B
Noise Filter
The N1298 Series is a collection of low noise filters for the Keysight B2960 Series 6.5-digit low noise source.
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Product
Noise Figure Analyzer, Multi-touch, 10 MHz to 3.6 GHz
N8973B
Low-Frequency Noise Analyzer
The N8973B high performance noise figure analyzer is designed to make fast, accurate and repeatable noise figure measurements. When paired with an SNS Series noise source and U7227 Series USB preamplifier the ENR data from the SNS and USB preamplifier data automatically downloads into the N8973B.
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Noise Figure Analyzer, Multi-touch, 10 MHz to 40 GHz
N8976B
Low-Frequency Noise Analyzer
The N8976B high performance noise figure analyzer is designed to make fast, accurate and repeatable noise figure measurements. When paired with an SNS Series noise source and U7227 Series USB preamplifier the ENR data from the SNS and USB preamplifier data automatically downloads into the N8976B.
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Low-Noise Filter, 210 V / 3 A
N1298C
Noise Filter
The N1298 Series power source accessories are a collection of low noise filters for the Keysight B2960 Series precision source / measure units (SMUs).
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Product
SNS Series Noise Source 10 MHz to 18 GHz (ENR 15 dB)
N4001A
Noise Source
The SNS series N4001A noise source is ideal for general purpose use with a low reflection coefficent and a nominal ENR of 15 dB from 10 MHz to 18 GHz.
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Product
6.5-Digit Low Noise Power Source, 32 W, 210 V, 3 A, 2-Channel
B2962B
Low Noise Power Source
The Keysight B2961B Series 6.5-digit low noise source power supplies provide a power supply and source solution that meets the difficult measurement challenges researchers, designers, and developers face working on advanced components, circuits, and materials.
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Product
Particle Impact Detection System 10
BW-LPD-DAQ4000HD
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This system is capable of vibration testing up to 10 pounds and detecting defects that produce noise, such as loose screws, particles, etc. Right from the start of PIND testing, B&W patented the first MIL-STD compliant system outperforming the competition by over 30% better detection rate as tested by the NBS (now National Institute of Science and Technology) in a well known 1978 study (NBSIR 78-1590 NASA).
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Noise Figure Analyzer, Multi-touch, 10 MHz to 26.5 GHz
N8975B
Low-Frequency Noise Analyzer
The N8975B high performance noise figure analyzer is designed to make fast, accurate and repeatable noise figure measurements. When paired with an SNS Series noise source and U7227 Series USB preamplifier the ENR data from the SNS and USB preamplifier data automatically downloads into the N8975B.
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Product
SNS Series Noise Source 10 MHz to 18 GHz (ENR 6 dB)
N4000A
Noise Source
The SNS series N4000A noise source is designed for accurately measuring devices with low noise figure, with a frequency range of 10 MHz to 18 GHz and nominal ENR 6 dB.
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Particle Impact Noise Detector
BW-LPD-D4000
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FREQUENCY: SINE WAVE 27Hz TO 265HzACCELERATION: 0 TO 20G PEAKSHAKER: 100 FORCE LBS 3/4" IN STROKE 75 IN PER/SEC VELOCITYAMPLIFIER: 250 WATTS MINIMUMD.U.T. WEIGHT: 300 GRAMS PRACTICAL LIMIT @ 20G
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Impact Testing
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When you need to evaluate how your product & materials react to shock loading, Trialon is here to help. By utilizing our laser-aiming test stand to create consistent positioning and ball impact, you can trust that Trialon has the equipment and personnel to conduct your test accurately and timely.
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Impact Hammers
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A hammer equipped with a piezoelectric force sensor and serves to stimulate a structure that is to be examined.
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Phase Noise Test System
N5511A
Phase Noise Analyzer
The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
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Impact Tester - Impact Testing Machine
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Impact tests are used to measure the resistance to failure of materials to a suddenly applied force. The test measures the impact energy, or the energy absorbed prior to fracture. ToronTech™ offers advanced Impact testing machines to measure that energy through drop weigh tear test and Charpy impact test. We also offer machines for the preparation of specimens for these tests.
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Particle Counters
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Testing and monitoring airborne particles in critical environments is incredibly important. That’s why Kanomax has dedicated itself to developing the best particle counting and monitoring instruments on the market. Perfect for cleanroom monitoring, mining environments, and engineering sites, our particle counters provide flexibility, and most importantly accuracy.
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Radiation Detection
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Nuclear and radiological materials are of particular concern because of their potential to harm large numbers of people and disrupt the global economy.
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Air Particle Counters
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These air particle counters can measure particle in air, with airflow 2.83L/min and 28.3L/min large air flow .
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Metal Detection
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The Elcometer Metal Detection range includes Valve Box Locators that are rugged and simple to use making them the ideal choice for all location work in all types of terrain.
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Magnetic Particle Inspection
NDT
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DCM Tech offers a comprehensive selection of Magnetic Particle Inspection machines for non-destructive testing (NDT). Easily and quickly detect internal and subsurface damage on critical parts. Contact DCM to speak to your regional Technical Specialist about adding an MPI to your shop.
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Film Impact Tester
DRK136B
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Shandong Drick Instruments Co., Ltd.
DRK136B Film Impact Tester is applicable in the precise impact resistance test of plastic films, sheets, laminated films, rubber and other nonmetal material.
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Reticle/Mask Particle Remover
RP-1
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The RP-1 automatically removes particles from the reticle/mask by air (or N2) and vacuum suction. Routinely removing the particles before the lithography process extends the replacement cycle of the pellicle and cleaning cycle of the mask, thereby contributing to a reduction in running costs.
