In-circuit Emulators
test to validate circuit.
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems, ICE
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In-Circuit Emulator
DS-51
* Real-Time and Transparent In-Circuit Emulator * Supports Most of the 8051 Derivatives * Emulates 1.5V to 6V Microcontrollers * Maximum Frequency of 42MHz * 64K/512K of Internal Memory with Banking Support * 32K Trace Memory "on the Fly" * 64K Hardware and Conditional Breakpoints * MS-Windows and Keil ?Vision Debuggers * Source-Level Debugger for Assembler, PLM and C * On-Line Assembler and Disassembler * Performance Analyzer * Serially linked to IBM PC at 115 Kbaud
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In-Circuit Emulator
DS-251
# Real-Time and Transparent In-Circuit Emulator for 251s# Uses Intel and Atmel Licensed Bondout Technology# Standard 256K Emulation Memory# Real-Time Trace up to 128K Frames Deep, 128 Bits Wide# Complex Hardware Breakpoints# Supports Both Binary Mode and Source Mode# MS-Windows Debugger# High-Level Support for Popular C-Compilers# Full Support of Local and Global Variables# On-Line Assembler and Disassembler# Performance Analyzer
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Microprocessor Development System
DS-M8
# Real-Time and Transparent In-Circuit Emulator# Supports PIC12xxx, PIC14xxx, PIC16xxx, PIC17xxx and others# Uses Microchip Bond-Out Technology# Maximum Frequency Support# Standard 64Kx16 Emulation Memory# 32Kx48 Real-time Trace with Filters and Triggers# 64K Hardware Breakpoints with External Signals# Memory Mapping Capabilities# Software for MS-Windows# Source-Level Debugger for C and Assembler
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Microprocessor Development System
DS-85
* Real-Time and Transparent In-Circuit Emulator * Windows Debugger - Update 2009 * Symbolic Debugger compatible with Intel Object Files * 64K Hardware Breakpoints * 64K of Internal Memory * 32K x 32 Bit Trace Memory and Logic Analyzer with External Probes * Serially linked to IBM PC or Compatible Hosts * On-line Assembler and Disassembler * Source and Listing Windows
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Microprocessor Development System
DS-48
# Real-Time and Transparent In-Circuit Emulator# Supports Philips Telecom Derivatives# Adaptable to 8051 Derivatives# Emulates 1.5V to 6V Microcontrollers# Maximum Frequency of 40MHz# 8K of Internal Memory# DOS and MS-Windows Debuggers# 32K Trace Memory and Logic Analyzer "on the Fly"# 8K Hardware and Conditional Breakpoints
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In-Circuit Emulator - 80C186/80C188 Family
DS-186
* Support for 80C186/8/XL/EA/EB/EC, 8086/8, V20/25/30/40/50 and other Microprocessors * Full-speed Emulation up to 25MHz * 1MB of Zero-Wait-State Mapped Memory * 8K x 32-bit Frames Dynamic Trace Buffer * 1MB Hardware Breakpoints * 115 KBaud RS-232 Communication Link * Numeric Coprocessor Support * OMF Converter * Support for Borland, Microsoft and Intel Compilers * Full Support for C, C++, Pascal and Assembler
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In-Circuit Emulator
DS-XA
* Emulates XA Derivatives * 2MByte Code and Data Memory * Memory With Mapping Capabilities * Real-Time Trace * Frequency Range up to 30MHz @ 5V * Source-Level Debugger For C And Assembler * MS-Windows Debugger Software for Windows NT and 95 or Later * 3.3V And 5V Emulation Support * Support for ROMless and ROM Microcontrollers * PLCC Emulation headers
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4-Module ICT System, I307x Series 6
E9903G
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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In-line High-Density ICT System Series 7i
E9988GL
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Medalist i1000D
U9401B
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Mini In-Circuit Test System
U9403A
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Emulator
Is an advanced on-chip debugging emulator and flash programmer developed with the concept of greater efficiency in development. The combination of its high-speed downloading and various software and hardware solutions will contribute to reducing development times.
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In-circuit Test
Medalist i1000 Systems
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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In-Circuit Testing
If you are looking for in-circuit test applications, equipment or advice, our experienced engineers can help you. Whatever your fixturing requirements or special software features, our long history of work in this field means that we have probably seen and done it before.
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In-Circuit Tester
Eagle MTS180
The Eagle offers low testing cost for high volume with even the most complex fixture applications. Equipped with a Press-Down-Unit and a combination of analog and hybrid In-Circuit test pins, the MTS180 is in a class for its own. Furthermore, the tester can be equipped with functional test modules to provide even higher fault coverage and thus satisfy the test requirements of a larger number of customers.
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JTAG Emulator
Blackhawk USB510L
The Blackhawk USB510L JTAG emulator is low cost, and has a USB powered interface.
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Channel Emulator
ACE9600
The dBm Advanced Channel Emulator (ACE) is the most advanced non-terrestrial RF channel emulation solution to date. The emulated impairments include delay, signal Doppler, attenuation, phase offset, AWGN, frequency hopping, payload and multipath fading. The instrument can house up to four 600 MHz instantaneous bandwidth channels.
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eNodeB Emulator
The eNodeB Emulator includes UE simulation, and can be used to test the complete LTE Packet Core or individual Core Network elements, MME, SGW, PGW. It implements all the required protocols - S1AP/SCTP to communicate with MMEs over S1-MME interface and GTP-u to communicate with S-GW over S1-U interface.
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In-circuit ESR Meter
Capacitor Wizard
The Capacitor Wizard® finds bad capacitors IN CIRCUIT by measuring a capacitor's ESR (equivalent series resistance). A good capacitor should have very low ESR. Weak and bad capacitors have much higher ESR. The Capacitor Wizard® will SPEED UP YOUR REPAIR.
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Expanding In-Circuit Capabilities
Circuit Check supports reading linear bar codes and 2D symbols within each of its fixture product lines.When spring-loaded probes are not practical or access is limited, Circuit Check can help you with thru-connector tests to contact connectors on any surface or edge of a circuit board. These tests can be implemented spring probes, mating connectors, sacrificial SMT connectors, and stabber cards.
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Network Emulator
With Simnovus Network Emulator, it is easy to validate if your device works on networks across any region in the world under different network configurations. It supports carrier bandwidth up to 100MHz and frequency ranges from 70MHz to 6GHz for both FDD and TDD. And thanks to the software-based radio (SDR) design, you can also verify custom bands including CBRS.
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In-Circuit Tester
Omega MTS888
With the continuous and fast pace of development in the electronic manufacturing the time from design to production is a critical factor for success or failure of a product. The time from design to test is a major part of this process. The high performance tester from Digitaltest, the MTS888 Omega, has been designed to speed up this process.
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Terminal Emulator
Distinct IntelliTerm
Distinct IntelliTerm is a terminal emulator that allows you to access data on diverse corporate information servers such as IBM mainframes, IBM AS400, UNIX and VAX systems from a single application. It includes full featured terminal emulation for TN3270E, TN3270 for Type 3278 and 3279, with support for 3179G, 3192G, 3472G and 3279 S3G graphics, TN5250 and VT52 through VT420. Distinct IntelliTerm operates over the Telnet protocol running over TCP/IP, an area in which Distinct is a market leader. Distinct IntelliTerm integrates related utilities such as multi-connect FTP with SOCKS proxy support, print server support with LPD and 3287 printing support, substantially reducing your training and support costs.
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EPC Emulators
The EPC Emulators consist of the MME Emulator, HSS Emulator, SGW Emulator, PDN-GW Emulator, and the PCRF Emulator, which can be used together to simulate the complete LTE Packet Core or individually to create a combination of real and simulated Core Network elements. These Emulators includes all the network interfaces and implements all the communication protocols required for core network equipment to operate in an LTE/SAE network.
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In-Circuit Programmer/Loader
SKU-018-01
The In-Circuit Programmer/Loader (“EasyLoader” or “eLoader”) is a standalone device that was designed to provide a flexible and cost-effective solution for electronic device manufacturers, as well as for hardware design companies and their customers. It allows you to upgrade code on any JTAG/SPI/I2C compliant device (like FPGA/CPLD/EEprom/Flash, etc.) or Microcontrollers at any time of development, testing or production.
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Emulators
High fidelity DC power system and motor drive inverter testing is made achievable with the use of advanced power emulation.
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Host emulator
E84
Precision Development Consulting Inc
A USB controlled and self-powered emulator for functional testing SEMI E84 implementations. (E84-1000) This was developed because there was nothing like it in the marketplace, and it was clearly needed. This product enables a factory automation engineer to perform E84 functional testing anywhere in the world. Weighing less than 5oz, it is neither a burden, nor a power hog. You will never need to look for an additional power receptacle in the fab. The emulator gives the user full control over the sequence so that any test can be performed. Existing products were large and unwieldy, and provided canned tests that could not be modified to meet the requirements that Fab managers impose on their suppliers.
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Air Interface Emulator
Becker Nachrichtentechnik GmbH
With help of air interface emulators radio field propagations can be emulated reproduceable in laboratory environments. For different applications like cellular, wireless networks or broadcast several types of devices are available.
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Digital In-Circuit tester
MTS180/300
Analog in-circuit inspection and function inspection are realized on this inspection equipment. IC pin float function is standard equipment. The MTS180 is a press type jig, and the MTS300 is a vacuum type jig. In the board mounting process at the production site, electrical inspection is performed on the mounted board after component mounting, and non-defective or defective products are automatically judged. The main inspection contents are short / open inspection, analog inspection of resistors, capacitors, coils, diodes, etc., lead floating voltage measurement of QFP and BGA, Digital IC inspection, frequency measurement.




























