Environmental Test
for temperature cycling, humidity, salt spray, shock, vibration, random vibration, altitude and acceleration.
See Also: Environmental, Environmental Chambers, Environmental Testing Services, Environmental Test Services
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Environmental Control Units
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Our systems are there when you need them most. Often forgotten, our Chemical, Biological, Radiological, And Nuclear (CBRN) protection systems are essential in combat environments. This complex system functions as part of each vehicles life support system and is used in conjunction with vehicle HVAC systems or as a standalone system.
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Environmental Instrumentation
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A comprehensive selection of Environmental Instrumentation including hand held thermometers, Infrared thermometers, light meters and data loggers
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Environmental Stress Screening
ESS
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Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of your product.
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Product
Radio Frequency, Communications, & Navigation Test Systems
Test System
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Environmental Chambers
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Whatever your application, from an environmental chamber for small components to an extensive array for a complete automobile or aircraft test, EYE / Iwasaki has the experience to provide a solar lighting system customized for your requirements. Our systems are designed to be flexible and deliver the optimum solar simulation solution. We do not force-fit a "standard" system to attempt to meet your needs.
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SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
BMS Manufacturing Test System
Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Product
Memory Test System
T5801
Test System
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Environmental Data Recorders
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Whether sending a satellite into orbit or receiving a load of fresh produce, you need to know that your products will maintain their integrity during transit.
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Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Product
Environmental Noise Monitoring System
E-Box LIVE
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This is the ultimate solution to environmental noise monitoring. The LIVE comes equipped with a modem that connects directly to our Castle Cloud software allowing you to monitor your results from the comfort of your own desk. Combine this with the ability to customise your power supplies and you will see why this is the ultimate solution for environmental noise monitoring.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Parallel Electrode SMD Test Fixture
16192A
Test Fixture
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
Enlarge Environmental Chamber
REXMED REC-250
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MOD. REC-250, AC 230/380/415V, 1/3 phase, Environmental chamber, HS CODE: 841989, UNCCS CODE: 484384, UMDNS CODE: 16327, Main construction: SS304, Interior: SS304, Exterior: SS304 powder coated, Insulation: Rigid polyurethane foam and glass wool, Controller: Fix point PID controller, temperature ˚C/PV and ˚C/SV, humidity %/PV and %/SV display and setting, Temperature range: -20˚C~100˚C, Humidity range: 20%RH~98%RH, Constancy: ±0.3˚C ±2.5%RH, Uniformity: ±1˚C ±3%RH, Temperature and humidity sensor: PT 100Ω, Temperature and humidity audio and visual warning and OFFS correction setting, Temperature heater: 1.5KW X 2pcs, Humidity heater: 2.5KW X 1pc, Heat up transition time: -20˚C~100˚C within 35 min, Refrigeration system: Air cooled, single stage, Cooling compressor: Bristol hermetic compressor, Cooling capacity: 3,140 Watts, 10,700 BTU/hr, 2,702 Kcal/hr, Cool down transition time: 20˚C~-20˚C within 45 min, Safety devices: No fuse breaker, refrigerator over load relay, refrigeration high pressure switch, over temperature protector, protection relay, protection fuse, water level control and overheat protector, Chamber: L60 X W80 X H85cm, Capacity: 408L, chamber with key lock, with lamp (DC 12V 50W) X 1pcs and double glass viewing window, testing cable port with cover: Ø25mm, 4 castors, W/S: shelf X 2pcs, standard testing wet cloth X 5pcs, PCV water container X 1pc
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Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
Test System
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Product
Walk-in Environmental Chamber for Temperature Humidity Test
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's walk-in environmental chamber for temperature humidity testing is perfectly meet the large size test application that require high temperature and high humidity. The walk-in chamber is constructed with structural steel, so it is able to test the large components and products. Various optional function available for different test standard and requirement.
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Product
End of Line Test System for Automotive Seats
AS519
Test Platform
AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
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Test Platforms
Test Platform
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Electromagnetic Environmental Effects
EEE
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Electromagnetic Environmental Effects Services provides engineering design and test implementation for Electromagnetic Interference and Compatibility (EMI/EMC), along with TEMPEST capabilities certified under the National Security Agency (NSA) TEMPEST Endorsement Program.
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Product
EVSE Test Platform
Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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Environmental Conditioning Units
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CSZ's environmental conditioning units are designed to create temperature and humidity controlled climates inside a digital printing press. This controlled environment was required to maintain consistent conditioning of printing press components in order to achieve high quality printed material.
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Product
Bench Top Temperature Environmental Chamber
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Burnsco Environmental Test Chambers
Our compact bench top chamber is ideal for prototype testing, life testing, and quality and durability testing . Its small footprint and comparatively large volume make it ideal in labs where space is a premium.
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Environmental Monitors
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The tools and techniques designed to observe an environment, characterize its quality, and establish environmental parameters, for the purpose of accurately quantifying the impact an activity has on an environment.
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Environmental Vibration Testing
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Whether for independent monitoring or just adding additional channels to an existing vibration controller, the m+p Analyzer real time analyzer provides an ideal solution for measuring vibration and other responses during a shaker test or with shock machines. All test modes allow in-parallel throughput to disk recording so that the raw sample data is available for post-test analysis.
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Reach-In Temperature Environmental Chamber
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Burnsco Environmental Test Chambers
Our popular reach-in chambers have been designed for maximun testing flexibility while remaining a standard, cost saving unit.
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.





























