JTAG Emulators
Exercise a processor's (DUT) on-chip debug services to perform JTAG emulation and debug.
See Also: JTAG, JTAG Controllers, JTAG Debuggers, iJTAG, P1687
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Low Cost Emulator
EB-XAG49
* Emulates P51XG49 Microcontrollers * Real-Time Operation up to 30MHz * 3.3V or 5V Voltage Operation * Source-Level Debugger for C and Assembler * MS-Windows Debugger Software * Reduced Set of C-Compiler and Assembler * Support for ROMless and ROMed Microcontrollers * 64K of Code Memory * Performance Analyzer * Real-Time and Conditional Breakpoints * 44-pin PLCC Emulation Header and Signal Testpoints * Serially Linked to IBM PC at 115 Kbaud
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Emulates Dallas Semiconductors DS89C420
FE-C420
* Emulates Dallas Semiconductors DS89C420 * 16K Code Memory * Real-Time Emulation * Frequency up to fmax at 3V and 5V * ISP Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Emulates Atmel T89C51RD2 in 68-PLCC package
FE-51RD2\68P
* Emulates Atmel T89C51RD2 in 68-PLCC package * 60K Code Memory * Real-Time Emulation * Frequency up to 20MHz/3V, 33MHz/5V * ISP and X2 Mode Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Aeronautical Ground Earth Station Emulator
GES
Square Peg Communications Inc.
Ground Earth Station (GES) emulator provides a simple and flexible means of testing the operation of Aeronautical Earth Stations (AESs) and end-to-end applications for the Inmarsat Classic Aero service, without the expense of airtime charges. It can be used to test basic AES functionality, including Aero I/H+ and Aero H voice calls, and data transfer applications such as ACARS.
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Develop - Simulate - Validate JTAG / IJTAG based IP
NEBULA
You, your vendors and your customers being able to use one common interface to control and observe on-chip IP, resources and instruments. The figure below shows an example IC. The new IEEE 1149.1-2013 standard supports an init-data register for configuring the analog paramaters of I/O as well as controlling on-chip PLLs. The standard further extends this by defining in BSDL user test data registers or 'scan chains'. These registers enable the ability of generic software to control and observe mission mode IP and instruments simply by describing the register interface in BSDL.
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Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces
JT 37x7/TSI
High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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Dual Mobile Comm DC Source w/ Battery Emulation, DVM
66319D
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections.
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Low Cost Emulator
EB-XAG3
# Emulates P51XG1/2/3x Microcontrollers# Real-Time Operation up to 30MHz# 3.3V or 5V Voltage Operation# Source-Level Debugger for C and Assembler# MS-Windows Debugger Software# Reduced Set of C-Compiler and Assembler# Support for ROMless and ROMed Microcontrollers# 64K of Code Memory# Performance Analyzer
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TAP Adapter for Corelis JTAG Controllers
Low Voltage Adapter
High technology, energy efficient, and small form factor products push JTAG interfaces to the limits; low power and high performance means low voltage, high speed, and high drive requirements. Building specialized interface circuits on product Printed Circuit Boards (PCBs) is inconvenient and costly—an out-of-the-box, external solution is needed.The Corelis Low Voltage adapter is an add-on accessory that provides existing scan controllers with an active, plug-in interface to access low voltage scan chains, without sacrificing performance.
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Emulators
Comware Technical Services, Inc.
Comware’s emulators replace your legacy system with modern hardware without changing the operating system and the application software.
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Emulation
Synopsys ZeBu® emulation system delivers the performance needed to make verification teams and software developers working on the most advanced chips successful. ZeBu emulation systems are modular, allowing users to deploy the capacity needed in a scalable and easily extensible fashion.
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Scienlab Regenerative 3‑Phase AC Emulator
SL1200A Series
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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JTAG Functional Test
JFT
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Dual Mobile Comm DC Source w/ Battery Emulation
66319B
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections. The Keysight 66319B dual output mobile communications dc source provides two outputs for testing both the main battery power and the battery charger circuitry, allowing customers to test phones and chargers with the same equipment. This feature helps save on rack space (2 outputs in a rack box) and eliminates the need for two separate power supplies.
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Network Emulator
KMAX
The KMAX network emulator helps network engineers test and measure performance in order to identify and remove defects. Network emulators turn well behaved development and test networks into the kind of slow, congested, and less-than-reliable services encountered on the internet. In addition, unlike the real internet, network emulators allow the operator to control these conditions so that products and apps can be subjected to controlled and repeatable tests, by routing selected packets through a series of impairment nodes.
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Network Emulation, Delay Simulation, Bandwidth Emulator & WAN Simulation
GigaNet System’s network emulation appliances provide precision, performance and predictability in your test infrastructure resulting in optimized system performance and robust system behavior under real world network conditions.
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PathWave BenchVue Advanced Battery Test And Emulation Software For A Single Instrument
BV9211B
Achieve higher accuracy, repeatability, and safety with an emulation based on a unique battery model. Your model will allow you to determine your device's power consumption, emulate an actual battery, and import existing battery models.
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Scienlab Regenerative DC Emulator
SL1800A Series
Keysight's SL1800A Scienlab Regenerative DC Emulator - High-Power Series enables users to emulate the large batteries in electric vehicles. The bidirectional power flow allows emulation of both power sourcing applications, such as traction inverter test, as well as power-absorbing (sinking) applications, such as EV charging. Being regenerative, the power absorbed is delivered back to the grid, saving on energy and cooling costs. The SL1800A Series is fully integrated with the SL1040A Scienlab Charging Discovery System. The SL1093A Scienlab Charging Discover Software fully automates DC charging applications to many different test standards. With bi-directionality, integrated DC voltage and current controllers, high dynamics, and its regenerative energy feedback capacity, the Scienlab Dynamic DC Emulator provides an all-in-one system for efficient and effective testing of the power electronic components in electric vehicles (EV) and electric vehicle supply equipment (EVSE).
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ABex Terminal Module for JTAG Technologies JT 37x7 BSCAN Cards
ABex TM-JT37x7
The ABex TM-JT37x7 is an ABex terminal module for the JTAG Technologies Boundary Scan Controller PXI/PXIe JT 37×7. In combination with the JT 2147/ABex from JTAG Technologies it integrates the POD functionality into the module.In combination with the PXI/PXIe JT 37×7 and the JT 2147/ABex it’s possible to connect up to four JTAG/Boundary Scan TAPs. All signal wires on the PCB are impedance controlled. In addition, all signals can be switched off via relays.
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JTAG 3rd Party Controller Support
Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Emulates Winbond W78ERD2
FE-WRD2
* Emulates Winbond W78ERD2 * 62K Code Memory * Real-Time Emulation * Frequency up to fmax at 5V * Windows Debugger For C/C++ And Assembler * 44-PLCC Emulation Header * Target Board and Programmer Included * RS-232 or USB Interface * 64K C/ASM and 8K C++ Included
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Scienlab Dual-Range Regenerative AC / Grid Emulator, 600 / 1200 VAC, 63 / 32.5 A, 90 KW / 135 KVA
SL1215A
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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High-Performance LAN & USB JTAG Controller
NetUSB II™
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires a controller with high performance specifications and diverse features.
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Regenerative AC Emulator, 600 VAC, 63 A, 30 KVA, 3‑Phase
SL1201A
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
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PathWave BenchVue Advanced Battery Test And Emulation
BV9210B
The BenchVue Advanced Battery Emulation Software helps determine your device's power consumption, emulate battery, and import existing battery models.
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JTAG Boundary-Scan Controller for PXI and PXI-Express 'Hybrid' Slots or Plug-In Controller for PXI-Express Peripheral Slot
JT 37x7/PXI
High speed and performance JTAG Boundary-scan controller for PXI and PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
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OC-3/STM-1 And OC-12/STM-4 Analysis And Emulation Card(w/ GigE And USB 2.0)
LightSpeed1000™
Voice, data, and video traffic is exploding as smartphones, IP TV, video streaming, and "cloud" based services takeoff. A majority of the backbone transport for these applications continues to be SONET and SDH optical transmission networks. A dominant protocol for IP transport is PoS (Packet over SONET) and another is ATM (Asynchronous Transfer Mode). Both schemes are packet based, with ATM using fixed size packets of 53 bytes called "cells", and PoS using variable packet sizes closely matching to Ethernet frames. GL's LightSpeed1000™ hardware platform (PCIe Card and USB Pod) is capable of OC-3/12 and STM-1/4 wire-speed processing on quad optical ports for functions such as wire-speed recording and wire-speed playback of Unchannelized and Channelized ATM, PoS, and RAW Traffic.
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PoE LLDP Emulation (PD) & Analysis for 802.3at & 802.3bt
The optional LLDP Emulation feature allows a PSA-3000, PSL-3424L, or PSL-3000 test port to behave just like an 802.3at or 802.3bt PD that uses LLDP to convey its power demands. 802.3 PoE LLDP is a special variant of LLDP protocol that involves handshakes and protocol timing between a PSE and a PD.
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Host emulator
E84
Precision Development Consulting Inc
A USB controlled and self-powered emulator for functional testing SEMI E84 implementations. (E84-1000) This was developed because there was nothing like it in the marketplace, and it was clearly needed. This product enables a factory automation engineer to perform E84 functional testing anywhere in the world. Weighing less than 5oz, it is neither a burden, nor a power hog. You will never need to look for an additional power receptacle in the fab. The emulator gives the user full control over the sequence so that any test can be performed. Existing products were large and unwieldy, and provided canned tests that could not be modified to meet the requirements that Fab managers impose on their suppliers.
