System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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LXI Function Card Carriers
ProDAQ 6100 Series
Ethernet-based LXI is changing the way engineers and scientists perform test and measurement and data acquisition. As more and more PCs ship without expansion slots, customers are faced with the problem of replacing their test and measurement and data acquisition equipment. Bustec believes in the power of distributed systems and the use of IEEE standards.
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LT-300A Aging-Life Test System For LED Luminaires
Hangzhou Everfine Photo-E-Info Co., LTD
LT-300A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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Material Testing Software
MS100
Sinowon Innovation Metrology Manufacture Ltd.
MS100 is professional software for material testing in windows system, it is able to conduct tensile, compression, bending, shearing, bonding strength, peeling, tearing and other tests for rubber, plastic, leather, metal, nylon line, fabric, paper, aviation, packaging, construction, petrifaction, electrician, vehicle and other materials.
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Multi Protocol Analyzer
LE-8200A
The LE-8200A is the top-level model of battery-powered communications protocol analyzer. The LE-8200A has an enlarged display in response to an increasing demand without degrading the excellent portability of the LE Series. It is ideal for development tests of communications systems and industrial equipment, as well as for after-sale services and communication trouble analysis.
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RF ATE
IFF-7300S Series IFF/Crypto/TACAN Automated Test System. IRIS 2000/IRS 1200 ATE Software Revision Service. RF Expansion Module (RFEM).
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Salt Spray Test Machine
YWX/Q-010
The Salt Spray Test Machine/Chamber is applicable to the salt spray corrosive test for the protection layer of components, parts, electronic and electrical parts and metal materials and industrial products. • The Salt Spray Test Machine is made of transparent materials so that the operator can see the tested sample in it and the spraying situation of the tested sample. • A waterproof structure is adopted between the chamber cover and chamber body, thus there is no salt spray overflow. ...show more -
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PCI High Density Pecision Resistor Card, 3-Channel, 4Ω To 2.97MΩ
50-298-151
The 50-298-151 is a high density programmable resistor card with 3 channels which can be set between 4Ω and 2.97MΩ with 0.25Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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5G Carrier Acceptance Test System
NetOp
R&S®NetOp is the leading platform for network operator device acceptance test, covering all leading tier 1 operators.As one-stop shop for Protocol, IMS, Data Performance, E911 GNSS the supported carriers include:North America: AT&T, Verizon Wireless, T-Mobile USLatin America: America MovilChina: China Mobile, China Unicom, China TelecomJapan: NTT DoCoMo, Softbank, KDDI
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PCI High Density Pecision Resistor Card, 9-Channel, 2Ω To 62.1Ω
50-298-111
The 50-298-111 is a high density programmable resistor card with 9 channels which can be set between 2Ω and 62.1Ω with 0.25Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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MXI Computerized Tomography (CT) Option
The Nordson TEST & INSPECTION µCT inspection option provides Computerized Tomography (CT) functionality to compliment the 2D X-ray investigations on Nordson TEST & INSPECTION X-ray inspection systems. It uses the superior, sub-micron feature recognition 2D x-ray images, that Nordson TEST & INSPECTION X-ray systems always provide, to produce the best CT models for 3D sample analysis, virtual micro-sectioning and internal dimensional measurements. It reduces the number of time-consumin...show more -
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Motor Test for Electric Scooters
*The performance data of electric motors, in the majority of all cases, is performed by a brake test. Power input is calculated from current and voltage. Torque and power output are measured with a brake. It is important to reach, for each point, a persistent temperature. In case of large outer rotor BLDC motors, which are usually used for electric scooters, this traditional procedure may take many hours to complete, and is very complicated. *For several years, an innovative motor tester of MEA ...show more -
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Advanced Power System - DC Power Supply, 20 V, 50 A, 1000 W
N6951A
When designing high performance ATE systems, there's an art to the tradeoffs you make when asked to "integrate fast and test faster within budget." That's why Keysight's N6900 Series DC power supplies are small, flexible and market-leading fast. And with our VersaPower architecture, you can tune the N6900 for the optimum balance of test coverage, quality and time.
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128 Channel Digital I/O Modular PXI Card
GX5733 Series
The GX5733 is a 3U modular digital I/O card that offers up to 128 I/O channels. Designed for ATE, data acquisition, or process control systems where a large number of discrete I/O channels are required, the GX5733 offers the highest channel density and flexibility in the industry for a single-slot, 3U PXI plug-in board. 96 channels support TTL levels and an additional 32 I/O channels can be customized by installing one of Marvin Test Solutions' GX57xx series I/O modules. Alternatively, the remaining port can be configured to support 32 TTL channels.
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Universal Testing Systems up to 100 kN (22,500 lbf) Force Capacity
3380 Series
The 3382A Floor Model Universal Testing System is ideal for tension and/or compression applications for tests up 100 kN (22,500 lbf); and provides simplicity, reliability, and affordability for heavy-duty quality control (QC) labs and production testing.
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DC Insulation Testing
Diagnostic insulation testing today represents over a hundred years of constant development. When Sydney Evershed pioneered the first insulation tests in the late 19th century, the only measurable values were insulation at 500 volts and a basic continuity check. However, measurement techniques have continuously evolved to keep pace with new insulation technologies. From electronic design and household wiring to generators and power transmission systems, all different kinds of insulation must operate at a safe minimum value.
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Press-type Vibration Tester
9363-PC-ESS
King Design Industrial Co., Ltd.
This machine complies with the IEC, JIS and other 5-100Hz low-frequency specifications; applied to test the post-assembly products at end of the production line. Use resonance amplification, the product’s flaws can be screened out in advance. The operation is convenient, fast and effective.Apply Japan-imported motor; durable and safe in operation.Bellow-type damper: use special damping material that can effectively absorb vibration; allowing the test to be performed without affecting floor structure.Motor drive system is embedded in the seat; good in vibration block-out; rigidity is strong. Follow specimen to design fixture.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wi...show more -
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Multiple-Bus Architecture Cable/Harness Test System
CKT1175-MBA
The CKT1175-MBA (for multiple-bus architecture) will provide seamless testing of electronic racks, panels and chassis containing passive and active components such as relays, solenoids, switches, circuit breakers, lamps and LED's, diodes, resistors, capacitors, etc. This functionality is made possible by a switching matrix that is up to 10 levels deep, plus a multiplexer that controls the various stimuli sources, instrumentation connections, and external energization outputs.
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PXI Resistor Module 2-Channel 2R to 65.5k
40-293-033
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Embedded Software
From basics like boot firmware, built-in-test, and operating system support to CERT bootloaders and intrinsic security, Abaco gives developers the tools to maximize their hardware investment and develop applications on a solid foundation.
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Ground Continuity Tester - 25, 30, 35 AMP
M25, 30, 35
Production / Quality Assurance Testing - Performs ground continuity tests in full compliance with BSI, VDE and IEC. Measures ground continuity from ground to the power cord ground pin of the DUT. Interface enables interconnection to any ROD-L Hipot & Leakage testers to form a complete automatic test system.
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Mechanical Creep and Rupture Testing Machine
MRC Series
Jinan Testing Equipment IE Corporation
MRC series mechanical creep and rupture testing machine with single-lever structure is designed for long-term creep and stress rupture test applications. The series mechanical creep and rupture testing system is mainly for the metallic materials under room or elevated temperature according to GB/T2039, GB/T 20120, EN ISO 204-2009 and ASTM E139. The creep and rupture testing machine can also maintain constant loads for extended periods of time. Through the mechanical advantage of the lever arm lo...show more -
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Multi-Purpose RF Test System
SPA1241
The S - Series multi-purpose RF test system can be used in many applications such as R&D lab, ATE factory testing, EMC testing, field testing, and general purpose RF design. The S - Series is a flexible alternative to expensive and bulky RF test equipment. As shown in the setup in the upper right the S-Series system can be utilized to simultaneously provide all RF functions using its 7 inch front panel display or can be connected to a larger monitor for ease of viewing multiple windows at the same time
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Wear Testing Machine
M-2000
Jinan Testing Equipment IE Corporation
Model M-2000 Wear Testing Machine is to be used test the anti-wear performance for metal and non-metal specimen under the sliding, rolling, and sliding-rolling condition. The Wear Testing Machine can also test various materials under dry-friction and wet-friction. The wear testing system can calculate friction work & friction coefficient by the data acquired. The Wear Testing Machine is widely used in universities, research & scientific institutes.
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Semiconductor Test Equipment
Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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PXIe-1095, 18-Slot (5 Hybrid Slots, 11 PXI Express Slots, 1 PXI Express System Timing Slot), Up to 24 GB/s PXI Chassis
785971-01
PXIe, 18-Slot (5 Hybrid Slots, 11 PXI Express Slots, 1 PXI Express System Timing Slot), Up to 24 GB/s PXI Chassis - The PXIe-1095 features a high-bandwidth backplane and up to 82 W of power and cooling in every slot to meet a wide range of high-performance test and measurement application needs. The chassis incorporates two hot-swappable power supplies to improve the mean time to repair (MTTR) of the PXI system; it also offers a Timing and Synchronization option that includes a built-in oven-con...show more -
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Nanomechanical Test System
Hysitron TI Premier
Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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VPX Interposer
VPX850
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Test Tables / Test Consoles
Adaptronic test tables and test consoles are a decisive component of the adaptronic kit for the assembly of comfortable and high-quality test systems for the wiring test of manufactured cable harnesses of all types.
