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Product
Mask Flatness Measurement System
Tropel® UltraFlatTM 200 Mask System
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The Tropel® UltraFlatTM 200 Mask System was designed specifically for the photomask industry. It delivers the lowest measurement uncertainty for ever-tightening mask flatness specifications. Shrinking device features require not only flatter wafers, but flatter masks.
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Product
Flatness, Bow, Warp, Curvature, Glass Thickness
FLATSCAN 650 3D
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Optik Elektronik Gerätetechnik GmbH
High accurate flatness & thickness measuring system for large substrates.
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Product
Measurement Of Straightness, Flatness, Positioning Uncertainty Of Round Tables >
ELCOWIN - Software For 2D-straightness Measurement With Electronic Autocollimators
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Optik Elektronik Gerätetechnik GmbH
The software ELCOWIN serves for the measurement of straightness, squareness, parallelism of slides and flatness of precision tables by the autocollimation principle. ELCOWIN can be used in connection with electronic autocollimators of the ELCOMAT series from Moeller-Wedel-Optical.
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Product
Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Product
Measurement Of Straightness, Flatness, Positioning Uncertainty Of Round Tables
RTM - Measurement Of Positioning Uncertainty Of Indexing Tables
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Optik Elektronik Gerätetechnik GmbH
RTM is a software for the measurement of positioning uncertainty of indexing tables using an electronic autocollimator and a polygon mirror as angle reference.
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Product
Mini Load Column Load Cell Compression Only with Mounting
MLC SERIES
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The MLC Series is our miniature high capacity compression only load cell/force sensor, featuring low profile compact size for a wide range of portable and dedicated applications up to 30,000 lb The load diameter is slightly convex for accurate load distribution. Low deflection through design results in ultra fast frequency response. The MLCs are designed to be mounted in a shallow machined flat pocket or smooth flat surface, either free or fastened via a bottom 6-32 tapped hole. These load cells are manufactured from heat treated 17-4 ph stainless steel. The sensing element incorporates bonded foil strain gages of the highest quality and are sealed for protection against most industrial Environments.
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Product
Electrodes
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Electrodes are offered in a wide variety of types. Spring electrodes are normally used in the inspection of pipes, although circular brush electrodes can also be used. Flat brush electrodes are used for flat surfaces. Brush materials can be of brass, steel or conductive neoprene construction. Internal electrodes are for testing internal pipe coatings.
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Product
Module Accessory Kit, Quantity 26 2-56 x .19" Flat Head Phillips Screws 100 Degree
510109368
Accessory Kit
Used with modules: 510104287, 510104289 and 510108125.
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Product
Module Accessory Kit, Quantity 26 2-56 x .250" Flat Head Slotted Screws
510109307
Accessory Kit
Module Accessory Kit, Quantity 26 2-56 x .250" Flat Head Slotted Screws
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Product
Ka-band Power Amplifier (33-37 GHz, 10 Watt Output Power)
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*Frequency band, GHz: 33-37 *Output power, typical, W: 10 (40 dBm) *Gain, dB, typical: 30*Gain flatness: 2 dB Max *Pulse width, Max.: 100 nanoseconds - 60 microseconds *Pulse reptition frequency: up to 100 KHz *Oprating temparture: -40 deg. Celsius to 60 deg. Celsius *Dimensions: 245 mm x 124 mm x 30 mm
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Product
Spectrally Flat Class A Albedometer
LPPYRA11
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Albedometers are composed of two pyranometers that are mounted back-to-back. An albedometer measures in two directions; one pyranometer is facing upwards (measuring the global solar radiation), the other pyranometer is facing downwards (measuring the reflected solar radiation).
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Product
Pulse AC Method Area Ionizers
ER-X Series
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Panasonic Industrial Devices Sales Company of America
The ER-X Series Area Ionizers utilize the pulse AC ionization design to achieve high-speed charge removal of wide surface areas for high-volume production lines. In addition to supporting compressed air ionization, the ER-X also features both airless and low-pressure ionization modes for applications where tiny workpieces can be easily blown away. Additional features include automatic ion balance and discharge frequency control (manual control is also possible), flat discharge surface for easy cleaning, discharge needle air barrier design to reduce contamination of the needles, replaceable discharge needle unit for easy maintenance, and a dual head configuration for enhanced charge area and layout (2 different ionizer heads can be connected to a single controller).
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Product
Directional Couplers
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Virginia Diodes offers a broad range of millimeter-wave directional couplers for various applications. VDI directional couplers offer low insertion loss, coupling flatness and high directivity. Custom directional couplers may be available upon request. Contact VDI for more information.
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Product
Taber Type Linear Abraser
SG-P01TL
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The tester is used for test either contoured or flat surfaces, making it ideal to evaluate finished products of all sizes. It can be used for both wet and dry testing.
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Product
Entry-level X-ray Inspection System
X-eye 5100 Series
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100kV ~ 130kV Micro-focus Closed tube and high-definition Flat Panel Detector are installed and high-resolution image can be gained.Customer convenience is primarily considered in operation and maintenance of the product.Customization is available because it is specially designed to be add up any necessary functions depends on customer needs with reasonable prices.
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Product
Gear Teeth Hardness Tester
PHT-1740
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This dedicated unit is designed to test gear teeth and other difficult to access applications. The 1740 is an economically priced hardness tester that is loaded with the same features found on the base 1700 version. The 1740 hardness tester is capable of measuring the surface hardness of a broad variety of metals on flat and round surfaces. This instrument comes complete with a dedicated DL impact device, calibrated test block and rugged carry case.
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Product
DC Resistance Tester
ZLD-10
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Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.5-2008/IEC60851-4; Inspection standard: JB/T4279.2-2008Used to measure conductor with nominal diameter ≥0.01～9.0mm or various round or flat copper and aluminum wires and other metal wires with DC current resistance of 100μΩ～99.99Ω;Combination of intelligent DC conductor resistance measuring meter and DC resistance test fixture with sample straightening function;Test range can be selected according to the resistance value of sample, and after clamping samples current resistance value would be displayed;Both potential fixture and current fixture are made of copper;The application of microcomputer control allows for full-automatic completion of test;LED will intuitively display measurement results;
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Product
Eddy Current Test System
CIRCOGRAPH® Product Family
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Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Product
Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Product
Semiconductor Metrology Systems
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MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Product
50GHz Dense Wavelength Division Multiplexer
DWDM-0500
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Hangzhou Huatai Optic Tech. Co., Ltd.
DWDM series is based on mature thin film filtering technology and adopt metal sealing technology to encapsulate. It has the feature of flat channel bandwidth, flexible channel configuration, low insert loss and high isolation. The flexibility of channel configuration and modularized design make it convenient for system upgrading and expanding. All the Huatai products have no epoxy glue in optical line and can be used in high power optical communication system.
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Product
Flexible x1 PCI Express to 3 MiniPCI Splitter
SKU-070-XX
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Flexible x1 PCI Express to 3 MiniPCI Splitter was designed to expand your modern motherboard (ATX, mini ATX etc.) that lacks a MiniPCI interface. It allows you to connect up to three 124-pin MiniPCI add-in boards to your motherboard’s standard PCI Express connector.Splitter includes 3 MiniPCI adapter boards, x1 PCI Express host board and 3 flat PCI Express cables.
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Product
Bi-Axial or Axial Averaging Extensometers
Model 3560
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Jinan Testing Equipment IE Corporation
This extensometer is ideally suited for testing anisotropic materials such as advanced composites as well as for general purpose tests like determining Poisson’s ratio. The Model 3560BIA uses a design unique to Epsilon, where the knife edges remain parallel during the displacement. This approach greatly reduces crosstalk between axes and allows use on round or flat specimens with equal ease. These extensometers are very easy to mount. Integral springs hold the unit on the test sample. The parallel multiple flexure design makes these units very durable.The Model 3560AVG reads axial strain only as a single averaged output. It may also be supplied with two independent outputs, one measurement from each side of the specimen. This set-up is most commonly required when an indication of specimen bending is desired. The second version, the Model 3560BIA, includes both the averaged axial strain and the transverse strain. Again, this may also be configured as dual independent axial readings, which results in a three channel extensometer.The Model 3560 extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.
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Product
Detectors
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Keysight detectors offer very flat frequency response versus frequency and temperature and exhibit excellent square law response with very low junction capacitance. Planar Doped Barrier Diode Detectors are available only from Keysight.
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Product
1 KN Capstan Grips For Yarn And Wire
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These capstan grips are applicable for tensile testing yarn and metal wire with thickness less than 3 mm (0.12 in). Flat grip faces are used to hold the specimen. The grip faces are opened and closed by a cam with an operating lever. Ease-of-use and simple design are advantages of these 1 kN capstan grips for yarn.
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Product
DH Series QuickLink Adapter, 8 GHz BW
DH-QL
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Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Product
General Purpose Low Profile
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Our low profile load cells feature an advanced structural design that makes them extremely durable, accurate, and resistant to large extraneous shear and moment loads. To perform in a linear and predictable manner, the outside diameter of the load cell must be bolted to a flat rigid surface. When this is unavailable, our factory installed base provides a convenient threaded attachment point for easy installation and use in both tension and compression. All low profile load cells are stocked with the mounting base installed, but we can remove the base upon request.
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Product
(125×150×20mm) C-Band DWDM FGA Full Function Module Fixed Gain EDFA Module
FGA4400-FM05
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Hangzhou Huatai Optic Tech. Co., Ltd.
Huatai FGA4400-FM05 series is a fixed gain Full Functional EDFA module which is specifically designed for C-Band DWDM optic transmission system, accord with various communication technology requirements of 44 channels DWDM system. It adopts nowadays excellent optical performance, advanced electronic control technology and complete software functionalities. Excellent total integration electronic transient control technology ensures amplifier to achieve the locking of optimal flat gain (OFG) in large dynamic input optical power range.
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Product
High Resolution Digital Radioscopy Compact System
FastRadio
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Real time high resolution digital radioscopy. Motorized zoom axis. Horizontal flat sample holder. Very small footprint.
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Product
Laser Head
5517CL
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The Keysight 5517CL is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Option 009 allows a larger angular range of measurement by providing a 9 mm beam diameter for use with three-axis interferometers. Please contact Keysight for custom requirements.
