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10 MHz to 33 GHz LAN Wide Dynamic Range Average and Peak Power Sensor
L2063XA
The Keysight L2063XA is a fast, accurate and wide dynamic range 10 MHz – 33 GHz LAN peak power sensor.
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RF Shielded Test Enclosure, I/O Intensive Device Tests
JRE 1720
Like its other brothers in the JRE test line, it features rugged welded aluminum construction with superb RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan. A JRE exclusive, our triple door locking mechanism allows easy single handle door operation. Ventilation is standard with our JRE exclusive honeycomb style vents in enclosure rear and door.
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Lamp Cap Temperature Rise Test System
CX-T1
Shenzhen Chuangxin Instruments Co., Ltd.
Lamp Cap Temperature Rise Test System is according to IEC60360-1998 and GB2512-2001(Standard method of measurement of lampcap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards
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Walk-In Temperature & Humidity Test Chamber
Weiber walk in humidity test chambers are conceptualized and designed to create test chambers to study and contemplate the effects of different environmental parameters such as humidity, temperature applications tests involving micro-organisms, plants, tissues, electronic components etc. apart from various customized industrial and research applications. Our humidity test chambers have a variety of usage in R and D laboratories, research studies and product testing facilities across the globe. A...show more -
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Test Equipment Calibration Services
Custom Calibration Solutions, LLC
Custom Calibration Solutions assists customers in meeting or exceeding individual business goals by striking the ultimate balance between quality objectives and cost. We can optimize any existing test equipment calibration program by combining the use of our proprietary procedures in conjunction with the most appropriate standards for each calibration task.
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Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
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Climatic Test Chambers
Dongguan Amade Instruments Technology Co., Ltd
Climatic test chambers are also referred as environmental test chambers, which is the general name of various test chambers that simulate the natural climate environment of raining, high temperature, low temperature, constant temperature, illumination, dewing etc, products including constant temperature chamber, constant humidity chamber, ozone aging test chamber, UV accelerated weathering tester, vacuum hot air oven, salt spray chamber, steam aging tester, rain test chamber, dust proof test chamber, ventilation aging chamber, xenon lamp weathering test chamber and so on.
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Rain Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
Rain Test Chamber is used to test anti-rain and waterproof performance for products, the products such as .steam locomotive lamps, wiper performance, waterproof bands, motorcycle instruments, defense industry, navigation systems, missiles, radar cone top, aerospace industry, IEC IP code specifications that need an additional discussion.
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Dual-Port HS-1760 Test & Simulation PXI Express Module
PXIe-C1760
Avionics Interface Technologies
3U PXI form factor fits into PXIe or PXI hybrid slotTwo independent ports programmable as NC or NT(s) simultaneouslyTwo SFP sockets accepts FC-0 AS5653 or AS5625/AS5627 transceiversSupports NC-to-NT transfers, NT-to-NC Transfers, Mode Codes, and BroadcastFull control of sequence and exchange managementSupports large file exchangesFull Monitoring of all Bus TrafficTriggering and FilteringFull Error InjectionSupports DMA for high speed streaming of data to/from the boardIRIG-B Time Code Encoder/Decoder for Data CorrelationOptional Special FC-0 physical layer compliance with SAE AS5653Optional fcXplorer Analyzer for decoding HS1760 frames
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AC Hipot Test Set
Weshine Electric Manufacturing Co., Ltd
AC Hipot Test Equipment for Dielectric Withstand Test are suitable for 50 / 60 Hz AC testing of low capacity test objects. Optionally, these units can also be upgraded to function as DC test sets by mounting the rectifier attachment on top of the transformer.Weshine® AC Hipot Test Set for AC hipot test can be equipped with a rectifier attachment for DC voltage testing.Typical application areas:Testing of cables Testing of switchgearTesting of transformersTesting of CP & PTTesting of MV systems
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High Range Chemiluminescence Oxides of Nitrogen Analyzer
Model T200H
The Model T200H combines the proven chemiluminescence principle with a number of innovative features to provide reliable and repeatable NO, NO2, and NOx measurements for extractive type CEM systems. A high-efficiency stainless steel thermal NO2 converter provides durable and consistent operation under the harshest conditions (other converter options also available).The T200H may be fitted with an optional, internal paramagnetic O2 sensor or an infrared absorption CO2 sensor, reducing integratio...show more -
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Automated Switch Test Equipment
TRICOR Systems Inc. offers test equipment for switches, keypads, rubber, etc. Virtually any component where accurate force-displacement and measurements are required. From our Model 933A, a low cost life test system to our Model 925 test station used to obtain precise force measurements relative to displacement; we have the system you require.
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CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system...show more -
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Burn-In Test
Trio-Tech provides a comprehensive range of semiconductor testing services through its state-of-the-art laboratories in the Far East. The laboratories provides static and dynamic Burn-in /HTOL /SLT testing and other testing services. All of the company’s testing facilities are ISO9001, ISO14000, ISO17025 and DSCC certified ensuring that operating policies and procedures meet stringent international standards for consistency and reliability.
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JTAG External Modules for Cluster Test
JEMIO
The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
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Test Stands
The cost of a test stand or test facility is usually directly proportional to the accuracy of the test simulation.
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Inspect a Large Range of Part Geometries
ECHOMAC® PA Composite Tester
ensures complete inspection of the part. The system is scalable, allowing the flexibility of adding channels as needed to handle a large range of part geometries. Meets or exceeds USA, European and other international specifications in aerospace and automotive industries. MAC can supply mechanics designed to meet customer requirements ranging from inline bubbler systems to stand alone immersion tanks with part placement.
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laser range finder
JOHO18
Wuhan JOHO Technology Co., Ltd
JOHO18 Laser Range Finder Featuring with low weight, low signature designator, JOHO18 laser range finder is tend to be used by paramilitary as a stand alone device or integrated into an electro-optical tracker turret. Features and BenefitsLong range up to 18kmFlexibility of use as alone device or working with thermal camera or night visionLightweightTechnical DataRanging300m~18000m (tank: 2.3mx2.3m)Beam divergence 1.2mrad Repeat frequency3Hz, working 1 min, have a rest 1min...show more -
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UAT Test Management
User Acceptance Testing is the final stage of the Software Development Life Cycle, which is conducted by the users. User Acceptance Testing is extremely important to determine whether the project is working fine as per the end user's point of view. The UAT test management process has to be done in an organized manner to reap maximum benefits from the process.
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Standalone with Drop-In Test Systems
800 Series ATE
The Circuit Check 800 Series ATE provides the versatility of utilizing the economical drop-in fixturing present in the 600 Series or an integrated dedicated fixture, while simultaneously providing the increased test equipment capacity of the 1000 Series. This combination produces a cost effective full turnkey test solution.
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Dielectric Withstanding Voltage Test
The dielectric withstanding voltage test (also called high-potential, over-potential voltage-breakdown, or dielectric-strength test) consists of the application of a voltage significantly higher than rated voltage for a specific time, between mutually insulated portions of a component part or between insulated portions and ground. This is used to prove that the component part can operate safely at its rated voltage and withstand momentary over-potentials due to switching, surges, and other similar phenomena.
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Rapid PSE And Chained Data Test Of 4-Pair And 2-Pair PSE's
The optional PSL-3424-QT feature license opens up two important productivity tools in the PSL-3424 platform. PSL-3424 Quick Test is a fully automated PSE functional test covering between 2 and 8 PSE ports in a test cycle with average test times on the order of 10 seconds per port tested. The Chained Data Test user interface allows rapid construction and verification of test setups used in “snaked data path” testing of PSE’s with user specified loads and optional LLDP power negotiation on each test port.
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Test Capabilities
Eltek International Laboratories
ELTEK Labs has conducted more Electrical Insulation Systems (EIS) and Component Compatibility Testing (CCT) than all other laboratories worldwide combined. ELTEK Labs is proud to be a Third-Party Testing Laboratory for internationally recognized certifying bodies.
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MCB Instantaneous Trip Test Bench
The SCR Elektroniks MCB Instantaneous Trip Test Bench is designed for Testing of MCB to carry out “Test of Instantaneous Tripping and of correct opening of the Contacts” as per IEC: 60898-1:2002 Clause 9.10.2 at rated voltage. This test is carried out with power factor between 0.95 and 1 with the sequence operation being O-t-CO-t-CO-t-CO with timings as specified in 9.12.11.1.
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Icing/Freezing Rain Test
This test evaluates the effects of icing/freezing rain on the operational capability of equipment. This method also provides tests for evaluating the effectiveness of de-icing equipment and techniques, using prescribed means that are used in the field.
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10 MHz to 18 GHz LAN Wide Dynamic Range Average and Peak Power Sensor
L2062XA
The Keysight L2062XA is a fast, accurate and wide dynamic range 10 MHz – 18 GHz LAN peak power sensor.
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GENEM-C 100G Ethernet/IP Infrastructure Test Application
GENEM-C is a high-capacity network infrastructure testing software application for network equipment manufacturers, data centers, service provider telco cloud and 5G backhaul. It runs on the PROVA-C hardware appliance that is built on BittWare. GENEM-C allows you to verify, monitor and troubleshoot Ethernet/IP network equipment and data center applications to ensure network services can accommodate the demands of your customers. Ideal for QA test, Service Providers migrating to a DevOps model ca...show more -
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Modular Components & Test Sets
Kratos Defense & Security Solutions, Inc.
Kratos offers a full suite of Flight Termination System modular components and test sets. Modular components can be used individually for system verification, testing, troubleshooting, and low power flight termination requirements or can be combined with other components to form complete turnkey flight termination systems.
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Parallel Plate Dielectric Test Cell
LT-4203A
The LT-4203A Parallel Plate Dielectric Test Cell is designed for measuring the AC loss characteristics and permittivity of solid laminates and panels per ASTM Standard D150‑98, and implements the guarded electrode (three terminal) measurement preferred as the referee method.
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AI-based Test Generation
Our AI-based test generator can automatically automate your tests. Using recheck-web, these tests not only detect functional differences, but also visual differences.
