Process Control
See Also: Process Controllers, OPC
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Thermography in Automation
Control temperature distributions and temperature developments automatically - InfraTec develops or widens your process control with infrared camera systems.
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In Situ Process Management
KLA’s comprehensive portfolio of SensArray® products enables in situ monitoring of process tools’ environments. With wired and wireless sensor wafers and reticles, an automation package and data analysis systems, SensArray products provide comprehensive information for a wide range of wafer and reticle processes. Wafer process equipment manufacturers, IC manufacturers and reticle manufacturers use SensArray data to visualize, diagnose and control process conditions.
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System
SpecMetrix
SpecMetrix systems by Sensory Analytics were designed from the ground up to precisely measure the absolute thickness of just about any coating on any substrate. All our systems are flexible for use in virtually any manufacturing environment. They provide coating thickness data of unprecedented accuracy—helping manufacturers reduce costs by optimizing coating process control and product quality. Our systems are easily configured to measure webs, coils, flat sheets, small samples or finished parts.
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PXIe-7858, Kintex-7 325T FPGA, 1 MS/s, DRAM PXI Multifunction Reconfigurable I/O Module
784147-01
Kintex-7 325T FPGA, 1 MS/s, DRAM PXI Multifunction Reconfigurable I/O Module—The PXIe‑7858 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXIe‑7858 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware. The PXIe‑7856 also includes peer‑to‑peer streaming for direct data transfer to other PXI Express modules.
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Ratemeter
TR400
Full-logic control process ratemeter displays speed and direction of rotating equipment. • Displays rate or time-in-process • Detects and converts 0.01 to 4,000 Hz signal input • Optional relay outputs: 2 or 6 • Optional analog output: 4-20 mA or 0-10 V • Completely field programmable • Full diagnostic functions • Single-channel or bi-directional (quadrature) decoding • Front panel reverse direction indication • 3 programmable inputs • Built-in relay test function
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ATEX-Compliant IR Temperature Sensors
FLIR A310 ex
Explosive atmospheres need to be protected from ignition sources. Selecting equipment and protective systems which meet the requirements of the ATEX Product Regulations or similar regulations is essential. FLIR A310 ex is an ATEX compliant solution, with a thermal imaging camera mounted in an enclosure, making it possible to monitor critical and other valuable assets also in explosive atmospheres. Typical applications for the A310 ex include process monitoring, quality control, and fire detection in explosive locations. Because the FLIR A310 ex is rated IP 67, it can be installed in dusty environments. The Flame-Proof Enclosure "d"prevents any explosion transmission from the inside of the enclosure to the outside.
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Turbidity Sensor
AF56-N
AF56-N is a high precision sensor for direct installation into pipelines measuring NIR light absorption (turbidity) of various liquid samples. The optical path length can be individually configured to meet the process control requirements.
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Labratory Micro-Spot XRD Residual Stress Analysus with both Iso- and Side-Inclination Methods
AutoMATE II
Residual stress may be created during the manufacturing process of a material, or it may accumulate in a structure over many years in operation. In either case, this stress can have a serious negative effect on a product's quality, durability and lifetime. Accurate detection of residual stress is an important element of the quality control process and helps predict the service lifetime of products.
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Profile Controller With Data Logging
IM2756
Ajinkya Electronic Systems also manufactures profile controller data logging which is process controller for controlling process parameter against time. User can define the profile he wants with the help of extensive instruction set. Unit supports instructions like jump, loop, loop with count apart from ramp soak control. Relay On and Off instruction are supported.
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Industrial CT- And X-Ray Solutions
To examine things, to get to the bottom of them, to get to their core – this desire has always driven science, research, and development. X-ray technology from ZEISS has provided perfect insights for years in these and other areas. When it comes to quality and process control, it reveals what would otherwise remain hidden from even the most watchful of eyes – without destroying the part.
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Inline Wafer Testing
IL-800
Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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Digital Gauge Pressure
ZET 7112-I VER.2
ZET 7112-I VER.2 digital gauge pressure (open membrane) is used for fast and simple pressure measurements and measured values data transfer in digital format via CAN 2.0 interface. ZET 7112-I VER.2 digital gauge pressure (open membrane) is intended for integration into various technological processes automated control systems. Open membrane type enables pressure meters operation in viscous, pasty and rapidly polymerizing environments.
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Transformer Oil Dielectric Strength Testing
LS -JJ-II
Chongqing Lushun Scientific & Technological Development Co., Ltd.
1.The instrument has the function of automatic detection. 2.Tiny TPU-A panel printer is adopted for automatic printing out type insulating oil dielectric strength ATE is a full self-reacting device, which is developed according to the requirements in International IEC-156 and International GB507-86 "Insulating Oil Dielectric Strength Mensuration", combining the feedback opinions of all users .The instrument adopts singlechip as the leading part, and uses the method of "first setting and then testing". The whole process is controlled by automatic microcomputer. It is operated simply and used conveniently.
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100 amu CIS Analyzer
CIS200
Stanford Research Systems, Inc.
With better than 1 ppm detection limit, direct sampling at mTorr pressure, and a user-friendly Windows software package, the CIS systems will satisfy your most demanding applications. On-line process monitoring and control, verification of process gas purity at the point of use, high-vacuum residual gas analysis, and process equipment leak checking are some of the areas where these systems will prove indispensable
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Industrial Controller
Industrial Controllers are high-performance, fanless controllers that provide connectivity for communication and synchronization to EtherCAT and Ethernet CompactRIO chassis, EtherCAT motion drives, GigE Vision and USB3 Vision cameras, and other automation equipment. Controllers also have onboard isolated, transistor‐transistor logic (TTL), and differential digital I/O. You can use LabVIEW system design software to create, debug, and deploy logic to both the onboard FPGA and the processor. LabVIEW contains over 950 signal processing, analysis, control, and mathematics functions to accelerate development.
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Non-Contact High-Precision Proximity Measuring System
KD-2446
* Outstanding precision: static resolution to 12 microinches* Excellent performance with ferrous targets* Variable voltage input from 12 to 24 volts DC* Compact rugged electronics and sensors* Adjustable gain for up to 22 volts output (with 24 Vdc input)* Temperature tolerant sensors (to 400°F)* High speed (10 KHz) level adjustable switched output for process control* Very low switching hysteresis, < 1% on ferrous targets* RoHS compliant
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Machine Vision Systems
Machine vision solutions are typically used for automated inspection and process control across a wide range of industries. Due to the unique nature of machine vision solutions, they require a different form of thinking and problem-solving to implement accurate and repeatable results. From manufacturing quality inspection to cell and gene therapies, the Cyth team can help you determine the best technologies, architectures, and geometries to ensure your machine vision goals are met. Our machine vision lab enables us quickly prototype proofs of concept to demonstrate the feasibility of meeting your needs through a machine vision application.
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PXI-7851, Virtex-5 LX30 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module
780339-01
Virtex-5 LX30 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module—The PXI‑7851 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXI‑7851 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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Non-Destructive Testing (NDT) Services
We help you ensure the reliability and safety of your products, equipment or plant assets with our world-class services in non-destructive testing (NDT), materials testing and welding quality. We understand the processes involved throughout the entire product cycle – from design and manufacture to operation and maintenance - and the frequent need for rapid turnaround times. Our Total Quality Assurance services can support production processes, quality control, and regulatory compliance as well as new construction, pipelines, plant maintenance and scheduled shutdown inspection.
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PCIe-7846, Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device
786456-01
PCIe, Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The PCIe-7846 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware-in-the-loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe-7846 features a dedicated analog-to-digital converter per channel for independent timing and triggering. This device offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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Wafer Thickness Measuring System
WT-425
Contact type can measure any materials within 0.2 µm (2 σ at 20℃ ±1℃). The wafer floats positions while measurement points change and it does not damage even thin wafers. Best for the process control of compound wafers and oxide wafers. (SiC, GaN, LT, Sapphire and Bonded Wafers)
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Analog Products
Our broad analog component portfolio provides for a wide range of next-gen precision instrumentation, medical, communication, and industrial process control applications where high performance and high precision sit alongside innovation, reliability and dependability as central to the analog design.
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DC Power Supplies
AMETEK Programmable Power, Inc.
From benchtop supplies, modular power supplies to rack-mounted industrial power subsystems, AMETEK Programmable Power, is a leader in designing and manufacturing precision, programmable DC power supplies. Ranging from 30W to 150kW, Sorensen DC power supply products are used in R&D, test and measurement, process control, power bus simulation and power conditioning applications across a wide variety of industrial segments.
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8DI/8DO Modbus RTU Remote I/O
ND-6150
The NuDAM modules provide direct communications with a wide variety of sensors; perform signal conditioning, scaling, linearization and conversion; can acquire measurements of temperature, pressure, flow, voltage, current; and handle multiple digital signal types broadly used in IoT and other industrial applications, such as facility monitoring, environment monitoring, and industrial process control. The new ND-6117, ND-6124, ND-6150, and ND-6160 modules feature Modbus/RTU as the best remote data transmission protocol, which provides customers a comprehensive product offering.
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PXI-7953, Virtex-5 LX50 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module
780340-01
Virtex-5 LX50 FPGA, 750 kS/s PXI Multifunction Reconfigurable I/O Module—The PXI‑7852 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXI‑7852 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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High Voltage Reed Relays from Pickering Electronics
Pickering Electronics' High Voltage Reed Relays are well suited for Instrumentation, Industrial Process Controls and General Purpose requirements. *Ideal for high-power applications*Plastic package with internal mu-metal magnetic screen*3V, 5V, 12V or 24V coils, diodes are optional*Dry instrument grade switches*Pickering's SoftCenter technology
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Electric Screwdrivers
Faster than hand tools and more precise than air tools, electric screwdrivers are the smart choice for high-volume manufacturers who want to increase productivity. Brushless motors keep your tools on the line by reducing maintenance downtime which, in turn, maximizes your tooling ROI. Mountz electric screwdrivers simplify process control and regulatory compliance by interfacing with screw counters for automatic oversight. You can also meet special manufacturing needs, such as ESD-prevention or clean room requirements, with Mountz's complete lineup of electric tools.
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Digital Module For Remote I/O
Digital Modules for Remote I/O provide 24 V digital inputs or outputs and offer 1‐, 2‐, 3‐, and 4‐wire spring terminal connection options. You can use inputs as counters or standard digital inputs, and you can adjust filter time to improve measurement quality. Inputs can include a built‐in power supply for sensors. Output modules feature circuit and overload protection and can drive up to 500 mA per channel, up to 8 A per module.A remote I/O system consists of an EtherCAT bus coupler and individual modules mounted on a DIN rail. You control the Digital Module for Remote I/O from a NI real‐time controller. You can use remote I/O hardware to add low‐cost I/O for simple tasks while your controller handles advanced tasks such as image processing, motion control, and high‐speed or specialty measurements.
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Ultra Low-Loss Cable Assemblies
dB Miser
Cost-Effective, High-Performance Solutions for Low Loss ChallengesConsider dB Miser™ ultra low loss cable assemblies. High performance materials, careful attention to design detail, and stringent process control yields:- Ultra low insertion loss over the specified frequency range- Excellent amplitude stability with flexure- Stable performance over operating temperature range - Increased shielding effectiveness - Greater connector retention
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Wafer Inspection System
INSPECTRA® Series
INSPECTRA® series meet the requests of 100% automatic inspection with high speed and high specifications from front-end to back-end of semiconductor processing. INSPECTRA® series are wafer inspection systems with high speed and high sensitivity. Our original "Die-to-Statistical-Image" comparison method achieves the target defects detection controlling process variation and overkill.
