Showing results: 211 - 225 of 294 items found.
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THL210 -
TMTeck Manufacturing Limited
LCD display of 128×64 matrix with back-light, showing all functions and parameters. Converts to all common hardness scales (HV,HB,HRC,HRB,HRA,HS). English displaying and easy and convenient menu operation. Powerful PC Software available and USB 1.0 interface and USB with Protective Membrane. 7 types of Impact Device optional, which don't need to be recalibrated when changing them. Memory of 600 groups data（impact times:32～1）. Lower limit setting and sound alarm. Material of “cast steel” is added; HB values can be read out directly when D/DC impact device is used to measure “cast steel” work piece. Printer be separated from main unit and copies of testing results can be printed as required. Normal battery AAA and big power store while USB connected and charging controlling circuit. Inbuilt function of Software Calibration.
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EnTech Taiwan
If you are a hardware developer, using RapidDriver Explorer with just a couple of clicks, you can easily start testing and debugging your USB, ISA, PCI or Parallel Port device. You do not have to perform any additional steps - everything is already done!If you are a software developer, you can write your own application with the help of RapidDriver Developer, TVicHW32 or TVicPort without writing a device driver and being a DDK expert - we have already built-in generic device drivers for you! Our toolkits include many test examples on direct port i/o access, interrupt handling, physical memory access, reading specific hardware registers and USB pipes to help you getting started. We also allow redistribution of drivers and DLL's as part of your software without having to pay royalties.For the software developers, we also offer an option to purchase the drivers and DLL source code. The source code can be directly edited and compiled with MS Visual C/C++ or with the DDK "build" utility.Not sure what product to choose? Compare them by features or contact us.
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783691-01 -
NI
PXIe, 100 MHz, 4- or 8-Channel, 14-Bit, Kintex-7 325T FPGA Reconfigurable PXI Oscilloscope—The PXIe‑5170 high-density PXI oscilloscope has eight simultaneously-sampled channels with flexible settings for coupling and voltage range. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 250 MS/s or 100 MHz of analog bandwidth and advanced PXI synchronization. The PXIe‑5170 also features a programmable Kintex‑7 325T FPGA that can be used for custom acquisition, triggering, signal processing, and data streaming.
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784226-01 -
NI
PXIe, 100 MHz, 4- or 8-Channel, 14-Bit, Kintex-7 325T or 410T FPGA Reconfigurable PXI Oscilloscope—The PXIe 5172 high-density PXI oscilloscope has eight simultaneously-sampled channels with flexible settings for coupling and voltage range. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 250 MS/s or 100 MHz of analog bandwidth and advanced PXI synchronization. The PXIe 5172 also features a programmable Kintex-7 325T or 410T FPGA that can be used for custom acquisition, triggering, signal processing, and data streaming.
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785182-01 -
NI
PXIe, 200 MHz, 1 GS/s, 14-Bit PXI Oscilloscope—The PXIe‑5163 high-resolution oscilloscope has two channels that sample at up to 1 GS/s with flexible and programmable settings for coupling, input impedance, voltage range, and filtering. PXI Oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that facilitates high-speed data throughput and includes analysis functions. This device is ideal for automated and partially automated time- and frequency-domain applications that require high-resolution, low-noise measurements with up to 200 MHz of analog bandwidth and up to 250 V. The PXIe‑5163 also features advanced PXI synchronization and data throughput capabilities.
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PXIe-5172 / 784225-01 -
NI
PXIe, 100 MHz, 4- or 8-Channel, 14-Bit, Kintex-7 325T or 410T FPGA Reconfigurable PXI Oscilloscope—The PXIe 5172 high-density PXI oscilloscope has eight simultaneously-sampled channels with flexible settings for coupling and voltage range. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 250 MS/s or 100 MHz of analog bandwidth and advanced PXI synchronization. The PXIe 5172 also features a programmable Kintex-7 325T or 410T FPGA that can be used for custom acquisition, triggering, signal processing, and data streaming.
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779967-03 -
NI
PXIe, 100 MHz, 100 MS/s, 14-Bit PXI Oscilloscope—The PXIe‑5122 high-resolution PXI oscilloscope has two channels with greater than 75 dBc spurious‑free dynamic range (SFDR) and flexible settings for coupling, impedance, voltage range, and filtering. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution, low-noise measurements with up to 100 MS/s and 100 MHz of analog bandwidth. The PXIe‑5122 also features advanced PXI synchronization and data streaming capabilities.
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779967-02 -
NI
PXIe, 100 MHz, 100 MS/s, 14-Bit PXI Oscilloscope—The PXIe‑5122 high-resolution PXI oscilloscope has two channels with greater than 75 dBc spurious‑free dynamic range (SFDR) and flexible settings for coupling, impedance, voltage range, and filtering. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution, low-noise measurements with up to 100 MS/s and 100 MHz of analog bandwidth. The PXIe‑5122 also features advanced PXI synchronization and data streaming capabilities.
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IMB-M43H -
ADLINK Technology Inc.
IMB-M43H is an ATX motherboard supporting the Desktop 6th/7th Generation Intel Core i7/i5/i3 Processors with Intel H110 Chipset, providing the most cost-competitive solution anywhere in embedded computing and fulfilling the specific needs of all users requiring 5 PCI add-on cards. With high-speed data transfer interfaces such as PCIe 3.0/2.0, USB 3.0, and SATA 6 Gb/s (SATA III), dual-channel DDR4 memory up to 32 GB in two DIMM slots for industrial automation applications, the ADLINK IMB-M43H carries significant competitive advantage in the market. This leading, rugged I/O design enhances user experience with robust device compatibility, durable connectivity, and extreme environment readiness.
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Entes Elektronik
1) Total counter indexes of 12 pulse inputs with tariff and unit information, date and time information and alarm states can be displayed on the 2x12 characters LCD screen automatically with intervals of 5 seconds or manually by pressing up and down buttons,2) Enabling the backlight for 20 seconds by pressing any button to provide easy reading on the screen,3) Data communication with a PC via RS-485 output,4) Storing the contents of each pulse input with tariff information in 1-60 minutes intervals on the 2 MB permanent memory of the device with date and timeinformation,5) Preventing changes to settings by unauthorized users by defining a 4-digit user password.
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Hiresta UX -
OAI
The new Hiresta-UX is a high performance meter for measuring the surface and volume resistivity of a wide variety of nonconductive materials. With an extended measurement range of 103 ~ 1014Ω, this meter is ideal for Production, Engineering, R&D and Quality Control. The new Hiresta-UX features powerful new algorithms that automatically choose the right voltage, which optimizes the surface and volume resistivity testing. This versatile, high performance resistivity meter includes a built-in switch box that can be mated with a J-Box (meets JIS K 6911 for surface & volume resistivity and is compatible with ASTM D 257) as an option. The Hiresta-UX can store up to 2,000 measurement results, which can be easily exported to a USB memory device.
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P34 -
Evoqua Water Technologies LLC
The photometer P34 Professional meets all the requirements of modern water analysis. The device has a backlit display. Measuring range, reagent type as well as an automatic countdown timer for accurate response times are displayed. The internal memory stores up to 1,000 events with date, time and sample ID. The data can be retrieved at any time and transferred via an optional infrared module. The photometer P34 Professional serves, among others, to detect alkalinity, aluminum, bromine, chlorine, chlorine dioxide, chlorite, cyanuric acid, iron, urea, hardness, iodine, copper, sodium hypochlorite, ozone, PHMB, phosphate, pH, oxygen, acid, sulphate and hydrogen peroxide using various methods.
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FOX-XP -
Aehr Test Systems
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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ScanDIMM -
Corelis, Inc.
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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PHT-1840 -
Phase II Plus
This dedicated unit is designed to test gear teeth and other difficult to access applications. The 1840 is loaded with the same features found on the base 1800 version which includes memory, USB output and software for downloading to your PC. The 1840 hardness tester is capable of measuring the surface hardness of a broad variety of metals on flat and round surfaces. This instrument comes complete with a dedicated DL impact device, calibrated test block and rugged carry case.
