Probing
See Also: Probers, Probing Stations, Nano Probes
-
product
Differential Probe
With signals becoming faster, and power supply voltages going lower, these active differential probes will allow floating measurements from 100uVolts to as high as 7000 volts. These probes provide high CMRR and a broad frequency range.
-
product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 155gf
K100-A080155-SKAU
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
-
product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1B-6-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Flexible Multisensor Probes
IT Series
Physitemp multisensors are made with our specially manufactured thermocouple wire. We test and grade this wire to standards better than the accepted ''Special Limits of Error'' and guarantee 0.1°C accuracy in the range of 0-50°C . All multisensor probes conform to NIST standards. These multisensor probes are custom-made and should be ordered to your requirements on number of sensors and spacing between sensors.
-
product
CIRCUIT ENERGIZER
TH852
*Can be used with most 12V mini jump starters with the standard EC5 port*Allows for more portability and freedom from long battery wires*Factory correct terminals means less of a need to back probe*Isolates component from the rest of the circuit which results in less damage to entire wiring/computer modules*No need to remove component for bench test
-
product
Oscilloscope, 200 MHz, 2 GS/s interleaved, 4 CH, 200 Mpts/Ch interleaved, Fully Loaded DSO with 16 Dig Ch MSO
T3DSO2204HD-MS
The T3DSO2000HD series of Bench Oscilloscopes feature 4-channel models with analog bandwidth options of 100 MHz, 200MHz and 350 MHz. The T3DSO2000HD Oscilloscopes use 12-bit high resolution ADCs and a low noise front end which provides an impressive noise performance to cover a wide range of measurement applications. Each model offers a maximum sample rate of 2 GSa/s (interleaved) and a maximum memory depth of 200 Mpts in interleave mode. The MS configured models also include a 16 channel logic probe as standard.
-
product
IDE, Compiler And Debugger
RiscFree™ SDK
RiscFree is Ashling’s cross platform SDK including an IDE and Debugger, Integrated Compiler Toolchain, Project Manager and Build System, Single-shot Installer and Source-code Creation and Navigation. The integrated Debugger provides full Multi-core Homogeneous and Heterogeneous Support including debug and trace support via the Ashling Probes for RISC-V, Arm, ARC, ARC-V and MIPS based cores
-
product
Hall Effect Thickness Gage
Magna-Mike 8600
The Magna-Mike® 8600 is a portable thickness gage that uses a simple magnetic method to make reliable and repeatable measurements on nonferrous materials. Operation of the Magna-Mike is very simple. Measurements are made when its magnetic probe is held or scanned on one side of the test material and a small target ball (or disk or wire) is placed on the opposite side or dropped inside a container.
-
product
K Thermocouple Surface Probe
TP754
Surface thermocouple Type “K” probe. Tolerance according to IEC 60584-2 standard.
-
product
High Voltage Probe
PL-10
*MODEL：PL-10*IMPEDANCE：1.111MΩ*ACCURACY： ±0.25%*FREQUENCY B.W.：DC~50MHz*WORKING POWER：MAX. 1Watt*INPUT VOLTAGE：MAX.250VDC or 200V rms AC*DIMENSION：46mm(L)xΦ16mm(D)*WEIGHT：25g
-
product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1J-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25H-6.5
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Test Leads and Probes
Test leads and probes are an intergral part of a complete measurement system and extend the capabilities of your digital multimeter.
-
product
Thermocouple Probes
sensor that measures temperature. It consists of two different types of metals, joined together at one end. When the junction of the two metals is heated or cooled, a voltage is created that can be correlated back to the temperature.
-
product
Boundary Scan Test
Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
-
product
Software
DIGITIZER
The Digitizer allows the recovery of design data of unknown assemblies by an electrical analysis with a Condor flying probe test system
-
-
product
Multi-Contact Wedge
The GGB Industries MULTI-CONTACT WEDGE allows for more chip design flexibility because it is custom configured to your circuit. Four Wedges can be used at the same time to probe a complete chip.
-
product
MANIFULATOR
As one of the most important module in Probe_Station, manipulator is an accurate system that probe micro distance() and contact on the electrode of semiconductor wafer, device. ECOPIA's Manipulator is very easy to use and probe arm's elastic plate is good to protect sample's surface, from being damaged by Z direction movement.
-
product
Manual Fixture Kit
230371 – CMCSK-02-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
product
VELOCICALC Multi-Function Ventilation Meter
9565-X
The portable, handheld VELOCICALC® Multi-Function Ventilation Meter 9565-X features a menu-driven user interface for easy operation in your local language. On-screen prompts and step-by-step instructions guide the user through instrument setup, operation, and field calibration. The 9565-X also features an ergonomic, overmolded case design with probe holder and a keypad lockout to prevent tampering during unattended use. The 9565-X does not include a probe or pressure sensor.
-
product
Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3A-1
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
High Impedance Active Probes
28 AND 29
Designed to serve the needs of integrated circuit engineers working in the most advanced high speed, submicron, MOS technology. These high frequency instruments include the attractive features of the Models 18C and 19 including full dc capability, negligible dc current drain, and extremely low input capacitance. In addition the frequency range of the Models 28 and 29 has been extended to a full 1 GHz.
-
product
Cable Tester
The MapMaster™ mini detects faults and locations of RJ45 network cables. Good terminations, causes of faults and locations of cables are displayed on an LCD display. A set of five mapping remotes is included for locating cables terminated in wall jacks or patch panels. A built-in tone generator with 4 different tone combinations can be used with a tone probe to detect where a cable is routed and the location of the end of the cable.
-
product
Semi-auto 4 Point Probe System for Solar Cell Substrate
RG-100PV
*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
-
product
Scanning Kelvin Probe
Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350 mm. With work function resolution of 1 - 3 meV, and the spatial resolution of the Probe tip diameter (0.05 mm with the SKP5050 model), the Scanning Kelvin Probe gives reliable, repeatable measurements for work function, contact potential difference and Volta potential.
-
product
High Voltage Differential Probes
DP Series
Shenzhen Micsig Instruments Co., Ltd.
*Micsig DP Series High Voltage Differential Probes can be used with any brand of oscilloscope. *It adopts high-impedance isolation between the input and output to protect personal safety, converts the input high-voltage signal to a low-voltage signal for observation and analysis on oscilloscope.
-
product
Industrial Inspection Cameras
Industrial Inspection Cameras are our top-of-the-line inspection cameras. They feature glass lenses, superior optics, crystal-clear displays, and compatibility with the thinnest probes on the market. All Industrial Inspection Cameras were recently upgraded to capture VGA (640 x 480 pixel) resolution video clips and remove glare and reflections from them. All cameras in this sub-category are made in Taiwan, making them compliant with the Trade Agreements Act (TAA) of 1979a necessity for many buyers with the U.S. military and federal agencies.
-
product
Probe Card Analyzers
PB3600
The PB3600 provides the latest techniques in testing and maintaining probe cards. Designed through joint development with many of the world’s largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
-
product
Standard 1.00 (28.00) - 1.80 (51.00) General Purpose Probe
P2662BG-1C1S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 68Full Travel (mm): 1.73Recommended Travel (mil): 50Recommended Travel (mm): 1.27Overall Length (mil): 575Overall Length (mm): 14.60
