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Product
Multiphoton FLIM System
DCS-120 MP
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*Multiphoton FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*Excitation by Ti:Sa Laser*Two Non-Descanned Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage*Laser Control via SPCM Software
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Product
NIR & UV-VIS Process and Lab Analyzers
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The optical or spectrum analyzer is the brain which transforms the signal collected by the sample interface into actionable information. Guided Wave sample interfaces (probes, flow cells) are designed for use with NIR or UV-Vis fiber optic coupled analyzers. They are designed to be rugged and reliable in harsh chemical and physical process conditions while providing optimal light transmission for long-term reliable measurements. More information is available about specific analyzers on each product page or on the process analyzer product overview.
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Product
Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Product
Process & Lab FTIR FT-NIR Analyzers
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Using a broad spectral region from the near-infrared to the mid-infrared, our Guided Wave ANALECT® Series of FTIR/FT-NIR analyzers measure physical and chemical properties of liquids, solids and gases. They are ideal for complex refinery applications such as fuels blending and component streams applications for polymers, petrochemicals, chemicals, pharmaceuticals in addition to general manufacturing. Customers include ADNOC, BP, CITGO, CPCL, Gazpromneft, HPCL, IOCL, Orpic, Phillips 66, Rompetrol, Statoil, PBF Energy and Tesoro.
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Product
On-Line Moisture Meters
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Many methods are available for measuring moisture content on line, in real time: NIR, RF Capacitance, NMR (Nuclear Magnetic Resonance), and Microwave, among others. Finna Sensors is unique in that it has experience with most of these methods and is therefore able to recommend the best possible solution for any application.
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Product
Confocal FLIM System
DCS-120
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*FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Two Fully Confocal Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Product
Single Photon Detector System For Near-Infrared (0.7 - 2.3 Um Wavelength)
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*Frequency range includes coverage into higher frequencies than other photon counters on the market.*Short dead time (10 nanoseconds) compared to long dead time (microseconds) of alternatives. Therefore rapid repeition rate of 10s of MHz possible, whereas alternative have maximimum repetition rate of 1-10 kHz.*Very small dark counts (10/second) compared to high dark count (1,000s / second) of alternatives. Does not require gated mode unlike alternatives. Operates in continuous operation mode.
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Product
Spectroscopy
NIRS Analyzer PRO
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The NIRS Analyzer PRO is a system for the nondestructive, direct analysis of granules, powders, liquids, slurries, or opalescent substances.
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Product
OMNIR: On-Line Near Infrared Sensor
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OMNIR is the future of near infrared moisture sensing technology. Coming from OMNI, meaning “all” and NIR, meaning “near infrared,” Finna Sensors has created an intelligent all-sensing solution that exceeds expectations. It not only delivers accurate data instantaneously and non-destructively, it also monitors its own health to perform its best during your crucial processing moments. By selectively harnessing light, to ensure increased uptime and greater profitability for your operation, the future of your manufacturing operation starts now.
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Product
Full Range Photodiode Array UV-VIS-NIR-SWIRLaboratory Spectroradiometers
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The SR-Series of full range laboratory spectroradiometers is ideal for a wide range of applications, including Solar radiance and irradiance measurements. Solar simulator test and classification. LED, laser, light source metrology. Radiometric calibration transfer. Remote sensing applications.
