ESD Test Systems
See Also: ESD Test, ESD Simulators
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Product
Display Test System
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PIMACS provides the broadest range of display optical performance measurement system for optical testing of various samples including flat panel displays. We are specialized in testing all sizes of display modules and panels ranging from various field.
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Product
High Impact Shock Test System
KRD16 series
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High impact shock test system meets MIL-S-901D standard which covers shock testing requirements for ship board machinery, equipment, systems, and structures, excluding submarine pressure hull penetrations. The purpose of these requirements is to verify the ability of shipboard installations to withstand shock loadings which may be incurred during wartime service due to the effects of nuclear or conventional weapons.
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Horizontal Vibration Test Systems
G-3 Series
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This series was used for the special structure of airbearing guide of inspection for Seismic Detectors andcharacterized is large displacement and high-accuracywaveform. In addition, the use of the Windows seismicdetector controller is easy to operate it.
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Product
ESD Anti-Static
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Fraser Anti-Static Techniques Ltd
Low offset-voltage ionised air blowers and compact precision ionisers for ESD and cleanroom environments.
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Product
In-System Test Programming System
WriteNow
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Based on proprietary WriteNow! Technology, the WriteNow! Series of In-System Programmers is a breakthrough in the programming industry. The programmers support a large number of devices from various manufacturers and have a compact size for easy ATE/fixture integration. They work standalone or connected to a host PC, and are provided with easy-to-use software utilities.
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Product
Short Circuit Test System
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Shanghai Guantu Technology Co., Ltd.
The short-circuit test system refers to what kind of short-circuit test is carried out by which equipment, and how long is the test time. But I have one thing to tell you, the short circuit test is a kind of destructive test, mainly to test the working condition of the used equipment in a crisis situation, or to test how strong the anti-destructive ability of the used equipment is. Just like a lot of equipment in the military must undergo a short-circuit test, some for 3 minutes or longer, in order to resist breaking calls against the enemy during wartime.
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Product
Filter Test System
DU7216/7218
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Delta United Instrument Co., Ltd.
Inductance, Q factor, Leakage Inductance, AC Resistance, Capacitance, DC Resistance, Balance,Turn ratio, Open/Short check
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Product
ESD Test Simulator
ONYX16
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The ONYX is a state of the art electrostatic discharge simulator available in 16kV or 30kV versions. It is the most ergonomic 30kV ESD gun without an additional base control unit that can be battery or mains operated. The easy to use touch screen, ergonomic design, modular RC units, multilingual interface, remote control software, built-in LED light and temperature & humidity display allows for trouble-free use of the ONYX in all types of test sites.
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Product
Battery (EV) Automatic Test System
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Landrex Technologies Co., Ltd.
Battery (EV) Automatic Test System
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Product
PCI / PMC / CompactPCI Test System
PCITS
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The CPCI850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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Product
Tan Delta Test System
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Precision measuring bridge is designed for determining the capacitance and dielectric dissipation factor of liquid and solid insulants, cables, capacitors, line transformers, generators, motors, bushings etc. Furthermore it can also be used for power loss measurement on shunt reactors or similar apparatus. This system is suitable for both low and high voltage measurement at line frequency. Measurement reports can be printed. This measuring equipment has been specially developed to maximise efficiency in production and quality control environments. Its outstanding accuracy also makes it suitable for laboratory and research applications.
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Product
Memory Test Systems
T5503HS2
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Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Eddy Current Test System
CIRCOGRAPH® Product Family
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Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Product
Power Supply Test System
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The Procyon PTS 2100-10 is a configurable turnkey Power Test System, delivering automated test equipment (ATE) to some of the world’s largest-volume manufacturers as well as the affordability needed by niche market producers. Aerospace, defense, and avionics power supply ATE test systems applications include functional testing of AC and DC power supplies, generator, and engine control units, as well as a wide range of associated electronics.
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Product
Goniophotometer Test System For Led Lamp
LCG-1680B
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Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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Product
Incircuit and Functional Test Systems
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REINHARDT System- und Messelectronic GmbH
We offer test systems which vary in their expansion and can be used for different ranges of automatic testing.
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Product
EMI Test System
EMI-9KA
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EMI-9KA is an automatic EMI receiver. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KA is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem. The test results are according to the international format test report. The EMI Test System EMI-9KA fully meets CISPRl6-1, GB17743, FCC, EN55015 and EN55022.
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Product
NI's Wireless Connectivity Functional Test Solution
Functional Test
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
Hardware-in-the-Loop Test Systems
HIL
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Our early development efforts and NI VeriStand expertise uniquely qualify us to maximize the benefits of and provide top-notch integration services for this software platform. Wineman Technology offers powerful and flexible MIL and HIL testing solutions, such as: Full range of MIL and HIL test systems. Software for testing. Software for simulating electronic control modules. Fault insertion unit (FIU)..
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Product
DC Parametric Test System with Curve Trace
DC3
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The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Product
Optics Test Systems
F Number Meter
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Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
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Product
LT-200A Aging-Life Test System For LEDs
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Hangzhou Everfine Photo-E-Info Co., LTD
LT-200A is mainly used for normal aging, accelerated aging test, lumen maintenance characteristic test, life test and temperature characteristic test of single LED and LED module.The system can monitor the photoelectric parameters and base temperature of the LED sample in real time, process the data, draw the aging curve, and calculate the lifetime exploration of the LED sample.
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Product
Custom Motor Test Systems
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Magtrol's Customized Motor Test Systems (CMTS) are PC-based, turnkey systems custom designed and built to meet your specific motor testing requirements. By integrating Magtrol's motor test equipment with power supplies, adaptable fixtures, custom tables/cabinets, printers, etc., Magtrol's engineering team can customize PC-based, turnkey systems and modular test benches for almost any motor test application.
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Product
Curved Needle Test Systems
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Instron’s Curved Needle Testing System is designed for evaluating surgical and wound closure needles through two specialized testing methods: curved needle puncture testing (per ASTM F3014) and cantilever bend testing. These fixtures assess key performance attributes such as sharpness, coating integrity, and flexural strength. Compact and efficient, the tabletop system conserves bench space while delivering robust functionality. Powered by Bluehill® Universal software, it offers comprehensive control over test execution, data collection, and reporting, along with access to a wide range of built-in calculations.
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Product
HV AC Voltage Test Systems
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Fivestar HV Testing Equipment Co., Ltd.
FSHV offers three different types of AC voltage test systems, the conventional type is AC test transformer design, mainly for testing objects of medium & low capacitance products, particularly for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load is inductive (like inductive voltage transformers). Another is AC resonant test systems, according to series resonance circuit XL=XC (2πfL=1/2πfC), by setting F frequency of power supply or L inductance of reactor, generate a pure sinusoidal waveform of the test voltage, and the required input power is only 1/Q. Variable frequency type operates in a frequency range from 20Hz to 300Hz, ideal for field commissioning test of power cables and GIS/GIL. Variable inductance type outputs continuous AC voltage of power frequency (50/60Hz), mainly for factory testing of high and ultra-high voltage cables, power transformers, GIS, etc.
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Product
Microindentation Hardness Testing Systems
LM Series
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Perfect for a production facility or a research lab, LECO's LM Series Microindentation Hardness Testing Systems offer a variety of models (including analog and digital) with the advanced features that meet your requirements and budget.
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Product
LT-500A Aging-Life Test System For LED Luminaires
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Hangzhou Everfine Photo-E-Info Co., LTD
LT-500A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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Product
Standards Reference for Test Systems PXI Card
GX1034
PXI Card
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
