Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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TTC-1 Tracking Test Chamber
TTC-1
It is according to IEC60695 and IEC60112 (GB4207), the Tracking Test Chamber TTC-1 is intended for determining the degree of protection against formation of conducting paths in solid insulating materials, due to the electric stress and electrolytic contamination of the surface. This method simulates tracking currents on insulation material by providing drops between electrodes. During the process of normal use, insulating material may be exposed to moisture and dirt, if conductive, may cause stress and fire hazard.
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Noise Test
As experts in the acoustic industry, our company offers a wide range of noise monitoring equipment, including sound level meters, monitoring substations, and noise localization devices. We also provide customized solutions to meet specific scenarios and requirements for noise control.
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Hydraulic Data Acquisition System
C2000
Measure hydraulic flow, pressure, temperature, speed, current (Amps), contamination and other custom inputs.
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Environmental Noise Monitoring System
E-Box LIVE
This is the ultimate solution to environmental noise monitoring. The LIVE comes equipped with a modem that connects directly to our Castle Cloud software allowing you to monitor your results from the comfort of your own desk. Combine this with the ability to customise your power supplies and you will see why this is the ultimate solution for environmental noise monitoring.
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Temporary Bonding andDebonding Systems
Increased demand for applications based on thin wafers and thin microelectronic-substrates result in the need for processing and handling of thin- and ultra-thin substrates during the manufacturing step. Thin substrates in the area of IC manufacturing (like memory, CMOS, 3D-TSV integration or ChipCard applications), power devices (e.g. IGBTs), compound semiconductors (e.g. for high brightness LEDs or RF-power amplifiers), as well as emerging technologies that also involve thin or flexible substrates (MEMS; RFID-tags, flexible displays, etc.) require reliable handling and support techniques in order to ensure safe processing.
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MIL-STD-1553 A / B Test And Simulation XMC Module
XMC-1553
*Dual redundant*1, 2 or 4 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*Multi-level trigger for data acquisition and filtering*10 programmable, discrete I / O (up to 30V)*IRIG-B timecode encoder / decoder with free-running mode*Real-time recording and physical bus playback*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, LabView Real-Time and other systems
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Ultra Light High Voltage DC Test Sets
This Compact power supply/test set can perform all laboratory and field tests of DC Hipot. A flexible High Voltage Cable is provided at the back for connecting to the test specimen. Available in Rack Mount as well as portable design.
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N-Male to N-Male Test Cable
C50NMNM
Our N-type test cable is made to ideally suit our larger line of vector network analyzers. The C50NMNM test cable operates at a frequency of 18000 MHz and is compatible with our PC-driven vector network analyzers.
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Power Special Test Equipment
PSTE
AMETEK Programmable Power, Inc.
There are several key benefits of the PSTE. First, it is a complete turnkey system that is capable of operating locally through a simple GUI interface or remotely via a host computer as a single Ethernet address. The spacecraft engineer who defines the spacecraft power bus limits, cabling scheme, mode simultaneity matrix, and system behavior based upon limit conditions implements the real intelligence of the system. From this definition, operating procedures can be generated to allow spacecraft ...show more -
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Automated Lightning Alert and Risk Management System
ALARM
Cloud-to-ground lightning activity shown in three ranges and in directional octants when used with a Vaisala TSS 928™ sensorCloud lightning counts when used with a Vaisala TSS 928™ sensorElectric field intensity measurements when used with up to seven Vaisala EFM II sensorsDisplays data within a 30-nautical mile (56-km) radius around the location
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PCI Express Gen 1 Test Backplane
SKU-015-01
The PCI Express Test Backplane was designed to support production testing/debugging of PCIe-based peripheral boards. The backplane expands the x1 PCI Express interface of the host computer into one x4 and three x1 PCI Express slots via 7 ft CAT6 cable.
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Flying Probe Systems
Smaller production series and fast prototyping requirements combined with zero fixturing costs are factors driving the development of Flying Probe testers. Today, Flying Probe Technology has matured and Columbia can supply single- or double-sided flying probe testers to be used on both loaded and bare PCBs.
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USB 3.0 Type A (With Shielding) Test Connector
Test connector for USB 3.0 Type A with shielding (9 pole) for contacting USB interfaces. Application in high-speed USB devices like hard disks, data carriers, power supplies, etc.
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Complete Vision System
BOA2
Introducing BOA2: a complete vision system in one smart camera. Featuring our highest smart camera resolution yet, BOA2 combines lighting, image capture, processing, and easy-to-use embedded vision software into a convenient single device with a variety of I/O and mounting options.
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Widely Tunable Ultrafast Laser System For Multiphoton Imaging
InSight X3
Spectra-Physics’ new InSight® X3™ is the third generation of Spectra-Physics’ industry leading InSight platform, specifically designed for advanced multiphoton microscopy applications. Based on patented technology1, InSight X3 features a broad 680 nm to 1300 nm continuous, gap free tuning from a single source, nearly double the tuning range of legacy Ti:Sapphire ultrafast lasers. InSight X3 delivers high average and peak power levels across the tuning range, including critical near infrared wave...show more -
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Dual Projection 3D In-Line Solder Inspection System
KY8030-2
The new KY8030-2 delivers 2x fasterinspection without compromising performanceand accuracy.Using patented dual projection, the systemeliminates the critical Shadow problem thatall 3D SPI systems can be vulnerable to.Easy UI and SPC Plus are included in the systempackage in order to help users achieve faster& easier printer process optimization
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ARINC 429 Test & Simulation Interface for PCI Express
PCIe-C429X
Avionics Interface Technologies
16, 32, or 64 ARINC 429 Channels (up to 32 Tx & 32 Rx) - Programmable Tx channel output amplitude - Programmable High/Low Speed Operation - Eight (8) Discrete I/O (Four (4) inputs, and four (4) outputs) - Concurrent operation of all Tx/Rx Channels at high data rates - Full error injection and detection - Data capture filtering, 100% bus recording, and physical bus replay - Rate-oriented Label Transmission - Label Selective Trigger for Capture/Filtering - IRIG-B time code encoder/decoder with...show more -
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MEMS Microphone Test
The market is driving the need for improved voice recognition for security, automobile infotainment control, VoIP, accurate language translation, voice-activated consumer devices and high precision hearing aids. The latest next-generation microphones require highly accurate precision testing with SNR tests up to 78 dB with high parallelism, high UPH, in a high volume production environment.
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Electronic Control Unit Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Test & AMP Measure
IP Traffic
IP Traffic - Test & Measure is a software testing tool that can run on any PC with Windows 98, 2000 or XP. It can generate, receive, capture and replay IP traffic, and measure end-to-end performance and Quality Of Service over any IP fixed or mobile network.
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DC Power Systems
Allow efficient distribution of your telecom and data center power utilizing these reliable, scalable and flexible DC power products.
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Non Contact Thickness Measurement Systems
Non contact thickness measurement is becoming more complicated with each passing year.From medical devices to food packaging, we understand the needs from an array of industries to successfully design non contact thickness measurement systems to meet your needs:
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Electronic System Design
ESD
Smart connected devices are everywhere, in homes, in transportation, and at work. This means electronic system design (ESD) is having a greater influence on almost every type of product requiring new simulation tools to help achieve electronic, electrical, mechanical, thermal, and connectivity goals. Altair’s simulation-driven design tools enable your team of specialized engineers to collaborate across all aspects of printed circuit board development from concept to manufacturing. Our products streamline your process, eliminate design iterations, and reduce time-to-market.
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High Voltage Capacitance & Tan Delta Test Set
*Aesthetically designed Single Unit consisting of Measuring Bridge, Power Supply with in-built Standard Capacitor. Ideal for field /portable applications.*Highly compact & Portable – Approx 66Kgs only.*Advanced Protection Circuitry –specially suitable for 400kV s/s applications.*Successfully passed all required EMI/EMC Tests at SAMEER Chennai IEC 61000-4-2;IEC 61000-4-3; IEC 61000-4-4; IEC 61000-4-5; IEC 61000-4-11;*Improved Plug-in type of “Power In” and “Gnd” connectors.*Preo 2 Stage RF Po...show more -
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High-Power Curing System
RC-900
Modular system offering single lamp or dual lamp configurations for low heat, fast throughput curing.
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Telemetering System
ZET 7172
ZET 7172 telemetering system is used to provide wireless access to the instrument line segment using radio channel.
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Test & Measurement
NIF (Dutch Instrument Factory, later Nieaf-Smitt) started in 1900 as one of the first organizations in the world with the design and production of instruments for electrical values. The portfolio of test tools, digital multimeters, current clamps, device testers, installation testers and power analyzers is characterized by quality and reliability.
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Gated Short Wave Infrared Camera System
LIVAR® M506
The LIVAR M506 Gated SWIR Camera System is ideal for covert operations and target identification, supporting lasers from 1.0 1.6 m. Cost-effective, compact and lightweight, this range-gated, two-dimensional imaging camera operates in the eye-safe Short Wave Infrared (SWIR) band, provides day and night coverage, and supports mounted and dismounted operations. The camera system includes the camera, High Voltage Power Supply (HVPS) and Thermoelectric Cooler Controller (TECC). An optional high-PRF version is available that allows the use of low-power, high-PRF diode lasers with the camera in accumulation mode.
