Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
- Pickering Interfaces Inc.
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PXI 10W Programmable Resistor Module, 2-Channel, 1Ω to 470Ω
40-253-014
The 40-253-014 is a programmable resistor module with 2 channels which can be set between 1Ω and 470Ω with 2Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Test System
BMS HIL
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Communications System Analyzer
Freedom R8200
The Freedom R8200 from Astronics Test Systems represents a major step in the evolution of the Land Mobile Radio Test. The Freedom R8200 is the first and only test instrument that combines comprehensive digital and analog LMR testing with the ability to measure important RF network characteristics, such as Distance to Fault (DTF), Return Loss, and Voltage Standing Wave Ratio (VSWR). The Freedom R8200 is also the only service monitor with the abilityto display advanced RF Parameters in a Smith Chart for more complicated network analysis
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Circuit Breaker Test System
TDR900
The TDR900 is your entry-level portable circuit breaker test set.It operates and records a circuit breaker's contact timing, motion, velocity, main contact engagement & synchronization, trip and close coil initiation and currents.Use the TDR900 to verify control circuit, check motion of moving parts, validate time of operation and demonstrate results of circuit breaker maintenance.
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General Purpose Functional Test Systems
Keysight Technologies’ TS-5000 Family of Electronics Functional Test Systems offers a wealth of choices in general purpose instruments, power supplies, switch loading and DIO capabilities in a multiple rack heights, seamlessly connected with open architecture software Test Exec SL, all immaculately assembled and thoroughly tested so you don’t have to.
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PD Test Systems
1. Number of channels: 2/4 electric signal interfaces & 1 EXT interface 2. Sampling frequency: maximum 200MGa/s 3. Sampling precision: 12bit 4. Range: 0.1mV~20V 5. Range switch: 1mV, 2mV, 5mV, 10mV, 20mV, 50mV, 100mV, 200mV, 500mV, 1V, 2V, 5V 6. Frequency band range: 1Hz-60MHz 7. Range non-linear error: 5% 8. Range of capacitance for test object: 6pF~250µF 9. Power source mode: internal lithium cell / AC 220V 10. Display: 6.5 inches TFT LCD 11. Resolution: 640×480 12. PV: 4GB 13. Hard disk: 32G stiff disk used for storing the test data
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Automated Test System
Automated Test System is a production-ready solution that combines test software and various hardware for validation test in both manufacturing and R&D. The solution provides a high performance and cost-effective system based on National Instruments technology.
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16-Station Testing System
The ElectroPuls 16-Station testing system performs high cycle fatigue testing on multiple samples simultaneously, with a fatigue-rated load cell included on each station. The fixture uses a carousel designed with high stiffness and low mass to enable high frequency testing and reduce test time.
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Actuation Methods for Functional Test Systems
Functional test typically applies full operational power to a final product or a loaded printed circuit board in order to determine if the Product/ PCB performs functions as designed. This type of test often involves custom built test equipment and custom test fixturing. Circuit Check supports all forms of functional test strategies within its Signature Series functional test fixtures.
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Automated SAR Test System
ALSAS 10U
Specific Absorption Rate (SAR) is a method for evaluating the exposure conditions of a wireless device to ensure global compliance to government standards. The ALSAS automated test solution allows for the evaluation of SAR both to optimize efficiency of a design and to ensure compliance with international safety requirements. Six independently controlled axis. Calculate multi-spot SAR and perform multi-cube analysis automatically. Covers frequency range of 30MHZ to 6GHz.
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Visible / Infrared / Imaging Test System
System 1808
Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Semiconductor Test Equipment
Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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Test Program Development
Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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Radiated Immunity Test System
Beijing KeHuan Century EMC Technology Co,.LTD
Radiation Immunity Test System.
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200KHz AUTOMATIC TRANSFORMER TEST SYSTEM
VE2729XAU
Its a Microprocessor Based 200KHz Automatic Transformer Tester with inbuilt 20 Pin Channel Scanner for Automatic Switching and Testing Coils & Transformers (Ferrite) with Max. 20 PINS. Test Parameters : -> Inductance (L)-> Leakage Inductance (Lk)-> Capacitance (C)-> DC Resistance (Rdc)-> AC Resistance (Rac)-> Turns Ratio with Winding Polaity-> Quality Factor (Q)-> Impedance (Z)
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Camera Testing
SWIR
CI systems' SWIR turn-key test stations simulates low light conditions to test special application cameras. An intuitive user friendly software carries out a variety of tests. The test stations are radiometrically calibrated to perform comprehensive SWIR tests.
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Salt Spray Chamber
Wewon Environmental Chambers Co, Ltd.
Salt Spray Chamber used for testing the corrosive resistance of products whose the surface was treated with paint, electroplating, inorganic and organic film, anode handling, anti-rust oil, etc. Wall-mount spray system can be freely placed without occupying any effective test space.With imported quartz nozzle, it has the characteristics of smooth interior wall, accurate angle and no crystalline in long-time spraying. Distinctive spring door hinge design makes the chamber door easy to open and close. The inner and external shell of the chamber is made from PVC materials; Easy launder no leakage phenomenon
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Temperature Forcing System
Wewon Environmental Chambers Co, Ltd.
Wewon Technology specializes in the research, development, production and sales of laboratory testing equipment system services. Through more than ten years of accumulation in the field of equipment, the business of wewon Tech is mainly divided into three fields, namely optical communication, automobile and new energy industry.Specialized equipment from Wewon Environmental Chambers Co., Ltd. includes thermal stream instrument, environmental chambers, walk in chamber, salt fog test chamber, vibra...show more -
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PXI Expandable 16x16 RF Matrix 75Ohm Type 43
45-720A-711
The 45-720A module is a 6U 16x16 RF Matrix suitable for switching frequencies to beyond 250MHz. The 45- 720A module is available in 50 and 75 Ohm versions with a choice of coaxial connectors. It is intended for the easy construction of high performance bidirectional matrix switching systems. Automatic Isolation Switches are located on all coaxial connectors, these disconnect the matrix from the external test fixture. This maximises isolation and RF performance.
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High-Performance Autoranging DC Power Module, 60V, 20A, 300W
N6754A
This module is used in both the small, multiple output 1U high N6700 Low-Profile Modular Power System (for ATE systems) and the multiple output N6705 DC Power Analyzer (for bench testing). GPIB, LAN, USB, and LXI compliance are standard. Select from more than 20 different DC power modules, ranging in capability from basic to high precision, and in power from 20 - 300 W.
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Opticle Encoder Tester
Endeavour
Evolusys Technologies Sdn. Bhd.
The Endeavour test system is a complete solution for testing optical digital and analog encoders for electrical and functional test with high accuracy and high speed. It provides high precision, research-grade electrical and functional testing and signal characterization suitable for encoder development. For quality assurance in encoder production, the Endeavour can be easily combined with a handling system for automated, high-end testing and qualification in the production of encoders.
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Partial Discharge Testing
Weshine Electric Manufacturing Co., Ltd
Using the Windows system operating platform, you can freely choose ellipse, straight line, sine wave display, two-dimensional, three-dimensional graphic analysis mode, spectrum window, Q-V-F three-dimensional characteristic window, and static detailed measurement, observation and analysis of partial discharge pulse of one-cycle test voltage .
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PMS-2000 UV-VIS-Near IR Spectrophotocolorimeter (Scientific Grade)
PMS-2000
Hangzhou Everfine Photo-E-Info Co., LTD
PMS-2000, with extremely low stray light and greatly high wavelength accuracy, is trusted by high-end laboratories and scientific research institutions. It not only realizes the high-accuracy test of various light sources and fluorescent materials such as LED, energy-saving lamps, halogen lamps, but also be applied to various professional measurement systems, which are widely used in the fields of photobiosafety, medical devices, ultraviolet, infrared, printing, coatings and so on.
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Electronic Safe & Arm Devices
Excelitas Technologies specializes in the design, manufacture, and testing of MIL-STD-1316 compliant Electronic Safe and Arm Devices (ESAD), Electronic Safe, Arm and Fire Devices (ESAF), and Firing Modules (FM) for safe fuzing requirements of both legacy and next-generation missiles and munitions. Our dedicated staff of research and design experts use the latest advances in technology to design smaller, lighter, and more cost effective ESAFs and FMs to meet evolving requirements of newer more sophisticated weapon systems. Capabilities include a line of components and subsystems that have been qualified for hard target penetration environments and next-generation smaller-class munitions.
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Transportation Simulation Test System
KRD50 series
KRD50 series transportation simulation test system is to simulate the actual road conditions such as shocks and vibrations during the transportation of various items of a specific load, and to evaluate the effect of the actual working conditions on the loading, unloading, transportation, packaging, sealing or internal structure of the goods. In order to assess or confirm the products and packaging.
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Die Sorter Handler
4605-HTR
4605-HTR is a MAP Sorter which picks up devices from wafer ring and sorts to tape or bin according to the MAP file created by film frame test handler or prober. 4605-HTR is a high speed handling system, available for 12 inches wafer rings. When used in combination with 4170-IH, 4605-HTR much improves efficiency in testing process of leadless devices as a high speed sorting machine.
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Test System
LPDDR4 and LPDDR3
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.