AFM
Nanometer size probe which scans for surface deflections.
See Also: Atomic Force Microscopes, SPM
-
Product
Raman Spectrometer
Spec 64
-
The fiber coupled high speed Raman spectrometer is optimized for maximum light throughput and high speed spectrum acquisition. Connected to an AFM or a scanning stage, high speed Raman imaging is possible due to an integration time down to 10 ms per spectrum. The spectrometer can be operated with a separate software as stand-alone device or synchronized via the Anfatec AFM software.
-
Product
Nanoscale Microscopy Standards
-
The nanoscale AFM-CD standard (CD, critical dimension) contains structures to calibrate line widths and periods of AFM (atomic force microscopy) devices.
-
Product
Surface Analysis
Dimension AFP
-
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
-
Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
-
AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
-
Product
Atomic Force Microscope
HDM Series
-
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
-
Product
Real-time and Direct Correlative Nanoscopy
LabRAM Soleil Nano
-
Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
-
Product
Nanolattice Standards for Analytical Instruments
-
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of Electron and Atomic Force Microscopes (AFM). Make the grade, with the highest quality pitch standard of its kind available.
-
Product
Atomic Force Microscope
AFM Heron
-
New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
-
Product
The Level AFM For Educational Purposes
"Eddy"
-
„Eddy“ is an Atomic Force Microscopysystem for student's education. It bases on the approved Level AFMsetup and includes a full sample set and a large cantilever set.
-
Product
High Performance Power Analyzer
AFM-8A
-
AFM-8A has Developed for AFC*(Auto Frequency Control) high performance measurement and frequency update, its update up quickeer than 100mSec. multifunction power analyzer provides high-accuracy measurement and is designed for single phase and three phase application. It includes 4 Digital inputs, 4 Relay outputs, and a RS-485 Modbus RTU Communication port. The user can choose one more communication port, and 2 Analog outputs for output expansion.It provides measure voltage and current of the 2~63 harmonic, and it shows CO2 emissions, which is suitable for power monitoring, management and analyze power quality. It has TOU (time-of-use) function and 4MB Flash memory capacity, allowing users to record data for a long time. It also has a software line adjustment function to reduce the on-site line adjustment work.It has the functions of waveform capture and recording, power record, and event record, which can be used for multifunction power analyzer.
-
Product
CoreAFM - the best value research AFM
CoreAFM
-
The fusion of a modern flexure-guided scanner, XYZ sample stage, camera, active vibration isolation table, and acoustic shielding in a single all-in-one unit results in a complete AFM system with an unparalleled compact footprint. The system comes with a fully digital 24-bit controller developed specifically for the CoreAFM scanhead. All the essential functions of modern AFM are integral components of the CoreAFM system; all you need to do to take the CoreAFM into operation is connect the controller, and plug in power and USB.State of the art electronics with 24-bit ADC and DAC ensure high-resolution XYZ driving of the 100×100×12 µm scanner and allow for low-noise force detection limited only by the cantilever. Thirty-two standard and optional modes with fully compatible add-ons make the CoreAFM the tool of choice for applications ranging from materials research to life science and electrochemistry. Starting from the basic CoreAFM system, its functionality can be seamlessly extended
-
Product
Autofocus Optical Fiber Microscope - AFM-700
-
Shanghai Fibretool Technology Co.,Ltd.
The AFM-700 is an autofocusing optical fiber microscope.
-
Product
Atomic Force Microscope
AFM
-
Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
-
Product
Life Sciences Applications
LS-AFM
-
The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.
-
Product
Air Flow Sensor
ENVIROMUX-AFM
-
Reliable mechanical solution for monitoring air flow. Reacts to any condition causing insufficient flow of air such as malfunctioning cooling fan, increased friction, or physical blockage. Ideal for direct monitoring of a cooling fan, HVAC duct, or under a raised floor. Switch contact is closed when air flow is >8.2 ft/s. Connection: 2x single strand AWG26, length 18 in. Maximum cable length: 1000 ft (305m). Regulatory approvals: RoHS.
-
Product
AFM Atomic Force Microscope
FM-Nanoview 6800
-
Zhengzhou Nanbei Instrument Equipment Co. Ltd
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
-
Product
NanoLattice Pitch Standard (NLSM)
-
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
