Boundary Scan Software
Boundary Scan software is a comprehensive toolset for program development and diagnostics for boards designed with boundary-scan devices.
See Also: Boundary Scan, IEEE 1149.1
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Boundary Scan
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Boundary Scan is a powerful test method for digital circuit components. The hardware and software components we use for the boundary scan implementation come from Göpel electronic
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USRP-2920, 20 MHz Bandwidth, 50 MHz to 2.2 GHz USRP Software Defined Radio Device
781906-01
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20 MHz Bandwidth, 50 MHz to 2.2 GHz USRP Software Defined Radio Device - The USRP‑2920 is a tunable RF transceiver with a high-speed analog‑to‑digital converter and digital‑to‑analog converter for streaming baseband I and Q signals to a host PC over 1 Gigabit Ethernet. You can also use the USRP‑2920 for the following applications: white space; broadcast FM; public safety; land-mobile, low-power unlicensed devices on industrial, scientific, and medical (ISM) bands; sensor networks; cell phone; amateur radio; or GPS.
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Boundary Scan Test
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Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
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The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Scanning Receivers
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PCTEL® scanning receivers are precision network testing tools. Designed for drive testing, walk testing, troubleshooting, and monitoring of cellular, WiFi, IoT, and critical communications networks worldwide, they provide the insights you need to improve coverage and quality of service throughout the wireless network lifecycle.
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Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
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The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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64-Channel Boundary Scan Digital I/O Scan Module
JT 2111/MPV DIOS DIN
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The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.This JT2111/MPV DIOS module is also available through our webshop.
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Boundry Scan Testers
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Qmax Test Technologies Pvt. Ltd.
Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Scanning Acoustic Microscope
Pulse2
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This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Scanning X-Ray Detectors
Shad-o-Scan
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Shad-o-Scan is a family of scanning X-ray detectors specifically designed for the challenging requirements of high-performance industrial and scientific X-ray applications. Industry-leading TDI CCD performance enables the ultimate sensitivity and highest resolution in the industry, and ensures long detector lifetime in even the harshest radiation environments.
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Automation Product Software Development Kit
APS SDK
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APS means “Automation Product Software”. APS library provides users a uniform interface to access all of ADLINK products which support it. It can cover many automation fields especially in machine automation. The most important component in machine automation is motion control. APS library was first born with motion control which co-working components such as system platform management, field bus communication function, general digital input/output, general analog input/output and various counter/timer supports are all built-in components in APS. The APS library will be an all-in-one solution in automation field of ADLINK products.
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Software
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Software to help you easily use Silex technology, such as managing and monitoring Silex network products or implementing network functionality on USB devices.
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3D Scanning Services
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The 3D scanning services provided by our 3D scanning facilities can capture 3D measurements from objects as small as a pin head or as large as a nuclear power generation facility. When we remove the constraints imposed by conventional measurement technologies, the scope of applications becomes virtually limitless with 3D digital data in hand.
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Software
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Baltic Scientific Instruments, Ltd
Software for all Baltic Scientific Instruments
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Software
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From embedded low-level essentials like built-in-test and operating system board support packages, to advanced middleware for board and system health monitoring, image processing and autonomy support, Abaco's ever-growing software suite gives developers what they need to implement their application solutions.
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Renishaw Scanning Probes
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Advanced Industrial Measurement Systems
The REVO® is designed to maximize CMM throughput while maintaining high system accuracy and uses synchronized motion as well as Renscan5 measurement technology to minimize the dynamic effects of CMM motion at ultra high measurement speeds. This is achieved by letting the REVO® head do the fast demanding motion while the CMM moves in a slow linear fashion.
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Software
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Interact with multiple networks, perform diagnostics, node/ECU simulation, data acquisition, automated testing, memory edit or calibration, and vehicle network bus monitoring.
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kSA Scanning Pyro
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For use on Veeco K465i and EPIK700 MOCVD reactors, the kSA Scanning Pyro performs automated temperature mapping in order to measure temperature variations across wafer carriers and wafers. Use it to tune heater zones and optimize process and hardware to achieve higher yields, wafer uniformity and device performance.
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Software
Production C-V Measurement
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Materials Development Corporation
The production software offers a streamlined C-V plotting and bias-temperature stress program with minimumoperator input. A single keystroke begins the measurement.
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Software
TOELLNER-wavecontrol
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Toellner Electronic Instrumente GmbH
The Software TOELLNER-WaveControl provides waveforms and controls the TOELLNER system components at the test station, which can be individually tailored to your requirements. Using a DAQ-Card, any signal waveform can be provided with Arbitrary Power Supplies or 4-Quadrant Amplifiers with outputs from 160 W to 5200 W. For fast interruptions, TOELLNER offers electronic switches with switching times below 500 ns.
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Software
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Analysis software for use with our ranges of health and safety level meters, including the Vocis and Sonus noise meters, Excieo vibration meters and others in our range. Software comes complete with necessary software, manual and connecting cables.
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Polarization Lambda Scan Software License
N7700100C
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Enables polarization-dependent swept-wavelength multichannel measurements with the PAS LS engine and PAS IL/PDL engine, as well as measurements without varying polarization with the PAS LS engine and PAS FSIL engine.
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Fast Lambda Scan Software License
N7700102C
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Enables fast swept-wavelength multichannel measurements with the PAS LS engine and PAS FSIL engine.
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software
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The ATE Software GmbH is a small but nice software house in the center of Frankfurt. We stand for creative applications instead of interchangeable commodity. Therefore, we have upcoming IT technologies and trends always in view and provide our customers with "State Of The Art" software solutions that keep future requirements state.
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Scanning Electrochemical Systems
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The VersaSCAN is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements. Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base. Different auxiliary pieces are mounted to the positioning system. These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments. VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.
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Software
DIFFRAC.SUITE
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DIFFRAC.SUITE represents a new software platform offering a wide range of software modules for easy X-ray powder diffraction data acquisition and evaluation. Based on Microsoft's .NET technology, DIFFRAC.SUITE offers all the advantages of most modern software technology for maximum ease of use and networking.
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Laser Scanning Microscopes
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A confocal laser scanning microscope scans a sample sequentially point by point, or multiple points at once. The pixel information is assembled into an image. As a result you acquire optical sections with high contrast and high resolution in x, y and z .





























