Surface Profiling
See Also: Surface Profile, Surface Profilers
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Product
Low Profile PCI 8 Reed Relay Output
8012H
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Optimized for sensing 24V inputs, the 8012H Low Profile PCI digital interface provides eight Reed relay outputs (SPST) and eight optically isolated inputs supporting 10-30V. Reed relays are well suited for low current applications. The relays are normally open, and close when energized. The board is MD1 Low Profile and Universal Bus (3.3V and 5V) compatible.
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Product
Ice Profiler
IPS
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Estimate ice forces for design of offshore platforms and operational planningDetermine the extreme thickness of ice for pipeline installationsExamine in detail the underside of sea-iceUnderstand the dynamics and thermodynamics of the sea ice regime for scientific research.Climate change studies
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Product
Rotary Surface Grinders
IG Series
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Our rotary surface grinders have evolved by meeting the needs of customers in fields as diverse as electronics, aerospace, photonics, and metalworking. The surface finish on a DCM grinder is similar to Blanchard® grinders by Bourn & Koch, but that is where the similarities end.
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Cross-Correlator Pulse Profiling Systems
Rincon
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The third order cross-correlator is ideal for looking at the full range of output from amplified femtosecond laser systems. High temporal resolution over a long (close to 1 ns) window shows pulse features that are usually missed, giving the user a detailed and complete picture of the quality and stability of the output pulse parameters of their femtosecond lasersystem.
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Product
Mini Low Profile Load Cell Universal/ Tension or Compression
MLP SERIES
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The model MLP Series load cells were designed with economy as first priority. They are a scaled down version of our successful LPO Series Load Cells. MLP-10 through MLP-300 are anodized aluminum and the MLP-500 through MLP-1K are made from 17-4ph heat treated stainless steel. The unique low profile design of the MLP Series provides excellent stability for in line applications for tension and/or compression, while saving space at the same time.
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Surface Contamination Kit
138/2
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The Elcometer 138/2 Surface Contamination Kit provides the user with a means for testing invisible surface contaminants including:pHchloride ionsironsalts
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Product
Aluminum Electrolytic Capacitors (Surface Mount Type)
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Panasonic Industrial Devices Sales Company of America
As a worldwide leader in Capacitor products, Panasonic provides a vast selection of Surface Mount Type Aluminum Electrolytic Capacitors featuring high reliability, long life, low impedance and high ripple current. With 30 Series to choose from, there's a Panasonic SMT Lytic Capacitor for any application.
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Product
Surface Insulation Resistivity Tester
Model SRT1
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The model SRT1 is an advanced instrument for measuring surface insulation resistivity following ASTM standard A717 (IEC 404-11). Featuring the improved, patented Allegheny Ludlum Head*, which providesincreased reliability and repeatability while decreasing maintenance costs. Its floating baseplate assures button alignment across the full sample width and length.
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Software Modules for Smooth, Freeform CAD Surfaces in Verisurf Reverse
Verisurf Quick Surface
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Quick Surface is a powerful option for Verisurf Reverse that efficiently creates smooth, high-quality surfaces from meshes derived from scan data or STL files. Quick Surface maintains curvature continuity between adjacent surfaces and is ideal for creating smooth, high-speed toolpaths.With Quick Surface, it’s a snap to produce freeform CAD surfaces from organic or prismatic Verisurf meshes and assess the surface-to-mesh fit quality prior to export for additional, downstream modeling or other processing. Quick Surface is an ideal enabler for scan-to-part or scan-to-3D-printing workflows.
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Product
The Complete Solution for Optical Surface Quality Inspection
OptiLux SD (Scratch-Dig)
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RedLux’s OptiLux SD system provides the complete solution for control of optical surface quality (scratch-dig) by offering a breakthrough in measurement performance along with conformity to industry standards. Designed with flexibility in mind and further enhanced by a range of customer inspired features, the OptiLux SD can support the most demanding of optical surface quality inspection processes, from highly customized optical components in low volume, to standard components in high volume.
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Product
Logger version CTD profiler with optical fast DO sensor
RINKO-Profiler
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CTD profiler with optical fast DO sensor
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Product
RF Shielded Test Enclosure, Low Profile
JRE 1618
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Like its other brothers in the JRE test line, it features rugged welded aluminum construction with superb RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan.
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Product
In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
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ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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Product
Digital Automated Interferometer for Surface Inspection
DAISI
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DAISI (Digital Automated Interferometer for Surface Inspection) achieves the high workability and repeatability with the features such as auto-focus function, auto-calibration function and auto connector fixing system.
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Product
19" Drawer with Writing Surface, Unshielded, 8.75"H x 30"D
DR-081930-S
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Unshielded drawers with writing surface are constructed of 20 ga. CRS and are furnished with ball bearing chassis slides to provide smooth operation. Available for 19" and 24" rackmount in 20", 24" and 30" depths, with or without a keylock
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Product
Low Profile PCI 8 Reed Relay Output
8012
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The 8012 Low Profile PCI digital interface provides eight Reed relay outputs (SPST) and eight optically isolated inputs. Reed relays are well suited for low current applications. The relays are normally open, and close when energized. The board is MD1 Low Profile and Universal Bus (3.3V and 5V) compatible.
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Product
19" Drawer with Writing Surface, Unshielded, 3.5"H x 24"D
DR-031924-S
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Unshielded drawers with writing surface are constructed of 20 ga. CRS and are furnished with ball bearing chassis slides to provide smooth operation. Available for 19" and 24" rackmount in 20", 24" and 30" depths, with or without a keylock
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High-Performance Surface Plasmon Resonance System
SPR-32
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Features like ‘Frame Inject’ allows for turn-key sample processing protocols and customized workflows created together with pharmaceutical customers. The faster data analysis and highly intuitive user interface combine to deliver an industry-leading SPR throughput of 10,000 control-substracted binding measurements. Combining flexible 8-needle sample delivery with a 32-sensor detection array laid out in 8 detection flow cells, enables 4 sensors per flow cell, an important advantage for controlled, high-throughput SPR methods. The patented Hydrodynamic Isolation™ technology enables ‘Any Sample, Any Sensor, Any Time’, making it the preferred platform for screening, kinetics, thermodynamics and epitope mapping for pharmaceutical applications.
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Product
Beam Profiler
BladeCam Series
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0.65" Thin! Portable, Port-Powered, USB 2.0, Beam Profiling for Windows XP & Vista, Intel-Mac.
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VisionGauge Digital Optical Comparators / Digital Profile Projectors
500 Series
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The VisionGauge Digital Optical Comparator is The Fastest, Easiest, Most Accurate Way to Compare a Part to a CAD File. Our VisionGauge Digital Optical Comparators: Produce a very high contrast image with very sharp edge profiles so that there is no problem viewing it in full daylight Are much more accurate, more powerful, much faster, include CAD Auto Pass/Fail and CAD Auto-Align, works directly with CAD data so there no mylars or templates are needed, etc.
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Product
CableEye Generic Surface Mount & TH Board | Cable & Harness Tester
CB51
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CAMI Research Inc. (Acton, MA) announces another new board for its CableEye cable and harness testing systems. Populated with solder pads to accept both aligned and staggered, 1.25mm and 1.5mm pitch, surface mount and through hole (TH) connectors, the board addresses any market with a demand for board-to-board connections. Rated to 700Vdc/500Vac, the CB51 may be used on all CableEye models.
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Product
Plant Auditor's Surface Resistance Kit
PMK-153
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The PMK-153 Resistance Test Kit contains the instruments you need to take resistance measurements.The PMK-153 includes the PAS-853B Wide Range Ohmmeter with 5 pound Conductive Rubber Electrodes. The PAS-853B instrument is a wide range ohmmeter that measures accurately from 0.01 to 9.9x1012 ohms. In AUTO mode the instrument automatically adjusts resistance range and selects test voltage in accordance with standard practices outlined in ANSI/ESD STM11.11, and meets audit requirements of ESD TR53.
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MiniCTD Profiler
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The miniCTD has been developed to provide a cost-effective tool for the collection of CTD Profiles, without compromising the quality of the data.
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EV Profiler Kit V2
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Harness the power of single-molecule localization microscopy to characterize EVs across scales. Quantify nanometer small, rare, and precious EV samples with super-resolution precision. ONI’s EV Profiler helps you focus on answering the right questions about your EV populations.
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Surface Comparators & Magnifier
127
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Designed for use with the Elcometer 127 illuminated magnifier, each surface comparator has a hole in the centre allowing for clear visual comparisons to be made.
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Product
IEC60335 Clause 21.101 Copper Test Vessel For Hotplate Surface Test
CX-103
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Shenzhen Chuangxin Instruments Co., Ltd.
IEC60335 clause 21.101 copper test vessel for hotplate surface test
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Product
Lock/Eject DIP Collet Socket with Surface Mount Pins
EJECT-A-DIP
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Lock/Eject DIP Collet Sockets with Surface Mount Pins. Features: Aries Eject-A-Dip is a rugged, solderable socket with a unique ejector/latch for fast in-field board maintenance. The latch locks in the connector or device, making it ideal for high vibration environments. The latch, when used as an ejector, removes DIP packages without pin damage.
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Product
Sapphire/SIC Wafer Flatness and Surface Appearance System
FM200
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Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.
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Non-destructive Eddy Current Testing of Long Products such as Tubes, Rods, Wire, and Profiles
DEFECTOMAT® Product Familiy
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Foerster Instruments, Incorporated
The DEFECTOMAT systems by FOERSTER were specially developed for quality testing and process monitoring of long products. From hot testing to all bright steel processing steps, the surfaces of semi-finished products made from austenitic, (non) ferromagnetic metals can be tested for defects. The DEFECTOMAT systems operate in a contactless and non-destructive manner in accordance with the eddy current method and are used for detecting short defects, such as holes or localized defects and transverse defects. The systems detect defective materials fully automatically and reliably. Defects can be marked, classified, and automatically discarded. the test speed of up to 150 m/s facilitates 100% testing, even at high production speeds. The systems benefit from low operating costs and frugal energy consumption as well as low maintenance costs, few wear parts, and low use of materials.
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Product
Large Aperture Beam Profilers
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Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
