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Product
High Intensity Acoustic Sensors
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Columbia Research Laboratories
Columbia's High Intensity Acoustic Sensors are designed for the measurement of gas-borne sound in industrial applications. They are constructed of type 316 SS for use in corrosive environments. These sensors offer a variety of connector and mounting options, all of them when combined with the all-welded construction provide a true hermetic seal.
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Product
Acoustic Imaging Cameras
Si1 and Si2 Camera series
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Helps you significantly lower costs associated with mechanical bearing issues and partial discharge on electrical equipment. It also enables you to drastically reduce leaks in your facilities, cutting down expenses related to compressed air and gas leaks.
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Product
Room Acoustics Analysis on iOS
RoomScope
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RoomScope turns your iPad, iPhone, or iPod touch into a room acoustics measurement and analysis tool. With RoomScope, you can measure a room impulse response and then calculate reverberation time, early decay time, clarity, and definition, as defined in the ISO 3382 standard. RoomScope also allows you to adjust the Schroeder decay curve integration limits with the touch of your finger and plot the calculated room parameters versus whole or 1/3-octave band center frequency.
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Product
Plastic And Reconstructive Surgery Microscopy Solutions
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Leica plastic and reconstructive surgery (PRS) microscopes give you the performance and reliability you need to repair intricate and fine structures during the most delicate reconstructive procedures. They feature high-quality optics, easy operation, and integrated visualization technologies, such as fluorescence filters and augmented reality (AR) fluorescence.
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Product
Acoustic Noise
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American Environments Co., Inc.
A Test Specimens can be evaluated in two different modes in reference to acoustic noise: The Test Specimen's response to acoustic noise and the Test Specimen's generation of acoustic noise.
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Product
Manikins for realistic simulation of the acoustic properties of a human
Head & Torso Simulators
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If you need to carry out realistic in-situ measurements of headphones, telephones or hearing aids, you need a Head and Torso Simulator such as the B&K ‘HATS’ – Type 4128D or GRAS’ Kemar to complete your test setup. These manikins have built-in ear and mouth simulators that provide a realistic reproduction of the acoustic properties of an average adult human head and torso. They are commonly used for tests on telephone handsets, headsets, audio conference devices, microphones, headphones, hearing aids and hearing protectors. Please contact your sales engineer or email sales@listeninc.com for more information.
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Product
HEAD acoustics Radio Analyzer Tool
TUNE
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The HEAD acoustics Radio Analyzer Tool TUNE allows a reproducible analytical evaluation of the impact of analog radio broadcast disturbances on perceived audio quality based on auditory test results.
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Product
Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
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HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Product
Acoustics Analysis
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The sounds a product makes directly impact on user experiences. Sounds create strong emotions — positively or negatively — that reinforce brand identity. The difficulty of predicting acoustic results means that a single engineering mistake can prove costly to the final product, making Ansys Acoustics Analysis a powerful solution to ensure optimal acoustics and a successful end product.
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Product
Acoustic Control System
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m+p VibControl performs acoustic testing in reverberation chambers and direct field environments as well as progressive wave tube testing. It is a fully automatic digital control system, providing fast, accurate and repeatable control of high-level noise to a reference octave band spectrum and the overall sound pressure level (OASPL). The control guarantees a high level of product safety.
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Product
Atomic Force Microscopy
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Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Product
Audio and Acoustic Functional Test Solution
Functional Test
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Product
X, Y, Θ Position Calibration Plate For Machine Vision and Microscopy
nanoGPS OxyO Scale
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nanoGPS OxyO® Scale is a position calibration plate for Machine Vision and Microscopy, available as OEM or stand-alone solution from HORIBA Scientific.nanoGPS OxyO® technology is based on taking a picture of a patented patterned substrate, and interpreting this picture into position (x, y) and orientation (θ). The nanoGPS OxyO® Encoder is also based on this technology.
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Product
Acoustic Microscope
AMI D9650
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Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
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Product
Acoustic Scintillation Flow Meter
ASFM
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Assess/optimize existing turbine operating efficiencyAccept new or upgraded turbinesVerify minimum flow requirements
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Product
Scanning Electron Microscopy (SEM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Product
Acoustic Target Impact Localization System
ATILS
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In peace time, for training purposes, artillery units conduct their frequent target practicing.Both the skills of the gunners and the forward observers need to be improved, their communication cycle to be shortened.Forward observing is a dangerous task during war time, causing a justification to find other ways to localize impacts and adjust fires.Furthermore, the sheer lack of a line of sight, because of topography and/or weather, also thrives the need for other solutions to determine the impact coordinates.
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Product
Collaborative Correlative Microscopy
nanoGPS navYX
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Correlative microscopy is the combination of multiple modalities performed on the same sample. The results produced emphasize the strengths of each modality while offsetting their individual limitations.nanoGPS navYX™ is an open solution which makes SEM-Raman correlative microscopy seamless regardless of the electron and optical microscopes used. Simply stick the Coordinates Transfer System to the sample!
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Product
Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Product
Acoustic Emission Transducer
ZET 601
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The acoustic emission sensor is the most important element of any acoustic emission NDC system. The ZET 601 acoustic emission transducer converts AE-process acoustic signal to an electric signal parameters of which are used for the assessment of acoustic emission sources.They are used for technical diagnostics using passive ultrasound.
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Scanning Acoustic Microscope
Pulse2
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This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Scanning Thermal Microscopy Module
VertiSense™
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SThM module for thermal conductivity contrast and a temperature contrast imaging. Supports Contact, Tapping™ and Peak Force Tapping modes. Plug-in module, compatible with most commercial AFMs. Real temperature measurements up to 700° C. Ultra-low noise, high speed amplifier. Innovative probe design.
