Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Shock Response Spectrum (SRS) Analysis Solution
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Shock Response Spectrum (SRS) Analysis SolutionMechanical shock pulses are often analyzed in terms of the shock response spectrum. The shock response spectrum assumes that the shock pulse is applied as a base input to an array of independent single-degree-of-freedom systems. SDOF system assumes that each system hat its own natural frequency.
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PathWave BenchVue Advanced Power Control And Analysis
BV9201B
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The BenchVue Advanced power control app helps characterize voltage and current measurements and generate arbitrary waveforms for single instrument support.
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Full-Wave Three-Dimensional Analysis Software
EZ-FDTD
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Based on the Finite-Difference Time-Domain method, EZ-FDTD brings the full power of electromagnetics to solve complex EMI/EMC real-world problems for any frequency ranges that your application demands. Eliminate guessing for critical problems. Eliminates rule of thumb uncertainty. Provides insight, confidence and solutions.
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Water Analysis Meter
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Shanghai Selon Scientific Instrument Co. Ltd.
A tool used to measure various physical and chemical properties of water to determine its quality.
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Spectrally Controlled Interferometry For Measurement And Analysis
SCI
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Directly measure all surfaces and angles in one setup, for an ROI of < 1 year.
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Digital Electronic Scale
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A type of electronic weighing machine, which is used to measure many readings
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Spectrum Analysis For P50xxB Up To 32 GHz
S970906B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Complete Power Quality Analysis System
PK4564
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PK4564 complete Power Quality Analysis System includes PS4550 Power Quality Analyzer with extended memory, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, and 1-year deluxe warranty.
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Electronical Load Board 3U CompactPCI (air cooled)
045-097
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The 3U load boards are designed to simulate the power consumption of a single board computer and other boards on the backplane.
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Electron Probe Microanalyzer
EPMA-8050G
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This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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Easy CAN Analysis Tool
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Easy CAN of Peritec made, is CAN analysis tool low price using NI cRIO-CAN and ECU test systems Peritec, PCMCIA-CAN, the USB-CAN.
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Spectroscopy
Metrohm Instant Raman Analyzers
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Handheld spectrometer for quick and easy identification of unknown substances
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Electronic Compass for Dynamic Conditions - Vibration, Acceleration, Uneven Terrain, or Rough Seas
Revolution GS
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If your compass application involves vibration, acceleration, uneven terrain, or rough seas, you will find the True North Revolution GS electronic compass to be an uncompromising solution that will outperform rival units costing considerably more. The GS provides remarkably accurate heading, pitch, and roll in dynamic conditions. It all starts with a precision 3-axis solid-state magnetometer. Two angular rate gyros independently stabilize pitch and roll. They augment a dual-axis electrolytic tilt sensor that provides precise tilt measurements in static environments. Two sets of independent filters, one set for pitch and one for roll, combine gyro and electrolytic sensor measurements to provide the best available tilt measurements.
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Electronic Load Board 3U CPCI-S (air cooled)
056-377
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The 3U load boards are designed to simulate the power consumption of a single board computer and other boards on the backplane.
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Electronical Load Board 3U VME64x (air cooled)
056-921
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The 3U load boards are designed to simulate the power consumption of a single board computer and other boards on the backplane.
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Sensor Placement & FEA Analysis
GageMap - GM
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APEX Turbine Testing Technologies
Apply strain gages and accelerometers to your finite elementmodel independent of the mesh anywhere you want, or letGagemap do it for you.
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Fluctuation Sound Analysis Function for O-Solution
OS-0526
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Although the magnitude of the sound is not so large, there are many “unpleasant sound” in the world. For example, “rattling” and “humming“ sounds generated from interior items while driving a car, or abnormal sounds such as “buzzing“ sounds that can be heard in the rotation sound of a small motor, etc. Sounds with significant temporal fluctuation often feel unpleasant even the magnitude of sound (level) is not so large.
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Impurity Analysis In Bulk Gas
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High-purity gas is necessary in industries such as chemical, medical, and foods. Precisely controlled GC enables identification and quantitation of a trace amount of impurities in bulk gas. If the gas resources in a factory consist of multiple lines, a sample line selector SLS-2020 can be utilized to switch sample lines automatically, allowing a single GC to analyze all samples.
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Spectrum Analysis Up To And Beyond 125 GHz
S93094B
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The S93094B has all of the capability of the S93090xA spectrum analyzer application with an upper frequency limit determined solely by the broadband or banded millimeter-wave frequency extenders used in the system.
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Dynamic Signal Acquisition and Analysis
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m+p Analyzer systems are available for field and laboratory use from 4 to many hundreds of measurement channels. From gathering simple time history data to narrowband (FFT) spectra, fractional octaves, wavelets, shock response spectra and much more, m+p Analyzer real time analyzers can be used with a wide range of instrumentation hardware including our own m+p VibPilot, m+p VibRunner and m+p VibMobile systems, National Instruments (CompactDAQ USB, PCI, PXI) and VTI Instruments (PCI). Low cost portable instruments to systems for distributed measurements can be configured for maximum flexibility. Measurement data from all sources are stored in a common format so it is easy to compare and handle results from any measurement source.
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Inductively Coupled Plasma Optical Emission Spectroscopy / ICP-OES Systems
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Industry-leading performance, speed and ease of use – no compromises
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High-end Transmission Electron Microscope
CryoARM
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JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Saluki SEL8 Series Programmable DC Electronic Load (up to 200KW)
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The new SEL8 series programmable DC electronic load is a new generation product designed by Saluki Technology. Incorporating high-performance chips, the SEL8 series delivers high speed and high accuracy with a resolution of 1mV and 1mA (basic accuracy is 0.03% and basic current rise speed is 2.5 A/μs).SEL8 series have wide application from production lines for cell phone chargers, cell phone batteries, electronic vehicle batteries, switching power supplies, linear power supplies, and LED drivers, to research institute, automotive electronic, aeronautic and astronautic, maritime, solar cell and fuel cell etc. test and measurement applications.* Customization available upon request
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Destructive Physical Analysis (DPA)
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Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
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*Beam Propagation Analysis
M²
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M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
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Occlusal Analysis with BiteForce DynamicsTM
T-Scan
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The T-Scan is a diagnostic device that measures relative biting forces, including occlusal force, timing and location and is an ideal complementor to articulating paper. The technology was invented by Dr. William Maness in 1987 at Tufts University and M.I.T.
