Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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PathWave Vector Signal Analysis Software
89600 VSA
A comprehensive set of tools for demodulation and vector signal analysis.
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High Speed-Large Current DC Electronic Load (CC/CV/CR/CP)
PLZ-4WL Series
While the PLZ-4WL series succeeds to the superior operability of our conventional model of the PLZ-4W series, the PLZ-4WL series realizes the high speed rise and fall time (slew rate of 50A/µs.) in the range of low voltage with large current. The PLZ-4WL offers six operation modes, and equips with various features such as sequence operation, switching operation, soft-start function, and time and voltage measurement. The PLZ-4WL applies not only for the conventional load test of the CPU power supply, but also it can be applied to even faster current response test. In addition, the PLZ-4WL is a space-saving design (about 50% less volume of the conventional model) that can save the facility space of the testing site, and it can be applied for the single cell testing of the large scale rechargeable battery.
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Electronics Design Software
Altium Designer
Professional unified design system, high productivity stress-free environment and native 3D PCB editor. Easily design the most complex and innovative board layouts with advanced and accessible routing tools. Stay at the frontline of innovative technology development with the world's first-and-only support for rigid-flex PCB design.
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Seismic Analysis and Monitoring
Seismic analysis and monitoring have been designed on the base of the contemporary seismic studies. We can offer you a wide range of tools for geophysical surveys, seismic tomography, automated monitoring of bearing structures (structural health monitoring), seismic monitoring of oil piping systems.
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Scanning Electron Microscope
E5620
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Gas Analysis
HPR-20 EPIC
The Hiden HPR-20 EPIC gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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DC Electronic Loads
Keysight DC electronic loads provide you with the flexibility to test a wide range of applications from power-supply test to simulation of high-intensity discharge (HID) headlamps. The 16-bit voltage, current and power-measurement system provides both accuracy and convenience, and eliminates the need for a DMM, external shunts and wiring.
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250 Watt Electronic Load Module
N3303A
The Keysight N3303A is a 250 W (0-10A, 0-240V) electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3303A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3303A can also digitize waveforms.
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Electronic Circuit Simulator
SimOne
SimOne lets you perform full-featured electronic circuit simulation using state-of-the-art and classic modeling algorithms while taking full advantage of modern computers.SimOne does all the basic circuit analyses common to SPICE modeling systems and as well provides important Stability analysis.
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Current Signature Analysis
The Iris Power MDSP3 uses the Current Signature Analysis technology which relies on the concept that faults in the induction motor rotor or driven components result in changes to the rotor magnetic field pattern. Unique magnetic rotating fields are produced due to the faults which induce detectable stator current components indicative of the fault.
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Raman Spectroscopy
We provide complete Raman spectroscopy solutions for analytical measurements, research Raman, UV Raman, QC/QA and industrial Raman applications. These include Raman microscopes, hybrid Raman systems (such as Raman-AFM), modular Raman systems, transmission Raman analysers, dedicated in situ process Raman spectrometers, and miniaturised Raman instruments for high volume OEM manufacture.
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Auditor Universal Electronic Testers
AUET-DC Series
The Auditor Universal Electronic Testers (AUET) have a broad range of features to accommodate most requirements. These instruments are designed to be bench top mounted and are available in several configurations and various single or multiple torque ranges. They are also available with file capability (DC) models. The DC models require PC software Auditor Tool Manager (ATM).
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Picosecond-Diode Lasers for Spectroscopy
Designed and manufactured by Becker & Hickl – bh delivers prominent picosecond diode lasers with wavelengths from the NUV to the NIR. All bh pulsed diode lasers work with simple +12V power supply or pull their power from the USB port of a PC or Notebook Computer. Other features are high repetition rate, short pulse width, unprecedented timing and power stability, and extremely low electrical noise level.
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Surface Analysis
Innova-IRIS
This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Electron Multiplication (EM) Standard Image Sensors
EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Failure Analysis
A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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Acoustics Analysis
The sounds a product makes directly impact on user experiences. Sounds create strong emotions — positively or negatively — that reinforce brand identity. The difficulty of predicting acoustic results means that a single engineering mistake can prove costly to the final product, making Ansys Acoustics Analysis a powerful solution to ensure optimal acoustics and a successful end product.
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Image Processing and Analysis Software Deep Learning Module
ENVI® Deep Learning
L3Harris Geospatial Solutions, Inc
L3Harris Geospatial has developed commercial off-the-shelf deep learning technology that is specifically designed to work with remotely sensed imagery to solve geospatial problems. The ENVI Deep Learning module removes the barriers to performing deep learning with geospatial data and is currently being used to solve problems in agriculture, utilities, transportation, defense and other industries.
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Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Malware Analysis
The Tevora malware analysis process begins with the identification and quarantine of the software in question. Our experienced analysts will then test the malware in our malware analysis lab and isolate the malicious software so its behavior can be learned. Understanding what a particular piece of malware is designed to do, helps direct focus on what other systems and information are at risk.
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Data Analysis & Graphing Software
OriginPro
Take your data analysis to the next level with OriginPro. In addition to all of Origin's features, OriginPro offers advanced analysis tools and Apps for Peak Fitting, Surface Fitting, Statistics and Signal Processing. Features specific to OriginPro are marked with the PRO icon in this page.
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System Modeling for Diagnostic Design and Analysis
EXpress
eXpress is a comprehensive model-based diagnostics engineering software application providing an environment for the design, capture, integration, evaluation and optimization of complex or large-scale system diagnostics, prognostics health management (PHM), systems testability engineering, failure mode and effects analysis and system safety analysis. eXpress is uniquely suited to influence the diagnostic development for new designs or to exploit the diagnostic challenges of existing legacy systems. Its robust structure facilitates the capture of extensive interdisciplinary design knowledge providing an unmatched ability to corroborate, reuse and re-purpose expert knowledge in performing standardised testability, reliability and maintainability analyses.
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High Power DC Electronic Loads
63200A
Chroma Systems Solutions, Inc.
Chroma High Power DC Electronic Loads provide wider operating voltage and current ranges up to 240kW, sine wave loading, dynamic frequency sweep to 50kHz, digitizing, MPPT, an impressive front panel that tilts, and the highest accuracy available (voltage 0.015% + 0.015% F.S. and current 0.04% + 0.04% F.S.) – all with an incredibly high power density (6kW @4U).
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GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Packet Analysis Probe for PCI Express
N4220A/B
When purchased with a logic analyzer, the application software you order is installed on the instrument hard drive. If you need to add application support after your initial logic analyzer purchase or are controlling a logic analyzer from a host PC, you must install the appropriate software before you can make measurements.
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Stack Analysis Tool
GNATstack
GNATstack is a software analysis tool that enables Ada/C/C++ software development teams to accurately predict the maximum size of the memory stack required to host an embedded software application. GNAT Pro add-on.
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Microchip Electrophoresis System For DNA/RNA Analysis MCE™
202 MultiNA
This system is used to analyze the size of DNA/RNA samples, with convenientanalytical operability. It achieves analysis costs on par with agarose gel electrophoresis, and can perform fully automatic analyses of up to 108 samples. Using optimized reagent kits (four types for DNA analysis and one type for RNA analysis), the system achieves a high resolution and high sensitivity. It can significantly improve the workflow for mutation checks in genome editing, and genotype determination.
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Enhanced Time Domain Analysis With TDR
S96011B
Use S96011B to perform enhanced time domain analysis for high-speed data applications. Includes all functionality of the S96010B (TDR/TDT mode). In addition, the S96011B enables more detailed measurements and evaluations, such as eye diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S96011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, use mechanical calibration kits or ECal with DC option (i.e. N469xD or N4433D with Option 0DC).
