Failure Analysis
examination of faults, determine root cause and recommend corrective actions.
See Also: Crush, Performance Testing, Investigation
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Product
Scanning Electron Microscopy (SEM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Product
Data Analysis
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Power Monitoring and Diagnostic Technology Ltd.
PMDT Engineers are always available to review your test samples and to provide guidance to users in the field. Our PD experts have the ability to accurately analyze various types of field test data based on PRPD/PRPS spectrums, waveforms and audio files collected during a field test.
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Product
Spectrum Analysis For P50xxB Up To 6.5 GHz
S970901B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Product
Spectrum Analysis, Up To 70 GHz
S930907B
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The S930907B spectrum analysis (SA) adds high-performance microwave spectrum analysis to the N522xB/N524xB PNA family up to 70 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Product
Bluetooth Stack Analysis Tools
Bluetooth Explorer 400
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The Ellisys Bluetooth Explorer is a Bluetooth stack analysis tool for traffic monitoring, stacks and drivers debugging, interoperability verification and performance analysis.
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Product
Noise & Vibration Analysis
DATS Software
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DATS is a comprehensive package of data acquisition, signal processing and reporting tools. It is used mainly for noise and vibration analysis, but can be used for a wide range of engineering and general signal processing tasks.
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Product
Measurement Analysis Equipment
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Facility fault diagnosis measuring instrument with technology that accurately tracks the heating part and abnormal noise generating part during operation of machinery using thermal imaging camera and microphone
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Product
Air Gap Monitoring & Analysis
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Solutions for air gap monitoring in order to plan maintenance prior to reduced operating efficiency or damage from magnetically induced heating or rubbing between the rotor and stator.
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Product
Error Distribution Analysis Package For M8000 Series BER Test Solutions
M8070EDAB
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The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070EDAB Error Distribution Analysis package offers features like burst mechanism detection and analysis, frame loss ratio estimation and error mapping.For instance, you can easily estimate your FEC decoder margin or find the root cause of systematic errors by exploring the error map. The plugin also supports the use of real-time scopes as error detector.
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Product
Systems Analysis Interface
Saint2
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The Systems Analysis INterface Tool 2, a Delphi Preferred Tool, for Low-cost EOL Testing & Reflashing Without the Need of Additional Hardware.
