Spectrum Analysis, Up To 70 GHz

The S930907B spectrum analysis (SA) adds high-performance microwave spectrum analysis to the N522xB/N524xB PNA family up to 70 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.

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Network Analyzer Software

Keysight Technologies

Network analyzer software tools enable you to investigate, characterize, and troubleshoot your designs in a variety of measurement applications. Software applications are available for PNA-X, PNA-L, PNA and ENA series network analyzers.

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Advanced Pulsed-RF Measurements

S93026A - Keysight Technologies

The S93026A advanced pulsed-RF measurements includes all of the capability of the S93025A (including enabling the four internal pulse generators), and adds the narrowband-pulse-detection method to extend pulse measurement capability to 20 ns pulse widths for point-in-pulse measurements, and 10 ns timing resolution for pulse-profile measurements.

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Basic Pulsed-RF Measurements

S93025A - Keysight Technologies

The S93025A basic pulsed-RF measurements enables four internal pulse generators that can be used to control the internal pulse modulators (N522xB/N524xB Options 021 and 022), and it provides an integrated pulse application that uses the wideband-detection method. The pulse application provides an easy way to set up point-in-pulse measurements with pulse width as narrow as 200 ns, and pulse-profile measurements with 50 ns minimum timing resolution.

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Dynamic Uncertainty for S-Parameter Measurements

S93015A - Keysight Technologies

The S93015A dynamic uncertainty for S-parameters can display the measurement uncertainty dynamically ('real-time') on the same screen as the measurement trace and get more reliable uncertainty estimation. The S93015A is equivalent to Option 015 on PNA/PNA-L/PNA-X Series A model network analyzers.

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Gain-Compression Measurements

S96086A - Keysight Technologies

The S96086A adds the software capabilities for the gain compression application (GCA). GCA provides fast and accurate input power, output power, gain, and phase at the compression point of an amplifier or frequency converter, over a specified frequency and power range, with a simple setup. GCA eliminates the problems of lengthy test times and inconvenient setups by providing SMART Sweep that is easy-to-use, fast and accurate. GCA also includes a guided calibration that corrects for absolute power levels, frequency response, and mismatch errors.

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Materials Measurement Suite

N1500A - Keysight Technologies

With Keysight N1500A materials measurement software suite, you can determine the intrinsic electromagnetic properties of many dielectric and magnetic materials. The complete system is based on a versatile Keysight network analyzer which measures the material’s response to RF or microwave energy. The N1500A software controls the network analyzer and calculates results. Depending on the Keysight network analyzer and sample holder or fixture used, frequencies can extend from a few hundred MHz into the low THz.

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Measurement Wizard Assistant (MWA) Software

S96790A - Keysight Technologies

The S96790A software simplifies complicated multiport measurement setups and calibration processes using the 4-port E5080A and the E5092A configurable multiport test set(s). The combination offers a comprehensive multiport solution up to 40 ports. The software dramatically improves the productivity of your multiport device testing.

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Mechanical Noise Tuner Control

S93027B - Keysight Technologies

The S93027B enables to control Maury Microwave’s LXI tuner as the impedance tuner and measure the noise figure of unmatched devices (Gamma opt. < 0.9) with the N524xB PNA-X with option 029 and the S93029B noise figure measurement software.

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Noise Figure Measurements with Vector Correction

S93029A - Keysight Technologies

The S93029A noise figure application enables high-accuracy noise figure and noise-power measurements of amplifiers, frequency converters, and mixers, utilizing Keysight's unique vector-source-correction technique that uses a source-impedance tuner to remove the effects of imperfect system-source match. This approach yields accuracy that surpasses that provided by the Y-factor method and other cold-source implementations, especially for in-fixture, on-wafer, and automated-test environments. A scalar-calibrated method is also available that offers less accuracy, but is faster and does not require an impedance tuner.

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Physical Layer Test System

N19301B - Keysight Technologies

The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.

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Scalar Mixer/Converter Measurements

S96082A - Keysight Technologies

The S96082A offers the solutions for measuring mixers/frequency converters and amplifier's harmonics using the ENA. The frequency offset mode (FOM) provides the capability to tune the ENA's receivers to different frequencies from the source. This enables measuring amplifier's harmonic responses and mixer/converter's conversion loss.

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Time Domain Analysis

S93010A - Keysight Technologies

The time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain.

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Multiport Calibration Assistant

S95552B - Keysight Technologies

The S95552B software application flexibly creates and manages calibration sets for multiport measurements. This software enables you to combine multiple calibration sets with independent test ports as one calibration set with a greater number of test ports. The software also offers a way to re-calibrate using a certain set of test ports to refresh the calibration set.

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Vector Network Analyzer (VNA) Simulator – Advanced

S94051B - Keysight Technologies

S94051B puts Keysight’s industry-leading network analyzer software portfolio into your computer. Dive deeper into data captured on an instrument with support for time domain, spectrum analysis, gain compression, and all the other software applications you use on your instrument. You can also develop and troubleshoot test programs on your computer before deploying them to the instrument. S94051B is a superset of S94050B and contains the S-parameter functionality.

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Nonlinear Component Characterization 10 MHz - 50 GHz (Export Control)

S94511B - Keysight Technologies

The S94511B Nonlinear Component Characterization provides strong insight into the nonlinear behavior of your device under test (DUT).

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Wideband Active Load Pull Export Control

S94573B - Keysight Technologies

The software enables power amplifier distortion measurements under varying load conditions that are controlled across the entire modulation bandwidth. When design verification and robustness evaluation require testing the device away from the optimum loading condition, this application provides powerful insight into device performance and degradation.

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Wideband Active Load Pull

S94572B - Keysight Technologies

The software enables power amplifier distortion measurements under varying load conditions that are controlled across the entire modulation bandwidth. When design verification and robustness evaluation require testing the device away from the optimum loading condition, this application provides powerful insight into device performance and degradation.

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Nonlinear Component Characterization 10 MHz - 110 GHz

S94510B - Keysight Technologies

Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT

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Arbitrary Load-Control X-Parameters

S94521B - Keysight Technologies

S94521B Arbitrary Load Control X-parameters provides a simplified interface to setup/validate and collect X-parameters over a user defined set of load impedances. This application is ideal for high power transistor/amplifier design and validation.

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Millimeter-wave Operation With Frequency Extenders For M980xA PXI VNA

S95560B - Keysight Technologies

banded vector network analyzer (VNA) using the M980xA PXI VNAs and N5252AW or N5262BW Frequency Extenders.

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Vector And Scalar Mixer/Converter Measurements

S93083B - Keysight Technologies

The S93083B provides both fully calibrated vector and scalar measurements of mixers and frequency converters, with intuitive, easy-to-use user interface

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Phase Noise Measurement Up To 70 GHz

S930317B - Keysight Technologies

S930317B enables phase noise measurements using a PNA or PNA-X vector network analyzer. Simplify your measurement workflow by measuring phase noise on the same connection as your network analysis measurement of 2-port active devices up to 70 GHz, without needing to connect a spectrum analyzer or harmonic mixer.

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Enhanced Time Domain Analysis With TDR

S96011B - Keysight Technologies

Use S96011B to perform enhanced time domain analysis for high-speed data applications. Includes all functionality of the S96010B (TDR/TDT mode). In addition, the S96011B enables more detailed measurements and evaluations, such as eye diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S96011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, use mechanical calibration kits or ECal with DC option (i.e. N469xD or N4433D with Option 0DC).

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Real-time S-Parameter And Power Measurement Uncertainty

S93015B - Keysight Technologies

The S93015B provides real-time measurement uncertainty for S-parameters and power measurements with the measurement traces on the same screen. It enables the users to estimate more reliable uncertainty and apply more realistic limit lines for pass/fail tests for better production yield rates.

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