X-ray fluorescence measuring instrument

FISCHERSCOPE X-RAY/XULM - Helmut Fischer AG (Fischer Technology, Inc.)

Flexible instrument for measuring coating thickness with multiple usesBoth thin and thick coatings (e.g. 50 nm Au or 100 m Sn) can be measured equally well through selectable high voltage filter combinationsThe micro-focus tube enables small measurement spot sizes at short measurement distances of just 100 mHigh count rates of a few kcps through proportional counter tubeMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot)