Tin Whisker Testing

Tin Whisker Testing

Tin whiskers pose a serious problem for electronics of all types. When used as a finish material for electronic components, pure tin can spontaneously grow conductive whiskers. These structures can form electrical paths, affecting the operation of the subject device. The scientific community has yet to agree on the reason for tin whisker growth. Some theories suggest that tin whiskers might occur due to a mechanism of stress relief, especially “compressive” stress, within the tin plating.

Get Help