Cohu, Inc.
We are a global leader in test handling, thermal subsystems, package inspection, contactors and MEMS test solutions used by the semiconductor industry.
- 858.848.8000
- 858.848.8180
- info@cohu.com
- 12367 Crosthwaite Circle
Poway, CA 92064
United States of America
Categories
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product
High Performance Strip Handler
Rasco Jaguar
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier. It is fully automotive qualified for tri-temperature test and the ideal solution for high parallel testing of small packages at short test times, but also for Power and Sensor devices. Due to the integrated vision alignment and high precision linear motors, Jaguar provides high yield and excellent OEE.
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Interface Solutions
Cohu is the market leader in semiconductor test sockets and has 50+ years of semiconductor test expertise providing optimal test contactor and probe pin solutions for every type of application and challenge, using innovative and sophisticated R&D methods.We offer a full suite of test contactors that provide the electrical interface between the tester and the semiconductor device presented by the test handler; optimizes signal performance via an array of consumable probe pins.
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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MEMS Optical Sensor Test
For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.
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MEMS Inertial Test
Cohu´s inertial solutions enable high precise Gyroscope and Accelerometer test with best-in-class cost of test due to high parallelism and package flexibility. All Cohu stimulus modules guarantee high precision and velocity stability as well as high temperature accuracy. With use of our high efficient handler portfolio we can offer the ideal solution with optimized cost of test.
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Scalable Multi-Channel Active Thermal Control (ATC)
T-Core Thermal Control System
Cohu’s proprietary T-Core thermal system’s controller provides precise, multi-site temperature management of power dissipation ICs, such as graphic chips and CPUs, optimizing test yield.The T-Core thermal control system optimizes test yield at cold, ambient, and hot temperatures and offers better than +/- 1°C accuracy with response speeds of >125°C/sec. The system’s flexibility to control air, liquid, and refrigerant based thermal heads gives semiconductor manufacturers excellent temperature control capability for high volume manufacturing.
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Inspection & Metrology Platform
Neon
Neon is Cohu’s next generation inspection platform optimized for small, fragile semiconductors used in automotive, consumer, industrial and medical, and mobility applications.
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Turret Kelvin Test Contactor
cHybrid
cHybrid™ Kelvin contactor contains a new and unique contact spring architecture which allows the test socket to adapt to challenging IC pad geometry requirements of todays and future small package types. Great lifetime up to 3 million touchdowns, with best-in-class contact resistance repeatability reduces cost of test significantly. A multi-beam contact structure optimizes signal integrity and current capability according to challenging electrical test requirements.cHybrid Kelvin contactor with multi-beam contact spring architecture delivers improved yield and long life minimizing cleaning cycles. This innovative solution will help customers reduce cost and maximize productivity.
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High-Speed Laser Mark Handler
MCT MH-3300
MH-3300™ high-speed laser mark handler is used for marking of 2DID codes on the lead frame in support of strip testing, marking of reject devices, and for final package marking in strip test or assembly operations. The MH-3300 offers unparalleled throughput performance and the best cost-of-ownership in the industry.
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Highest Throughput For Fragile Devices
Ismeca NY20
20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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Modular Gravity Handler For Small Devices
Rasco SO2000
Modular designed gravity handler with various input and output possibilities. SO2000 can handle the smallest possible packages for gravity and provides a broad range of Sensor and MEMS applications.
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MEMS Magnetic Sensor Test
Cohu offers a big variety of magnetic test solutions applying magnetic field in all three dimensions. Depending on the requirements we can integrate coils with and without magnetic core, single- or Helmholtz coils, as well as permanent magnets, static and rotating.
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Air-Cooled Universal Test Platform
Diamondx
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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Semiconductor Testers
Designing and manufacturing scalable Automated Test Equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices
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Test Contactor
MiCon
The MiCon™ Test Contactor is spring pin footprint compatible supporting advanced temperature requirements as well as advanced power/current requirements. The footprint compatibility allows for easy and cost-efficient conversion from spring pin setups. The fully decoupled load board side of the spring ensure no degradation of the load board pad.MiCon features a single piece design, which ensures a long lifespan, low and stable contact resistance, high current carrying capability and an extended temperature range. The MiCon allows for testing at full specification values. The extended operating range accommodates device lead trim and form variability such as device alignment accuracy and device lead coplanarity.
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ECT
Has been a leader in the development of advanced probes and fixtures since 1965.
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Equiptest Engineering Pte Ltd
Equiptest Engineering (EQT) is focused in providing innovative test interface solutions to cater today rapidly changing technological environment.
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KITA Manufacturing Co.,Ltd.
KITA Manufacturing Co.,Ltd. is manufacturing company and specializing in spring probes(Pogo pin) for testing semiconductor and PCB based in Osaka, Japan.
