Cohu, Inc.

Product

Air-Cooled Universal Test Platform

Diamondx

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Cohu, Inc.

Diamondx - Cohu, Inc.

Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

Product

Configurable OSAT Friendly Pick-and-Place Handler

Delta Eclipse

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Cohu, Inc.

Delta Eclipse - Cohu, Inc.

Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors.  The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.

Product

Probe Cards

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Cohu, Inc.

Cohu, Inc.

High-performance field repairable direct-attach probe cards.

Product

MEMS Pressure Test

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Cohu, Inc.

Cohu, Inc.

Cohu‘s well established pressure test equipment are providing high volume final test solutions for all pressure sensor markets.

Product

Tube-To-Tube Gravity Handler

Rasco SO1000

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Cohu, Inc.

Rasco SO1000 - Cohu, Inc.

The SO1000 test handler’s mature design and high reliability it provides excellent cost of test. Highly flexible as a result of a broad range of device kits can be combined with various Sensor and MEMS applications.Featuring a fast plunger with up to four plunger heads for high speed and high throughput with index time down to 500 ms. Available in single, dual, and quad configurations.

Product

Test Contactor/Probe Head

Mercury

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Cohu, Inc.

Mercury - Cohu, Inc.

Mercury™ test probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields.Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.

Product

Turret Test And Scan Handlers

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Cohu, Inc.

Cohu, Inc.

Turret platforms for semiconductor test, inspection and packaging.

Product

Turret Kelvin Test Contactor

cHybrid

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Cohu, Inc.

cHybrid - Cohu, Inc.

cHybrid™ Kelvin contactor contains a new and unique contact spring architecture which allows the test socket to adapt to challenging IC pad geometry requirements of todays and future small package types. Great lifetime up to 3 million touchdowns, with best-in-class contact resistance repeatability reduces cost of test significantly. A multi-beam contact structure optimizes signal integrity and current capability according to challenging electrical test requirements.cHybrid Kelvin contactor with multi-beam contact spring architecture delivers improved yield and long life minimizing cleaning cycles. This innovative solution will help customers reduce cost and maximize productivity.

Product

Kelvin Test Contactor

ecoAmp

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Cohu, Inc.

ecoAmp - Cohu, Inc.

ecoAmp™ Kelvin test contactor has a durable monolithic pin design with low and stable contact resistance. It is a high-power cantilever kelvin contactor with a patented spring and tip design for optimum heat dissipation. This ensures best reliability, long spring life and high yield even under highest current and temperature requirements. Featuring extended Automotive temperature range -60 ̊C to +175 ̊C, capable to stand thermal stress during high-power test. The contact motion is decoupled from the test board.

Product

High-Performance Strip Handler

MCT SH-5300

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Cohu, Inc.

MCT SH-5300 - Cohu, Inc.

SH-5300™ high-performance strip handler for testing advanced semiconductor packages, LEDs, MEMS sensors, and traditional ICs. It can handle a vast array of strip and laminate lead-frame sizes. Capable of tri-temp testing -55˚C to +160˚C and ambient testing to +160˚C.

Product

Test Contactor

RF Scrub

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Cohu, Inc.

RF Scrub - Cohu, Inc.

RF Scrub™ Test Contactor’s innovative design combines an extremely short signal path (0.90mm test height) with high wear resistance pins that can operate in a wide temperature range.The RF Scrub Test Contactor’s long-life, elastomer free design and easy field maintainability makes it an optimal solution for testing of high-performance devices.The RF Scrub design minimizes load board wear and with the unique pin base material and plating, the cleaning intervals can last up to 100,000 cycles.

Product

Test Contactor/Probe Head

Hydra

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Cohu, Inc.

Hydra - Cohu, Inc.

Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.

Product

High Speed Gravity Handler

MT9928 xm

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Cohu, Inc.

MT9928 xm - Cohu, Inc.

This well-established test handler provides field-proven reliability and performance. Its modular and scalable design and variety of options allow configuration of the MT9928 exactly according to the test needs. Easy-access design and easy-to-change conversion kit parts support fast and easy package style changes. The MT9928 has a large soak capacity and features the entire tri-temp range at outstanding temperature accuracy and stability.

Product

Coaxial Test Contactor

ICON

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Cohu, Inc.

ICON - Cohu, Inc.

The ICON™ test contactor designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).The metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise). Featuring exceptional DC and RF performance and excellent thermal management.

Product

InCarrier Loader/Unloader

NY32-LU

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Cohu, Inc.

NY32-LU - Cohu, Inc.

NY32-LU™ loader unloader provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.